BibTeX records: Y. Ji

download as .bib file

@inproceedings{DBLP:conf/irps/JiGLLLUPHSLSLSH19,
  author    = {Y. Ji and
               H. J. Goo and
               J. Lim and
               S. B. Lee and
               S. Lee and
               T. Uemura and
               J. C. Park and
               S. I. Han and
               S. C. Shin and
               J. H. Lee and
               Y. J. Song and
               K. M. Lee and
               H. M. Shin and
               S. H. Hwang and
               B. Y. Seo and
               Y. K. Lee and
               J. C. Kim and
               G. H. Koh and
               K. C. Park and
               S. Pae and
               G. T. Jeong and
               J. S. Yoon and
               E. S. Jung},
  title     = {Reliability of 8Mbit Embedded-STT-MRAM in 28nm {FDSOI} Technology},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
               CA, USA, March 31 - April 4, 2019},
  pages     = {1--3},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/IRPS.2019.8720429},
  doi       = {10.1109/IRPS.2019.8720429},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/conf/irps/JiGLLLUPHSLSLSH19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-com/ZhaoZZGJ11,
  author    = {Y. Zhao and
               J. Zhang and
               H. Zhang and
               W. Gu and
               Y. Ji},
  title     = {Novel path computation element-based traffic grooming strategy in
               internet protocol over wavelength division multiplexing networks},
  journal   = {{IET} Communications},
  volume    = {5},
  number    = {8},
  pages     = {1138--1146},
  year      = {2011},
  url       = {https://doi.org/10.1049/iet-com.2010.0618},
  doi       = {10.1049/iet-com.2010.0618},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/iet-com/ZhaoZZGJ11.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-com/ZhaoZHZYGJ09,
  author    = {Y. Zhao and
               J. Zhang and
               D. Han and
               X. Zhang and
               Y. Yao and
               W. Gu and
               Y. Ji},
  title     = {Analytical models of blocking probability for multi-granularity cross-connect-based
               optical networks},
  journal   = {{IET} Communications},
  volume    = {3},
  number    = {11},
  pages     = {1716--1723},
  year      = {2009},
  url       = {https://doi.org/10.1049/iet-com.2008.0673},
  doi       = {10.1049/iet-com.2008.0673},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/iet-com/ZhaoZHZYGJ09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuoJZZWLNHGS06,
  author    = {J. F. Luo and
               Y. Ji and
               T. X. Zhong and
               Y. Q. Zhang and
               J. Z. Wang and
               J. P. Liu and
               N. H. Niu and
               J. Han and
               X. Guo and
               G. D. Shen},
  title     = {{EBSD} measurements of elastic strain fields in a GaN/sapphire structure},
  journal   = {Microelectron. Reliab.},
  volume    = {46},
  number    = {1},
  pages     = {178--182},
  year      = {2006},
  url       = {https://doi.org/10.1016/j.microrel.2005.05.012},
  doi       = {10.1016/j.microrel.2005.05.012},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/LuoJZZWLNHGS06.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeGSJWDWGAB02,
  author    = {T. H. Lee and
               X. Guo and
               G. D. Shen and
               Y. Ji and
               G. H. Wang and
               J. Y. Du and
               X. Z. Wang and
               G. Gao and
               A. Altes and
               L. J. Balk},
  title     = {Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting
               Diodes {(TRMAR} {LED)} by Scanning Thermal Microscopy {(STHM)}},
  journal   = {Microelectron. Reliab.},
  volume    = {42},
  number    = {9-11},
  pages     = {1711--1714},
  year      = {2002},
  url       = {https://doi.org/10.1016/S0026-2714(02)00217-2},
  doi       = {10.1016/S0026-2714(02)00217-2},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/LeeGSJWDWGAB02.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of Schloss Dagstuhl - Leibniz Center for Informatics