BibTeX records: Y. Ji

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@inproceedings{DBLP:conf/irps/SatoSJLBKRLHJLKLLPSJSKK23,
  author       = {Hideo Sato and
                  H. M. Shin and
                  H. Jung and
                  S. W. Lee and
                  H. Bae and
                  H. Kwon and
                  K. H. Ryu and
                  W. C. Lim and
                  Y. S. Han and
                  J. H. Jeong and
                  J. M. Lee and
                  D. S. Kim and
                  K. Lee and
                  J. H. Lee and
                  J. H. Park and
                  Y. J. Song and
                  Y. Ji and
                  B. I. Seo and
                  J. W. Kim and
                  H. H. Kim},
  title        = {Comprehensive study on prediction of endurance properties from breakdown
                  voltage in high-reliable {STT-MRAM}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10118152},
  doi          = {10.1109/IRPS48203.2023.10118152},
  timestamp    = {Fri, 20 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/SatoSJLBKRLHJLKLLPSJSKK23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsit/KoPBJSKLJLLPKKJ23,
  author       = {S. Ko and
                  J. H. Park and
                  J. H. Bak and
                  H. Jung and
                  J. Shim and
                  D. S. Kim and
                  W. Lim and
                  D.{-}E. Jeong and
                  J. H. Lee and
                  K. Lee and
                  J.{-}H. Park and
                  Y. Kim and
                  C. Kim and
                  J. H. Jeong and
                  C. Y. Lee and
                  S. H. Han and
                  Y. Ji and
                  S. H. Hwang and
                  H. J. Shin and
                  K. Lee and
                  Y. J. Song and
                  Y. G. Shin and
                  J. H. Song},
  title        = {Highly Reliable and Manufacturable {MRAM} embedded in 14nm FinFET
                  node},
  booktitle    = {2023 {IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
                  and Circuits), Kyoto, Japan, June 11-16, 2023},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185248},
  doi          = {10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185248},
  timestamp    = {Fri, 28 Jul 2023 10:40:41 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsit/KoPBJSKLJLLPKKJ23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/JiGLLLUPHSLSLSH19,
  author       = {Y. Ji and
                  H. J. Goo and
                  J. Lim and
                  S. B. Lee and
                  S. Lee and
                  Taiki Uemura and
                  J. C. Park and
                  S. I. Han and
                  S. C. Shin and
                  J. H. Lee and
                  Y. J. Song and
                  K. M. Lee and
                  H. M. Shin and
                  S. H. Hwang and
                  B. Y. Seo and
                  Y. K. Lee and
                  J. C. Kim and
                  Gwanhyeob Koh and
                  K. C. Park and
                  Sangwoo Pae and
                  Gi{-}Tae Jeong and
                  J. S. Yoon and
                  E. S. Jung},
  title        = {Reliability of 8Mbit Embedded-STT-MRAM in 28nm {FDSOI} Technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720429},
  doi          = {10.1109/IRPS.2019.8720429},
  timestamp    = {Wed, 20 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/JiGLLLUPHSLSLSH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}