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ORCIDBibTeX records: Xavier Garros
@inproceedings{DBLP:conf/essderc/CremerPGMHAMALDGGDVBSGJHRSDGBPC23,
author = {S. Cr{\'{e}}mer and
N. Pelloux and
F. Gianesello and
Y. Mourier and
G. Haury and
Tulio Chaves de Albuquerque and
Frederic Monsieur and
H. Audouin and
C. A. Legrand and
C. Diouf and
J. Azevedo Goncalves and
C. Belem Goncalves and
C. Durand and
N. Vulliet and
L. Berthier and
Emeline Souchier and
P. Garcia and
S. Jan and
M. Hello and
M. L. Rellier and
Patrick Scheer and
B. Duriez and
Xavier Garros and
T. Bordignon and
F. Paillardet and
Pascal Chevalier},
title = {40-nm {RFSOI} technology exhibiting 90fs {RON} {\texttimes} {COFF}
and fT/fMAX of 250 GHz/350 GHz targeting sub-6 GHz and mmW 5G applications},
booktitle = {53rd {IEEE} European Solid-State Device Research Conference, {ESSDERC}
2023, Lisbon, Portugal, September 11-14, 2023},
pages = {101--104},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ESSDERC59256.2023.10268566},
doi = {10.1109/ESSDERC59256.2023.10268566},
timestamp = {Mon, 09 Oct 2023 15:43:28 +0200},
biburl = {https://dblp.org/rec/conf/essderc/CremerPGMHAMALDGGDVBSGJHRSDGBPC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/DoyenYGBFDDFMMPR23,
author = {C. Doyen and
V. Yon and
Xavier Garros and
Luigi Basset and
Tadeu Mota Frutuoso and
C. Dagon and
Cheikh Diouf and
X. Federspiel and
V. Millon and
Frederic Monsieur and
C. Pribat and
David Roy},
title = {Insight Into {HCI} Reliability on {I/O} Nitrided Devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10117681},
doi = {10.1109/IRPS48203.2023.10117681},
timestamp = {Wed, 24 May 2023 09:43:44 +0200},
biburl = {https://dblp.org/rec/conf/irps/DoyenYGBFDDFMMPR23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FrutuosoGLKZVDF22,
author = {Tadeu Mota Frutuoso and
Xavier Garros and
Jose Lugo{-}Alvarez and
Rom{\'{e}}o Kom Kammeugne and
L. D. M. Zouknak and
Abyga{\"{e}}l Viey and
W. van den Daele and
Philippe Ferrari and
Fred Gaillard},
title = {Ultra-fast {CV} methods ({\textless} 10{\(\mathrm{\mu}\)}s) for interface
trap spectroscopy and {BTI} reliability characterization using {MOS}
capacitors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {3},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764550},
doi = {10.1109/IRPS48227.2022.9764550},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FrutuosoGLKZVDF22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HaiCDLAFKG22,
author = {Joycelyn Hai and
Florian Cacho and
A. Divay and
Estelle Lauga{-}Larroze and
Jean{-}Daniel Arnould and
Jeremie Forest and
Vincent Knopik and
Xavier Garros},
title = {Comprehensive Analysis of {RF} Hot-Carrier Reliability Sensitivity
and Design Explorations for 28GHz Power Amplifier Applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {4},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764535},
doi = {10.1109/IRPS48227.2022.9764535},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HaiCDLAFKG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ContaminCGGVGJV22,
author = {Lauriane Contamin and
Mika{\"{e}}l Cass{\'{e}} and
Xavier Garros and
Fred Gaillard and
Maud Vinet and
Philippe Galy and
Andr{\'{e}} Juge and
Emmanuel Vincent and
Silvano De Franceschi and
Tristan Meunier},
title = {Fast Measurement of {BTI} on 28nm Fully Depleted Silicon-On-Insulator
MOSFETs at Cryogenic Temperature down to 4K},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764571},
doi = {10.1109/IRPS48227.2022.9764571},
timestamp = {Tue, 10 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ContaminCGGVGJV22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ArabiFCRBGG22,
author = {M. Arabi and
X. Federspiel and
Florian Cacho and
M. Rafik and
S. Blonkowski and
Xavier Garros and
G. Guibaudo},
title = {Frequency dependant gate oxide {TDDB} model},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {25--1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764503},
doi = {10.1109/IRPS48227.2022.9764503},
timestamp = {Mon, 09 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ArabiFCRBGG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsit/FrutuosoGBBLSLF22,
author = {Tadeu Mota Frutuoso and
Xavier Garros and
Perrine Batude and
Laurent Brunet and
Joris Lacord and
Benoit Skl{\'{e}}nard and
V. Lapras and
Claire Fenouillet{-}B{\'{e}}ranger and
M. Ribotta and
A. Magalhaes{-}Lucas and
J. Kanyandekwe and
R. Kies and
G. Romano and
Edoardo Catapano and
Mika{\"{e}}l Cass{\'{e}} and
Jose Lugo{-}Alvarez and
Philippe Ferrari and
Fred Gaillard},
title = {Methodology for Active Junction Profile Extraction in thin film {FD-SOI}
Enabling performance driver identification in 500{\textdegree}C devices
for 3D sequential integration},
booktitle = {{IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
pages = {332--333},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830504},
doi = {10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830504},
timestamp = {Tue, 29 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsit/FrutuosoGBBLSLF22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/KammeugneLFCVRG21,
author = {Rom{\'{e}}o Kom Kammeugne and
Charles Leroux and
Tadeu Mota Frutuoso and
Jacques Cluzel and
Laura Vauche and
Cyrille Le Royer and
Romain Gwoziecki and
Xavier Garros and
Fred Gaillard and
Matthew Charles and
Edwige Bano and
G{\'{e}}rard Ghibaudo},
title = {Parasitic Capacitance Analysis in Short Channel GaN MIS-HEMTs},
booktitle = {51st {IEEE} European Solid-State Device Research Conference, {ESSDERC}
2021, Grenoble, France, September 13-22, 2021},
pages = {299--302},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ESSDERC53440.2021.9631820},
doi = {10.1109/ESSDERC53440.2021.9631820},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/KammeugneLFCVRG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FrutuosoLGBLGCC21,
author = {Tadeu Mota Frutuoso and
Jose Lugo{-}Alvarez and
Xavier Garros and
Laurent Brunet and
Joris Lacord and
Louis Gerrer and
Mika{\"{e}}l Cass{\'{e}} and
Edoardo Catapano and
Claire Fenouillet{-}B{\'{e}}ranger and
Fran{\c{c}}ois Andrieu and
Fred Gaillard and
Philippe Ferrari},
title = {Impact of spacer interface charges on performance and reliability
of low temperature transistors for 3D sequential integration},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405107},
doi = {10.1109/IRPS46558.2021.9405107},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FrutuosoLGBLGCC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GerrerCGGFCRV21,
author = {Louis Gerrer and
Jacques Cluzel and
Fred Gaillard and
Xavier Garros and
Xavier Federspiel and
Florian Cacho and
David Roy and
E. Vincent},
title = {{BTI} Arbitrary Stress Patterns Characterization {\&} Machine-Learning
optimized {CET} Maps Simulations},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405145},
doi = {10.1109/IRPS46558.2021.9405145},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GerrerCGGFCRV21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/NguyenGRCRFG19,
author = {A. P. Nguyen and
Xavier Garros and
M. Rafik and
Florian Cacho and
David Roy and
Xavier Federspiel and
Fred Gaillard},
title = {Impact of Passive {\&} Active Load Gate Impedance on Breakdown
Hardness in 28nm {FDSOI} Technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--5},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720591},
doi = {10.1109/IRPS.2019.8720591},
timestamp = {Thu, 04 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/NguyenGRCRFG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GarrosLSFVR18,
author = {Xavier Garros and
Antoine Laurent and
Alexandre Subirats and
X. Federspiel and
E. Vincent and
Gilles Reimbold},
title = {Characterization and modeling of dynamic variability induced by {BTI}
in nano-scaled transistors},
journal = {Microelectron. Reliab.},
volume = {80},
pages = {100--108},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.11.025},
doi = {10.1016/J.MICROREL.2017.11.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GarrosLSFVR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RafikNGAFD18,
author = {M. Rafik and
A. P. Nguyen and
Xavier Garros and
M. Arabi and
X. Federspiel and
Cheikh Diouf},
title = {{AC} {TDDB} extensive study for an enlargement of its impact and benefit
on circuit lifetime assessment},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353576},
doi = {10.1109/IRPS.2018.8353576},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/RafikNGAFD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandendaeleGLMT18,
author = {William Vandendaele and
Xavier Garros and
Thomas Lorin and
Erwan Morvan and
A. Torres and
Ren{\'{e}} Escoffier and
Marie{-}Anne Jaud and
Marc Plissonnier and
Fred Gaillard},
title = {A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353580},
doi = {10.1109/IRPS.2018.8353580},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandendaeleGLMT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GarrosSRGDFHR18,
author = {Xavier Garros and
Alexandre Subirats and
Gilles Reimbold and
Fred Gaillard and
Cheikh Diouf and
X. Federspiel and
Vincent Huard and
M. Rafik},
title = {A new method for quickly evaluating reversible and permanent components
of the {BTI} degradation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353688},
doi = {10.1109/IRPS.2018.8353688},
timestamp = {Thu, 04 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GarrosSRGDFHR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LaurentGBPCGFRV18,
author = {Antoine Laurent and
Xavier Garros and
Sylvain Barraud and
J. Pelloux{-}Prayer and
Mika{\"{e}}l Cass{\'{e}} and
Fred Gaillard and
X. Federspiel and
David Roy and
E. Vincent and
G{\'{e}}rard Ghibaudo},
title = {Performance {\&} reliability of 3D architectures ({\(\pi\)}fet,
Finfet, {\(\Omega\)}fet)},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353647},
doi = {10.1109/IRPS.2018.8353647},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LaurentGBPCGFRV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/MicoutRGCCPLRFB17,
author = {Jessy Micout and
Quentin Rafhay and
Xavier Garros and
Mika{\"{e}}l Cass{\'{e}} and
Jean Coignus and
Luca Pasini and
Cao{-}Minh Vincent Lu and
Nils Rambal and
Claire Fenouillet{-}B{\'{e}}ranger and
Laurent Brunet and
G. Romano and
R. Gassilloud and
Perrine Batude and
Maud Vinet and
G{\'{e}}rard Ghibaudo},
title = {Precise {EOT} regrowth extraction enabling performance analysis of
low temperature extension first devices},
booktitle = {47th European Solid-State Device Research Conference, {ESSDERC} 2017,
Leuven, Belgium, September 11-14, 2017},
pages = {144--147},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ESSDERC.2017.8066612},
doi = {10.1109/ESSDERC.2017.8066612},
timestamp = {Thu, 12 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/essderc/MicoutRGCCPLRFB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/TheodorouFGDG16,
author = {Christoforos G. Theodorou and
Mouenes Fadlallah and
Xavier Garros and
Charalambos A. Dimitriadis and
G{\'{e}}rard Ghibaudo},
title = {Noise-induced dynamic variability in nano-scale {CMOS} {SRAM} cells},
booktitle = {46th European Solid-State Device Research Conference, {ESSDERC} 2016,
Lausanne, Switzerland, September 12-15, 2016},
pages = {256--259},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ESSDERC.2016.7599634},
doi = {10.1109/ESSDERC.2016.7599634},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/essderc/TheodorouFGDG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BesnardGSAFRSRF15,
author = {Guillaume Besnard and
Xavier Garros and
Alexandre Subirats and
Fran{\c{c}}ois Andrieu and
X. Federspiel and
M. Rafik and
Walter Schwarzenbach and
Gilles Reimbold and
Olivier Faynot and
Sorin Cristoloveanu},
title = {Performance and reliability of strained {SOI} transistors for advanced
planar {FDSOI} technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {2},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112691},
doi = {10.1109/IRPS.2015.7112691},
timestamp = {Wed, 16 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/BesnardGSAFRSRF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/Fenouillet-BerangerPBNCGTRLDPBDGMV14,
author = {Claire Fenouillet{-}B{\'{e}}ranger and
Bernard Previtali and
Perrine Batude and
F. Nemouchi and
Mika{\"{e}}l Cass{\'{e}} and
Xavier Garros and
L. Tosti and
Nils Rambal and
Dominique Lafond and
H. Dansas and
L. Pasini and
Laurent Brunet and
Fabien Deprat and
M. Gregoire and
M. Mellier and
Maud Vinet},
title = {{FDSOI} bottom MOSFETs stability versus top transistor thermal budget
featuring 3D monolithic integration},
booktitle = {44th European Solid State Device Research Conference, {ESSDERC} 2014,
Venice Lido, Italy, September 22-26, 2014},
pages = {110--113},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ESSDERC.2014.6948770},
doi = {10.1109/ESSDERC.2014.6948770},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/essderc/Fenouillet-BerangerPBNCGTRLDPBDGMV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/BesnardGANDRSDBRC14,
author = {Guillaume Besnard and
Xavier Garros and
Fran{\c{c}}ois Andrieu and
P. Nguyen and
W. van den Daele and
P. Reynaud and
Walter Schwarzenbach and
D. Delprat and
Konstantin Bourdelle and
Gilles Reimbold and
Sorin Cristoloveanu},
title = {Superior performance and Hot Carrier reliability of Strained {FDSOI}
nMOSFETs for advanced {CMOS} technology nodes},
booktitle = {44th European Solid State Device Research Conference, {ESSDERC} 2014,
Venice Lido, Italy, September 22-26, 2014},
pages = {226--229},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ESSDERC.2014.6948801},
doi = {10.1109/ESSDERC.2014.6948801},
timestamp = {Wed, 16 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/essderc/BesnardGANDRSDBRC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/NavarroBACGC14,
author = {Carlos Navarro and
Maryline Bawedin and
Fran{\c{c}}ois Andrieu and
Jacques Cluzel and
Xavier Garros and
Sorin Cristoloveanu},
title = {{CMOS} {VT} characterization by capacitance measurements in {FDSOI}
{PIN} gated diodes},
booktitle = {44th European Solid State Device Research Conference, {ESSDERC} 2014,
Venice Lido, Italy, September 22-26, 2014},
pages = {405--408},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ESSDERC.2014.6948846},
doi = {10.1109/ESSDERC.2014.6948846},
timestamp = {Fri, 02 Jun 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/NavarroBACGC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GarrosCRFRMWB09,
author = {Xavier Garros and
Mika{\"{e}}l Cass{\'{e}} and
M. Rafik and
Claire Fenouillet{-}B{\'{e}}ranger and
Gilles Reimbold and
Fran{\c{c}}ois Martin and
Claudia Wiemer and
F. Boulanger},
title = {Process dependence of {BTI} reliability in advanced {HK} {MG} stacks},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {982--988},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.047},
doi = {10.1016/J.MICROREL.2009.06.047},
timestamp = {Tue, 09 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GarrosCRFRMWB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReimboldMGLGM07,
author = {Gilles Reimbold and
J{\'{e}}r{\^{o}}me Mitard and
Xavier Garros and
Charles Leroux and
G{\'{e}}rard Ghibaudo and
Fran{\c{c}}ois Martin},
title = {Initial and PBTI-induced traps and charges in Hf-based oxides/TiN
stacks},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {489--496},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.068},
doi = {10.1016/J.MICROREL.2007.01.068},
timestamp = {Tue, 09 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ReimboldMGLGM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RevilG01,
author = {Nathalie Revil and
Xavier Garros},
title = {Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation
Model Limitations and Applications},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1307--1312},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00203-7},
doi = {10.1016/S0026-2714(01)00203-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RevilG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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