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ORCIDBibTeX records: Erik Bury
@inproceedings{DBLP:conf/irps/BuryVFCTVRMDHLK23,
author = {Erik Bury and
Michiel Vandemaele and
Jacopo Franco and
Adrian Chasin and
Stanislav Tyaginov and
A. Vandooren and
Romain Ritzenthaler and
Hans Mertens and
Javier Diaz{-}Fortuny and
N. Horiguchi and
Dimitri Linten and
Ben Kaczer},
title = {Reliability challenges in Forksheet Devices: (Invited Paper)},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--8},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10118269},
doi = {10.1109/IRPS48203.2023.10118269},
timestamp = {Wed, 24 May 2023 09:43:44 +0200},
biburl = {https://dblp.org/rec/conf/irps/BuryVFCTVRMDHLK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/DiazFortunySSBDK23,
author = {Javier Diaz{-}Fortuny and
Dishant Sangani and
Pablo Saraza{-}Canflanca and
Erik Bury and
Robin Degraeve and
Ben Kaczer},
title = {Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress
Operation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--9},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10118108},
doi = {10.1109/IRPS48203.2023.10118108},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/DiazFortunySSBDK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SanganiDBKG23,
author = {Dishant Sangani and
Javier Diaz{-}Fortuny and
Erik Bury and
Ben Kaczer and
Georges G. E. Gielen},
title = {The Role of Mobility Degradation in the BTI-Induced {RO} Aging in
a 28-nm Bulk {CMOS} Technology: (Student paper)},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10118026},
doi = {10.1109/IRPS48203.2023.10118026},
timestamp = {Mon, 25 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SanganiDBKG23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SarazaCanflancaDVBDK23,
author = {Pablo Saraza{-}Canflanca and
Javier Diaz{-}Fortuny and
Andrea Vici and
Erik Bury and
Robin Degraeve and
Ben Kaczer},
title = {Using dedicated device arrays for the characterization of {TDDB} in
a scaled {HK/MG} technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10117773},
doi = {10.1109/IRPS48203.2023.10117773},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SarazaCanflancaDVBDK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKBFCMMHG23,
author = {Michiel Vandemaele and
Ben Kaczer and
Erik Bury and
Jacopo Franco and
Adrian Chasin and
Alexander Makarov and
Hans Mertens and
Geert Hellings and
Guido Groeseneken},
title = {Investigating Nanowire, Nanosheet and Forksheet {FET} Hot-Carrier
Reliability via {TCAD} Simulations: Invited Paper},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--10},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10118211},
doi = {10.1109/IRPS48203.2023.10118211},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKBFCMMHG23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/AlianRYPHPZEVYBKCP22,
author = {AliReza Alian and
Ra{\'{u}}l Rodr{\'{\i}}guez and
Sachin Yadav and
Uthayasankaran Peralagu and
Arturo Sibaja Hernandez and
Vamsi Putcha and
Ming Zhao and
Rana ElKashlan and
Bjorn Vermeersch and
Hao Yu and
Erik Bury and
Ahmad Khaled and
Nadine Collaert and
Bertrand Parvais},
title = {Impact of channel thickness scaling on the performance of GaN-on-Si
{RF} HEMTs on highly C-doped GaN buffer},
booktitle = {52nd {IEEE} European Solid-State Device Research Conference, {ESSDERC}
2022, Milan, Italy, September 19-22, 2022},
pages = {384--387},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ESSDERC55479.2022.9947147},
doi = {10.1109/ESSDERC55479.2022.9947147},
timestamp = {Sat, 19 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/AlianRYPHPZEVYBKCP22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Diaz-FortunySBV22,
author = {Javier Diaz{-}Fortuny and
Pablo Saraza{-}Canflanca and
Erik Bury and
Michiel Vandemaele and
Ben Kaczer and
Robin Degraeve},
title = {A Ring-Oscillator-Based Degradation Monitor Concept with Tamper Detection
Capability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764609},
doi = {10.1109/IRPS48227.2022.9764609},
timestamp = {Mon, 09 May 2022 18:11:24 +0200},
biburl = {https://dblp.org/rec/conf/irps/Diaz-FortunySBV22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BuryCKVTFRMWHL22,
author = {Erik Bury and
Adrian Vaisman Chasin and
Ben Kaczer and
Michiel Vandemaele and
Stanislav Tyaginov and
Jacopo Franco and
Romain Ritzenthaler and
Hans Mertens and
Pieter Weckx and
N. Horiguchi and
Dimitri Linten},
title = {Evaluating Forksheet {FET} Reliability Concerns by Experimental Comparison
with Co-integrated Nanosheets},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764526},
doi = {10.1109/IRPS48227.2022.9764526},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BuryCKVTFRMWHL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TyaginovMECBJVG22,
author = {Stanislav Tyaginov and
Alexander Makarov and
Al{-}Moatasem Bellah El{-}Sayed and
Adrian Vaisman Chasin and
Erik Bury and
Markus Jech and
Michiel Vandemaele and
Alexander Grill and
An De Keersgieter and
Mikhail I. Vexler and
Geert Eneman and
Ben Kaczer},
title = {Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier
Degradation in n- and p-Channel Transistors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764515},
doi = {10.1109/IRPS48227.2022.9764515},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/TyaginovMECBJVG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKTBCF22,
author = {Michiel Vandemaele and
Ben Kaczer and
Stanislav Tyaginov and
Erik Bury and
Adrian Vaisman Chasin and
Jacopo Franco and
Alexander Makarov and
Hans Mertens and
Geert Hellings and
Guido Groeseneken},
title = {Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet
and Forksheet FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764470},
doi = {10.1109/IRPS48227.2022.9764470},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTBCF22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GrillJMBBTPCGWK22,
author = {Alexander Grill and
V. John and
Jakob Michl and
A. Beckers and
Erik Bury and
Stanislav Tyaginov and
Bertrand Parvais and
Adrian Vaisman Chasin and
Tibor Grasser and
Michael Waltl and
Ben Kaczer and
Bogdan Govoreanu},
title = {Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array
with 30k Transistors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {10},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764594},
doi = {10.1109/IRPS48227.2022.9764594},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GrillJMBBTPCGWK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsit/VermeerschBXSBH22,
author = {Bjorn Vermeersch and
Erik Bury and
Yang Xiang and
Pieter Schuddinck and
Krishna K. Bhuwalka and
Geert Hellings and
Julien Ryckaert},
title = {Self-Heating in iN8-iN2 {CMOS} Logic Cells: Thermal Impact of Architecture
(FinFET, Nanosheet, Forksheet and {CFET)} and Scaling Boosters},
booktitle = {{IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
pages = {371--372},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830228},
doi = {10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830228},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsit/VermeerschBXSBH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKTFDC21,
author = {Michiel Vandemaele and
Ben Kaczer and
Stanislav Tyaginov and
Jacopo Franco and
Robin Degraeve and
Adrian Vaisman Chasin and
Zhicheng Wu and
Erik Bury and
Yang Xiang and
Hans Mertens and
Guido Groeseneken},
title = {The properties, effect and extraction of localized defect profiles
from degraded {FET} characteristics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405164},
doi = {10.1109/IRPS46558.2021.9405164},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTFDC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WuFTRTVBGLK21,
author = {Zhicheng Wu and
Jacopo Franco and
Brecht Truijen and
Philippe Roussel and
Stanislav Tyaginov and
Michiel Vandemaele and
Erik Bury and
Guido Groeseneken and
Dimitri Linten and
Ben Kaczer},
title = {Physics-based device aging modelling framework for accurate circuit
reliability assessment},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405106},
doi = {10.1109/IRPS46558.2021.9405106},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WuFTRTVBGLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XiangTVWFBTPLK21,
author = {Yang Xiang and
Stanislav Tyaginov and
Michiel Vandemaele and
Zhicheng Wu and
Jacopo Franco and
Erik Bury and
Brecht Truijen and
Bertrand Parvais and
Dimitri Linten and
Ben Kaczer},
title = {A BSIM-Based Predictive Hot-Carrier Aging Compact Model},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--9},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405222},
doi = {10.1109/IRPS46558.2021.9405222},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/XiangTVWFBTPLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChasinFBRLSHLK20,
author = {Adrian Vaisman Chasin and
Jacopo Franco and
Erik Bury and
Romain Ritzenthaler and
Eugenio Dentoni Litta and
Alessio Spessot and
Naoto Horiguchi and
Dimitri Linten and
Ben Kaczer},
title = {Relevance of fin dimensions and high-pressure anneals on hot-carrier
degradation},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9129584},
doi = {10.1109/IRPS45951.2020.9129584},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChasinFBRLSHLK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GrillBMTLGPKWR20,
author = {Alexander Grill and
Erik Bury and
Jakob Michl and
Stanislav Tyaginov and
Dimitri Linten and
Tibor Grasser and
Bertrand Parvais and
Ben Kaczer and
Michael Waltl and
Iuliana P. Radu},
title = {Reliability and Variability of Advanced {CMOS} Devices at Cryogenic
Temperatures},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9128316},
doi = {10.1109/IRPS45951.2020.9128316},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/GrillBMTLGPKWR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PutchaBFWZPZAKW20,
author = {Vamsi Putcha and
Erik Bury and
Jacopo Franco and
Amey Walke and
Simeng Zhao and
Uthayasankaran Peralagu and
Ming Zhao and
AliReza Alian and
Ben Kaczer and
Niamh Waldron and
Dimitri Linten and
Bertrand Parvais and
Nadine Collaert},
title = {Exploring the {DC} reliability metrics for scaled GaN-on-Si devices
targeted for {RF/5G} applications},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--8},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9129251},
doi = {10.1109/IRPS45951.2020.9129251},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PutchaBFWZPZAKW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleCBTGK20,
author = {Michiel Vandemaele and
Kai{-}Hsin Chuang and
Erik Bury and
Stanislav Tyaginov and
Guido Groeseneken and
Ben Kaczer},
title = {The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--7},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9128218},
doi = {10.1109/IRPS45951.2020.9128218},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleCBTGK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/ChuangBDKLV19,
author = {Kai{-}Hsin Chuang and
Erik Bury and
Robin Degraeve and
Ben Kaczer and
Dimitri Linten and
Ingrid Verbauwhede},
title = {A Physically Unclonable Function Using Soft Oxide Breakdown Featuring
0{\%} Native {BER} and 51.8 fJ/bit in 40-nm {CMOS}},
journal = {{IEEE} J. Solid State Circuits},
volume = {54},
number = {10},
pages = {2765--2776},
year = {2019},
url = {https://doi.org/10.1109/JSSC.2019.2920714},
doi = {10.1109/JSSC.2019.2920714},
timestamp = {Sun, 30 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jssc/ChuangBDKLV19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BuryCVBFKL19,
author = {Erik Bury and
Adrian Vaisman Chasin and
Michiel Vandemaele and
Simon Van Beek and
Jacopo Franco and
Ben Kaczer and
Dimitri Linten},
title = {Array-Based Statistical Characterization of {CMOS} Degradation Modes
and Modeling of the Time-Dependent Variability Induced by Different
Stress Patterns in the \{V\({}_{\mbox{G}}\), V\({}_{\mbox{D}}\)\}
bias space},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720592},
doi = {10.1109/IRPS.2019.8720592},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BuryCVBFKL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKTSMC19,
author = {Michiel Vandemaele and
Ben Kaczer and
Stanislav Tyaginov and
Zlatan Stanojevic and
Alexander Makarov and
Adrian Vaisman Chasin and
Erik Bury and
Hans Mertens and
Dimitri Linten and
Guido Groeseneken},
title = {Full (V\({}_{\mbox{g}}\), V\({}_{\mbox{d}}\)) Bias Space Modeling
of Hot-Carrier Degradation in Nanowire FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720406},
doi = {10.1109/IRPS.2019.8720406},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTSMC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaczerFWRPBSCLP18,
author = {Ben Kaczer and
Jacopo Franco and
Pieter Weckx and
Philippe Roussel and
Vamsi Putcha and
Erik Bury and
Marko Simicic and
Adrian Vaisman Chasin and
Dimitri Linten and
Bertrand Parvais and
Francky Catthoor and
Gerhard Rzepa and
Michael Waltl and
Tibor Grasser},
title = {A brief overview of gate oxide defect properties and their relation
to {MOSFET} instabilities and device and circuit time-dependent variability},
journal = {Microelectron. Reliab.},
volume = {81},
pages = {186--194},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.022},
doi = {10.1016/J.MICROREL.2017.11.022},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KaczerFWRPBSCLP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/asscc/ChuangBDKLV18,
author = {Kai{-}Hsin Chuang and
Erik Bury and
Robin Degraeve and
Ben Kaczer and
Dimitri Linten and
Ingrid Verbauwhede},
title = {A Physically Unclonable Function with 0{\%} {BER} Using Soft Oxide
Breakdown in 40nm {CMOS}},
booktitle = {{IEEE} Asian Solid-State Circuits Conference, {A-SSCC} 2018, Tainan,
Taiwan, November 5-7, 2018},
pages = {157--160},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ASSCC.2018.8579252},
doi = {10.1109/ASSCC.2018.8579252},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/asscc/ChuangBDKLV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/BuryKBL18,
author = {Erik Bury and
Ben Kaczer and
Simon Van Beek and
Dimitri Linten},
title = {Experimental extraction of {BEOL} composite equivalent thermal conductivities
for application in self-heating simulations},
booktitle = {48th European Solid-State Device Research Conference, {ESSDERC} 2018,
Dresden, Germany, September 3-6, 2018},
pages = {186--189},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ESSDERC.2018.8486872},
doi = {10.1109/ESSDERC.2018.8486872},
timestamp = {Fri, 09 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/BuryKBL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BuryCKCFSWL18,
author = {Erik Bury and
Adrian Vaisman Chasin and
Ben Kaczer and
Kai{-}Hsin Chuang and
Jacopo Franco and
Marko Simicic and
Pieter Weckx and
Dimitri Linten},
title = {Self-heating-aware {CMOS} reliability characterization using degradation
maps},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353541},
doi = {10.1109/IRPS.2018.8353541},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BuryCKCFSWL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChuangBDKKGLV18,
author = {Kai{-}Hsin Chuang and
Erik Bury and
Robin Degraeve and
Ben Kaczer and
T. Kallstenius and
Guido Groeseneken and
Dimitri Linten and
Ingrid Verbauwhede},
title = {A multi-bit/cell {PUF} using analog breakdown positions in {CMOS}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353655},
doi = {10.1109/IRPS.2018.8353655},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChuangBDKKGLV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FrancoKCBL18,
author = {Jacopo Franco and
Ben Kaczer and
Adrian Vaisman Chasin and
Erik Bury and
Dimitri Linten},
title = {Hot electron and hot hole induced degradation of SiGe p-FinFETs studied
by degradation maps in the entire bias space},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353601},
doi = {10.1109/IRPS.2018.8353601},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FrancoKCBL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/KaczerFWRBCDLGK15,
author = {Ben Kaczer and
Jacopo Franco and
Pieter Weckx and
Philippe Roussel and
Erik Bury and
Moonju Cho and
Robin Degraeve and
Dimitri Linten and
Guido Groeseneken and
Halil Kukner and
Praveen Raghavan and
Francky Catthoor and
Gerhard Rzepa and
Wolfgang G{\"{o}}s and
Tibor Grasser},
title = {The defect-centric perspective of device and circuit reliability -
From individual defects to circuits},
booktitle = {45th European Solid State Device Research Conference, {ESSDERC} 2015,
Graz, Austria, September 14-18, 2015},
pages = {218--225},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ESSDERC.2015.7324754},
doi = {10.1109/ESSDERC.2015.7324754},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/KaczerFWRBCDLGK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FrancoKRBMRGHTG15,
author = {Jacopo Franco and
Ben Kaczer and
Philippe J. Roussel and
Erik Bury and
Hans Mertens and
Romain Ritzenthaler and
Tibor Grasser and
Naoto Horiguchi and
Aaron Thean and
Guido Groeseneken},
title = {{NBTI} in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability
from planar to 3D architectures},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {2},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112694},
doi = {10.1109/IRPS.2015.7112694},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FrancoKRBMRGHTG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KaczerFCGRTBWPT15,
author = {Ben Kaczer and
Jacopo Franco and
M. Cho and
Tibor Grasser and
Philippe J. Roussel and
Stanislav Tyaginov and
M. Bina and
Yannick Wimmer and
Luis{-}Miguel Procel and
Lionel Trojman and
Felice Crupi and
Gregory Pitner and
Vamsi Putcha and
Pieter Weckx and
Erik Bury and
Z. Ji and
An De Keersgieter and
Thomas Chiarella and
Naoto Horiguchi and
Guido Groeseneken and
Aaron Thean},
title = {Origins and implications of increased channel hot carrier variability
in nFinFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112706},
doi = {10.1109/IRPS.2015.7112706},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KaczerFCGRTBWPT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WeckxKCFBCWRCG15,
author = {Pieter Weckx and
Ben Kaczer and
C. Chen and
Jacopo Franco and
Erik Bury and
K. Chanda and
J. Watt and
Philippe J. Roussel and
Francky Catthoor and
Guido Groeseneken},
title = {Characterization of time-dependent variability using 32k transistor
arrays in an advanced {HK/MG} technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112702},
doi = {10.1109/IRPS.2015.7112702},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WeckxKCFBCWRCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/RitzenthalerSBMRGHTSCSF12,
author = {Romain Ritzenthaler and
Tom Schram and
Erik Bury and
J{\'{e}}r{\^{o}}me Mitard and
L.{-}{\AA}. Ragnarsson and
Guido Groeseneken and
N. Horiguchi and
Aaron Thean and
Alessio Spessot and
Christian Caillat and
V. Srividya and
Pierre Fazan},
title = {Low-power DRAM-compatible Replacement Gate High-k/Metal Gate stacks},
booktitle = {Proceedings of the 2012 European Solid-State Device Research Conference,
{ESSDERC} 2012, Bordeaux, France, September 17-21, 2012},
pages = {242--245},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/ESSDERC.2012.6343378},
doi = {10.1109/ESSDERC.2012.6343378},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/RitzenthalerSBMRGHTSCSF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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