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BibTeX records: Hwei-Tsu Ann Luh
@article{DBLP:journals/dt/LinWL04, author = {Bin{-}Hong Lin and Cheng{-}Wen Wu and Hwei{-}Tsu Ann Luh}, title = {Efficient and Economical Test Equipment Setup Using Procorrelation}, journal = {{IEEE} Des. Test Comput.}, volume = {21}, number = {1}, pages = {34--43}, year = {2004}, url = {https://doi.org/10.1109/MDT.2004.1261848}, doi = {10.1109/MDT.2004.1261848}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/LinWL04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcad/MinLR93, author = {Hyoung B. Min and Hwei{-}Tsu Ann Luh and William A. Rogers}, title = {Hierarchical test pattern generation: a cost model and implementation}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {12}, number = {7}, pages = {1029--1039}, year = {1993}, url = {https://doi.org/10.1109/43.238039}, doi = {10.1109/43.238039}, timestamp = {Thu, 24 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcad/MinLR93.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iccad/MinRL89, author = {Hyoung B. Min and William A. Rogers and Hwei{-}Tsu Ann Luh}, title = {{FANHAT:} fanout oriented hierarchical automatic test generation system}, booktitle = {1989 {IEEE} International Conference on Computer-Aided Design, {ICCAD} 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers}, pages = {470--473}, publisher = {{IEEE} Computer Society}, year = {1989}, url = {https://doi.org/10.1109/ICCAD.1989.76993}, doi = {10.1109/ICCAD.1989.76993}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iccad/MinRL89.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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