BibTeX records: Frank van der Heyden

• > Home > Persons > Frank van der Heyden

@article{DBLP:journals/dt/ZivkovicSHS09,
  author       = {Vladimir A. Zivkovic and
                  Jan Schat and
                  Frank van der Heyden and
                  Geert Seuren},
  title        = {Core-Based Testing of Embedded Mixed-Signal Modules in a SoC},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {26},
  number       = {3},
  pages        = {78--86},
  year         = {2009},
  url          = {https://doi.org/10.1109/MDT.2009.55},
  doi          = {10.1109/MDT.2009.55},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/ZivkovicSHS09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/ZivkovicHGJ08,
  author       = {Vladimir A. Zivkovic and
                  Frank van der Heyden and
                  Guido Gronthoud and
                  Frans G. M. de Jong},
  title        = {Analog Test Bus Infrastructure for {RF/AMS} Modules in Core-Based
                  Design},
  booktitle    = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29,
                  2008},
  pages        = {27--32},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/ETS.2008.18},
  doi          = {10.1109/ETS.2008.18},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/ZivkovicHGJ08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LogtHW03,
  author       = {Leon van de Logt and
                  Frank van der Heyden and
                  Tom Waayers},
  title        = {An extension to {JTAG} for at-speed debug on a system},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {785--792},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1270910},
  doi          = {10.1109/TEST.2003.1270910},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LogtHW03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/JongH91,
  author       = {Frans G. M. de Jong and
                  Frank van der Heyden},
  title        = {Testing the Integrity of the Boundary Scan Test Infrastructure},
  booktitle    = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
                  Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages        = {106--112},
  publisher    = {{IEEE} Computer Society},
  year         = {1991},
  url          = {https://doi.org/10.1109/TEST.1991.519500},
  doi          = {10.1109/TEST.1991.519500},
  timestamp    = {Tue, 28 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/JongH91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}