BibTeX records: Gilles Gasiot

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Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
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@article{DBLP:journals/mr/MoindjieAMGR17,
  author       = {Soilihi Moindjie and
                  Jean{-}Luc Autran and
                  Daniela Munteanu and
                  Gilles Gasiot and
                  Philippe Roche},
  title        = {Multi-Poisson process analysis of real-time soft-error rate measurements
                  in bulk 65 nm and 40 nm SRAMs},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {53--57},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.07.045},
  doi          = {10.1016/J.MICROREL.2017.07.045},
  timestamp    = {Wed, 23 Mar 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/MoindjieAMGR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/esscirc/AbouzeidBCDGNSR16,
  author       = {Fady Abouzeid and
                  Christophe Bernicot and
                  Sylvain Clerc and
                  Jean{-}Marc Daveau and
                  Gilles Gasiot and
                  Daniel Noblet and
                  Dimitri Soussan and
                  Philippe Roche},
  title        = {30{\%} static power improvement on {ARM} Cortex\({}^{\mbox{{\textregistered}}}\)-A53
                  using static biasing-anticipation},
  booktitle    = {{ESSCIRC} Conference 2016: 42\({}^{\mbox{nd}}\) European Solid-State
                  Circuits Conference, Lausanne, Switzerland, September 12-15, 2016},
  pages        = {37--40},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ESSCIRC.2016.7598237},
  doi          = {10.1109/ESSCIRC.2016.7598237},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/esscirc/AbouzeidBCDGNSR16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AutranMMSSGR15,
  author       = {Jean{-}Luc Autran and
                  Daniela Munteanu and
                  Soilihi Moindjie and
                  Tarek Saad Saoud and
                  S. Sauze and
                  Gilles Gasiot and
                  Philippe Roche},
  title        = {{ASTEP} {(2005-2015):} Ten years of soft error and atmospheric radiation
                  characterization on the Plateau de Bure},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {9-10},
  pages        = {1506--1511},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.06.101},
  doi          = {10.1016/J.MICROREL.2015.06.101},
  timestamp    = {Wed, 23 Mar 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AutranMMSSGR15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/esscirc/AbouzeidCBCDCGS15,
  author       = {Fady Abouzeid and
                  Sylvain Clerc and
                  Cyril Bottoni and
                  Benjamin Coeffic and
                  Jean{-}Marc Daveau and
                  Damien Croain and
                  Gilles Gasiot and
                  Dimitri Soussan and
                  Philippe Roche},
  editor       = {Wolfgang Pribyl and
                  Franz Dielacher and
                  Gernot Hueber},
  title        = {28nm {FD-SOI} technology and design platform for sub-10pJ/cycle and
                  SER-immune 32bits processors},
  booktitle    = {{ESSCIRC} Conference 2015 - 41\({}^{\mbox{st}}\) European Solid-State
                  Circuits Conference, Graz, Austria, September 14-18, 2015},
  pages        = {108--111},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ESSCIRC.2015.7313840},
  doi          = {10.1109/ESSCIRC.2015.7313840},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/esscirc/AbouzeidCBCDCGS15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/GasiotSAMR15,
  author       = {Gilles Gasiot and
                  Dimitri Soussan and
                  Jean{-}Luc Autran and
                  Victor Malherbe and
                  Philippe Roche},
  title        = {Muons and thermal neutrons {SEU} characterization of 28nm {UTBB} {FD-SOI}
                  and Bulk eSRAMs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {2},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112677},
  doi          = {10.1109/IRPS.2015.7112677},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/GasiotSAMR15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/MalherbeGSPAR15,
  author       = {Victor Malherbe and
                  Gilles Gasiot and
                  Dimitri Soussan and
                  Aurelien Patris and
                  Jean{-}Luc Autran and
                  Philippe Roche},
  title        = {Alpha soft error rate of {FDSOI} 28 nm SRAMs: Experimental testing
                  and simulation analysis},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {11},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112829},
  doi          = {10.1109/IRPS.2015.7112829},
  timestamp    = {Sun, 21 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/MalherbeGSPAR15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/BottoniCDGACNR15,
  author       = {Cyril Bottoni and
                  Benjamin Coeffic and
                  Jean{-}Marc Daveau and
                  Gilles Gasiot and
                  Fady Abouzeid and
                  Sylvain Clerc and
                  Lirida A. B. Naviner and
                  Philippe Roche},
  title        = {Frequency and voltage effects on {SER} on a 65nm Sparc-V8 microprocessor
                  under radiation test},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {12},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112830},
  doi          = {10.1109/IRPS.2015.7112830},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BottoniCDGACNR15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AutranMRG14,
  author       = {Jean{-}Luc Autran and
                  Daniela Munteanu and
                  Philippe Roche and
                  Gilles Gasiot},
  title        = {Real-time soft-error rate measurements: {A} review},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {8},
  pages        = {1455--1476},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.02.031},
  doi          = {10.1016/J.MICROREL.2014.02.031},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AutranMRG14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AutranGMCGR14,
  author       = {Jean{-}Luc Autran and
                  Maximilien Glorieux and
                  Daniela Munteanu and
                  Sylvain Clerc and
                  Gilles Gasiot and
                  Philippe Roche},
  title        = {Particle Monte Carlo modeling of single-event transient current and
                  charge collection in integrated circuits},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {2278--2283},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.088},
  doi          = {10.1016/J.MICROREL.2014.07.088},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AutranGMCGR14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/esscirc/ClercAGGR12,
  author       = {Sylvain Clerc and
                  Fady Abouzeid and
                  Gilles Gasiot and
                  David Gauthier and
                  Philippe Roche},
  title        = {A 65nm {SRAM} achieving 250mV retention and 350mV, 1MHz, 55fJ/bit
                  access energy, with bit-interleaved radiation Soft Error tolerance},
  booktitle    = {Proceedings of the 38th European Solid-State Circuit conference, {ESSCIRC}
                  2012, Bordeaux, France, September 17-21, 2012},
  pages        = {313--316},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/ESSCIRC.2012.6341317},
  doi          = {10.1109/ESSCIRC.2012.6341317},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/esscirc/ClercAGGR12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/icicdt/ClercAGGSR12,
  author       = {Sylvain Clerc and
                  Fady Abouzeid and
                  Gilles Gasiot and
                  David Gauthier and
                  Dimitri Soussan and
                  Philippe Roche},
  title        = {A 0.32V, 55fJ per bit access energy, {CMOS} 65nm bit-interleaved {SRAM}
                  with radiation Soft Error tolerance},
  booktitle    = {{IEEE} International Conference on {IC} Design {\&} Technology,
                  {ICICDT} 2012, Austin, TX, USA, May 30 - June 1, 2012},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/ICICDT.2012.6232860},
  doi          = {10.1109/ICICDT.2012.6232860},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/icicdt/ClercAGGSR12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AutranMRGMUSSYRLWZ10,
  author       = {Jean{-}Luc Autran and
                  Daniela Munteanu and
                  Philippe Roche and
                  Gilles Gasiot and
                  S. Martinie and
                  S. Uznanski and
                  S. Sauze and
                  S. Semikh and
                  Evgeny Yakushev and
                  S. Rozov and
                  Pia Loaiza and
                  G. Warot and
                  M. Zampaolo},
  title        = {Soft-errors induced by terrestrial neutrons and natural alpha-particle
                  emitters in advanced memory circuits at ground level},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1822--1831},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.033},
  doi          = {10.1016/J.MICROREL.2010.07.033},
  timestamp    = {Thu, 30 Jun 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/AutranMRGMUSSYRLWZ10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/RocheLGDZD08,
  author       = {Philippe Roche and
                  Mark Lysinger and
                  Gilles Gasiot and
                  Jean{-}Marc Daveau and
                  Mehdi Zamanian and
                  Pierre Dautriche},
  title        = {Growing Interest of Advanced Commercial {CMOS} Technologies for Space
                  and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened
                  {SRAM} in 130nm {CMOS}},
  booktitle    = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008),
                  7-9 July 2008, Rhodes, Greece},
  pages        = {46--48},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/IOLTS.2008.60},
  doi          = {10.1109/IOLTS.2008.60},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/RocheLGDZD08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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