BibTeX records: Wojciech Maly

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@article{DBLP:journals/tvlsi/QiuMM15,
  author    = {Xiang Qiu and
               Malgorzata Marek{-}Sadowska and
               Wojciech P. Maly},
  title     = {Three-Dimensional Chips Can Be Cool: Thermal Study of VeSFET-Based
               3-D Chips},
  journal   = {{IEEE} Trans. {VLSI} Syst.},
  volume    = {23},
  number    = {5},
  pages     = {869--878},
  year      = {2015},
  url       = {https://doi.org/10.1109/TVLSI.2014.2325551},
  doi       = {10.1109/TVLSI.2014.2325551},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tvlsi/QiuMM15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/QiuMM14,
  author    = {Xiang Qiu and
               Malgorzata Marek{-}Sadowska and
               Wojciech P. Maly},
  title     = {Characterizing VeSFET-Based ICs With CMOS-Oriented {EDA} Infrastructure},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {33},
  number    = {4},
  pages     = {495--506},
  year      = {2014},
  url       = {https://doi.org/10.1109/TCAD.2013.2293539},
  doi       = {10.1109/TCAD.2013.2293539},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/QiuMM14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/QiuMM13,
  author    = {Xiang Qiu and
               Malgorzata Marek{-}Sadowska and
               Wojciech Maly},
  title     = {Designing VeSFET-based ICs with CMOS-oriented {EDA} infrastructure},
  booktitle = {International Symposium on Physical Design, ISPD'13, Stateline, NV,
               USA, March 24-27, 2013},
  pages     = {130--136},
  year      = {2013},
  crossref  = {DBLP:conf/ispd/2013},
  url       = {https://doi.org/10.1145/2451916.2451949},
  doi       = {10.1145/2451916.2451949},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/QiuMM13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/QiuMM12,
  author    = {Xiang Qiu and
               Malgorzata Marek{-}Sadowska and
               Wojciech Maly},
  title     = {Vertical Slit Field Effect Transistor in ultra-low power applications},
  booktitle = {Thirteenth International Symposium on Quality Electronic Design, {ISQED}
               2012, Santa Clara, CA, USA, March 19-21, 2012},
  pages     = {384--390},
  year      = {2012},
  crossref  = {DBLP:conf/isqed/2012},
  url       = {https://doi.org/10.1109/ISQED.2012.6187522},
  doi       = {10.1109/ISQED.2012.6187522},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/QiuMM12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LinMM11,
  author    = {Yi{-}Wei Lin and
               Malgorzata Marek{-}Sadowska and
               Wojciech Maly},
  title     = {On Cell Layout-Performance Relationships in VeSFET-Based, High-Density
               Regular Circuits},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {30},
  number    = {2},
  pages     = {229--241},
  year      = {2011},
  url       = {https://doi.org/10.1109/TCAD.2010.2097191},
  doi       = {10.1109/TCAD.2010.2097191},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/LinMM11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/Maly11,
  author    = {Wojciech Maly},
  title     = {Vertical slit transistor based integrated circuits (veSTICs): feasibility
               study},
  booktitle = {Proceedings of the 2011 International Symposium on Physical Design,
               {ISPD} 2011, Santa Barbara, California, USA, March 27-30, 2011},
  pages     = {147--148},
  year      = {2011},
  crossref  = {DBLP:conf/ispd/2011},
  url       = {https://doi.org/10.1145/1960397.1960431},
  doi       = {10.1145/1960397.1960431},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/Maly11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LinMM10,
  author    = {Yi{-}Wei Lin and
               Malgorzata Marek{-}Sadowska and
               Wojciech Maly},
  title     = {Layout Generator for Transistor-Level High-Density Regular Circuits},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {29},
  number    = {2},
  pages     = {197--210},
  year      = {2010},
  url       = {https://doi.org/10.1109/TCAD.2009.2035580},
  doi       = {10.1109/TCAD.2009.2035580},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/LinMM10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/LinMM10,
  author    = {Yi{-}Wei Lin and
               Malgorzata Marek{-}Sadowska and
               Wojciech Maly},
  title     = {Performance study of VeSFET-based, high-density regular circuits},
  booktitle = {Proceedings of the 2010 International Symposium on Physical Design,
               {ISPD} 2010, San Francisco, California, USA, March 14-17, 2010},
  pages     = {161--168},
  year      = {2010},
  crossref  = {DBLP:conf/ispd/2010},
  url       = {https://doi.org/10.1145/1735023.1735062},
  doi       = {10.1145/1735023.1735062},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/LinMM10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TamBM10,
  author    = {Wing Chiu Tam and
               R. D. (Shawn) Blanton and
               Wojciech Maly},
  title     = {Evaluating yield and testing impact of sub-wavelength lithography},
  booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
               Santa Cruz, California, {USA}},
  pages     = {200--205},
  year      = {2010},
  crossref  = {DBLP:conf/vts/2010},
  url       = {https://doi.org/10.1109/VTS.2010.5469576},
  doi       = {10.1109/VTS.2010.5469576},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/TamBM10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/WeisPKEMS09,
  author    = {Marcus Weis and
               Andrzej Pfitzner and
               Dominik Kasprowicz and
               Rainer Emling and
               Wojciech Maly and
               Doris Schmitt{-}Landsiedel},
  title     = {Adder Circuits with Transistors using Independently Controlled Gates},
  booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2009), 24-17
               May 2009, Taipei, Taiwan},
  pages     = {449--452},
  year      = {2009},
  crossref  = {DBLP:conf/iscas/2009},
  url       = {https://doi.org/10.1109/ISCAS.2009.5117782},
  doi       = {10.1109/ISCAS.2009.5117782},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iscas/WeisPKEMS09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/Maly09,
  author    = {Wojciech Maly},
  title     = {Vertical slit transistor based integrated circuits (VeSTICs) paradigm},
  booktitle = {Proceedings of the 2009 International Symposium on Physical Design,
               {ISPD} 2009, San Diego, California, USA, March 29 - April 1, 2009},
  pages     = {63--64},
  year      = {2009},
  crossref  = {DBLP:conf/ispd/2009},
  url       = {https://doi.org/10.1145/1514932.1514947},
  doi       = {10.1145/1514932.1514947},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/Maly09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/LinMM09,
  author    = {Yi{-}Wei Lin and
               Malgorzata Marek{-}Sadowska and
               Wojciech Maly},
  title     = {Transistor-level layout of high-density regular circuits},
  booktitle = {Proceedings of the 2009 International Symposium on Physical Design,
               {ISPD} 2009, San Diego, California, USA, March 29 - April 1, 2009},
  pages     = {83--90},
  year      = {2009},
  crossref  = {DBLP:conf/ispd/2009},
  url       = {https://doi.org/10.1145/1514932.1514954},
  doi       = {10.1145/1514932.1514954},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/LinMM09},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/AitkenBMR08,
  author    = {Rob Aitken and
               Jerry Bautista and
               Wojciech Maly and
               Jan M. Rabaey},
  title     = {More Moore: foolish, feasible, or fundamentally different?},
  booktitle = {2008 International Conference on Computer-Aided Design, {ICCAD} 2008,
               San Jose, CA, USA, November 10-13, 2008},
  pages     = {9},
  year      = {2008},
  crossref  = {DBLP:conf/iccad/2008},
  url       = {https://doi.org/10.1109/ICCAD.2008.4681540},
  doi       = {10.1109/ICCAD.2008.4681540},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/AitkenBMR08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/LinMMPK08,
  author    = {Yi{-}Wei Lin and
               Malgorzata Marek{-}Sadowska and
               Wojciech Maly and
               Andrzej Pfitzner and
               Dominik Kasprowicz},
  title     = {Is there always performance overhead for regular fabric?},
  booktitle = {26th International Conference on Computer Design, {ICCD} 2008, 12-15
               October 2008, Lake Tahoe, CA, USA, Proceedings},
  pages     = {557--562},
  year      = {2008},
  crossref  = {DBLP:conf/iccd/2008},
  url       = {https://doi.org/10.1109/ICCD.2008.4751916},
  doi       = {10.1109/ICCD.2008.4751916},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccd/LinMMPK08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/MalyLM07,
  author    = {Wojciech Maly and
               Yi{-}Wei Lin and
               Malgorzata Marek{-}Sadowska},
  title     = {OPC-Free and Minimally Irregular {IC} Design Style},
  booktitle = {Proceedings of the 44th Design Automation Conference, {DAC} 2007,
               San Diego, CA, USA, June 4-8, 2007},
  pages     = {954--957},
  year      = {2007},
  crossref  = {DBLP:conf/dac/2007},
  url       = {https://doi.org/10.1145/1278480.1278715},
  doi       = {10.1145/1278480.1278715},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/MalyLM07},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/NelsonZBPBMBS06,
  author    = {Jeffrey E. Nelson and
               Thomas Zanon and
               Jason G. Brown and
               Osei Poku and
               R. D. (Shawn) Blanton and
               Wojciech Maly and
               Brady Benware and
               Chris Schuermyer},
  title     = {Extracting Defect Density and Size Distributions from Product ICs},
  journal   = {{IEEE} Design {\&} Test of Computers},
  volume    = {23},
  number    = {5},
  pages     = {390--400},
  year      = {2006},
  url       = {https://doi.org/10.1109/MDT.2006.117},
  doi       = {10.1109/MDT.2006.117},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/dt/NelsonZBPBMBS06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/NelsonZDBPMB06,
  author    = {Jeffrey E. Nelson and
               Thomas Zanon and
               Rao Desineni and
               Jason G. Brown and
               N. Patil and
               Wojciech Maly and
               R. D. (Shawn) Blanton},
  title     = {Extraction of defect density and size distributions from wafer sort
               test results},
  booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
               {DATE} 2006, Munich, Germany, March 6-10, 2006},
  pages     = {913--918},
  year      = {2006},
  crossref  = {DBLP:conf/date/2006p},
  url       = {https://doi.org/10.1109/DATE.2006.243807},
  doi       = {10.1109/DATE.2006.243807},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/NelsonZDBPMB06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/DengM05,
  author    = {Yangdong Deng and
               Wojciech P. Maly},
  title     = {2.5-dimensional {VLSI} system integration},
  journal   = {{IEEE} Trans. {VLSI} Syst.},
  volume    = {13},
  number    = {6},
  pages     = {668--677},
  year      = {2005},
  url       = {https://doi.org/10.1109/TVLSI.2005.848814},
  doi       = {10.1109/TVLSI.2005.848814},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tvlsi/DengM05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/DengM04,
  author    = {Yangdong Steve Deng and
               Wojciech Maly},
  title     = {2.5D system integration: a design driven system implementation schema},
  booktitle = {Proceedings of the 2004 Conference on Asia South Pacific Design Automation:
               Electronic Design and Solution Fair 2004, Yokohama, Japan, January
               27-30, 2004},
  pages     = {450--455},
  year      = {2004},
  crossref  = {DBLP:conf/aspdac/2004},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ASPDAC.2004.2},
  doi       = {10.1109/ASPDAC.2004.2},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/DengM04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VogelsZDBMBNFHGMRT04,
  author    = {Thomas J. Vogels and
               Thomas Zanon and
               Rao Desineni and
               R. D. (Shawn) Blanton and
               Wojciech Maly and
               Jason G. Brown and
               Jeffrey E. Nelson and
               Y. Fei and
               X. Huang and
               Padmini Gopalakrishnan and
               Mahim Mishra and
               Vyacheslav Rovner and
               S. Tiwary},
  title     = {Benchmarking Diagnosis Algorithms With a Diverse Set of {IC} Deformations},
  booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
               26-28, 2004, Charlotte, NC, {USA}},
  pages     = {508--517},
  year      = {2004},
  crossref  = {DBLP:conf/itc/2004},
  url       = {https://doi.org/10.1109/TEST.2004.1386987},
  doi       = {10.1109/TEST.2004.1386987},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/VogelsZDBMBNFHGMRT04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/DengM03,
  author    = {Yangdong Deng and
               Wojciech Maly},
  title     = {Physical Design of the "2.5D" Stacked System},
  booktitle = {21st International Conference on Computer Design {(ICCD} 2003),VLSI
               in Computers and Processors, 13-15 October 2003, San Jose, CA, USA,
               Proceedings},
  pages     = {211--217},
  year      = {2003},
  crossref  = {DBLP:conf/iccd/2003},
  url       = {https://doi.org/10.1109/ICCD.2003.1240897},
  doi       = {10.1109/ICCD.2003.1240897},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccd/DengM03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VogelsMB03,
  author    = {Thomas J. Vogels and
               Wojciech Maly and
               R. D. (Shawn) Blanton},
  title     = {Progressive Bridge Identification},
  booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
               Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
               NC, {USA}},
  pages     = {309--318},
  year      = {2003},
  crossref  = {DBLP:conf/itc/2003},
  url       = {https://doi.org/10.1109/TEST.2003.1270853},
  doi       = {10.1109/TEST.2003.1270853},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/VogelsMB03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MalyGZVBS03,
  author    = {Wojciech Maly and
               Anne E. Gattiker and
               Thomas Zanon and
               Thomas J. Vogels and
               R. D. (Shawn) Blanton and
               Thomas M. Storey},
  title     = {Deformations of {IC} Structure in Test and Yield Learning},
  booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
               Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
               NC, {USA}},
  pages     = {856--865},
  year      = {2003},
  crossref  = {DBLP:conf/itc/2003},
  url       = {https://doi.org/10.1109/TEST.2003.1271071},
  doi       = {10.1109/TEST.2003.1271071},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/MalyGZVBS03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/NagGWBM02,
  author    = {Pranab K. Nag and
               Anne E. Gattiker and
               Sichao Wei and
               Ronald D. Blanton and
               Wojciech Maly},
  title     = {Modeling the Economics of Testing: {A} {DFT} Perspective},
  journal   = {{IEEE} Design {\&} Test of Computers},
  volume    = {19},
  number    = {1},
  pages     = {29--41},
  year      = {2002},
  url       = {https://doi.org/10.1109/54.980051},
  doi       = {10.1109/54.980051},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/dt/NagGWBM02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BlantonCDDMV02,
  author    = {Ronald D. Blanton and
               John T. Chen and
               Rao Desineni and
               Kumar N. Dwarakanath and
               Wojciech Maly and
               Thomas J. Vogels},
  title     = {Fault Tuples in Diagnosis of Deep-Submicron Circuits},
  booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  pages     = {233--241},
  year      = {2002},
  crossref  = {DBLP:conf/itc/2002},
  url       = {https://doi.org/10.1109/TEST.2002.1041765},
  doi       = {10.1109/TEST.2002.1041765},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/BlantonCDDMV02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/Maly01,
  author    = {Wojciech Maly},
  title     = {{IC} Design in High-Cost Nanometer-Technologies Era},
  booktitle = {Proceedings of the 38th Design Automation Conference, {DAC} 2001,
               Las Vegas, NV, USA, June 18-22, 2001},
  pages     = {9--14},
  year      = {2001},
  crossref  = {DBLP:conf/dac/2001},
  url       = {https://doi.org/10.1145/378239.378249},
  doi       = {10.1145/378239.378249},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/Maly01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/DengM01,
  author    = {Yangdong Deng and
               Wojciech Maly},
  title     = {Interconnect characteristics of 2.5-D system integration scheme},
  booktitle = {Proceedings of the 2001 International Symposium on Physical Design,
               {ISPD} 2001, Sonoma County, CA, USA, April 1-4, 2001},
  pages     = {171--175},
  year      = {2001},
  crossref  = {DBLP:conf/ispd/2001},
  url       = {https://doi.org/10.1145/369691.369763},
  doi       = {10.1145/369691.369763},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/DengM01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/Maly01,
  author    = {Wojciech Maly},
  title     = {Quality of Design from an {IC} Manufacturing Perspective},
  booktitle = {2nd International Symposium on Quality of Electronic Design {(ISQED}
               2001), 26-28 March 2001, San Jose, CA, {USA}},
  pages     = {235--236},
  year      = {2001},
  crossref  = {DBLP:conf/isqed/2001},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2001.10027},
  doi       = {10.1109/ISQED.2001.10027},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/Maly01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenKWSRM01,
  author    = {John T. Chen and
               Jitendra Khare and
               Ken Walker and
               Saghir A. Shaikh and
               Janusz Rajski and
               Wojciech Maly},
  title     = {Test response compression and bitmap encoding for embedded memories
               in manufacturing process monitoring},
  booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
               MD, USA, 30 October - 1 November 2001},
  pages     = {258--267},
  year      = {2001},
  crossref  = {DBLP:conf/itc/2001},
  url       = {https://doi.org/10.1109/TEST.2001.966641},
  doi       = {10.1109/TEST.2001.966641},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/ChenKWSRM01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChenMRKK01,
  author    = {John T. Chen and
               Wojciech Maly and
               Janusz Rajski and
               Omar Kebichi and
               Jitendra Khare},
  title     = {Enabling Embedded Memory Diagnosis via Test Response Compression},
  booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
               in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
               {USA}},
  pages     = {292--298},
  year      = {2001},
  crossref  = {DBLP:conf/vts/2001},
  url       = {https://doi.org/10.1109/VTS.2001.923452},
  doi       = {10.1109/VTS.2001.923452},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/ChenMRKK01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/slip/LiNM00,
  author    = {Peng Li and
               Pranab K. Nag and
               Wojciech Maly},
  title     = {Cost based tradeoff analysis of standard cell designs},
  booktitle = {The Second {IEEE/ACM} International Workshop on System-Level Interconnect
               Prediction {(SLIP} 2000), April 8-9, 2000, San Diego, California,
               USA, Proceedings},
  pages     = {129--135},
  year      = {2000},
  crossref  = {DBLP:conf/slip/2000},
  url       = {https://doi.org/10.1145/333032.333043},
  doi       = {10.1145/333032.333043},
  timestamp = {Thu, 31 Oct 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/slip/LiNM00},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/PleskaczOM99,
  author    = {Witold A. Pleskacz and
               Charles H. Ouyang and
               Wojciech Maly},
  title     = {A DRC-based algorithm for extraction of critical areas for opens in
               large {VLSI} circuits},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {18},
  number    = {2},
  pages     = {151--162},
  year      = {1999},
  url       = {https://doi.org/10.1109/43.743724},
  doi       = {10.1109/43.743724},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/PleskaczOM99},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/NiewczasMS99,
  author    = {Mariusz Niewczas and
               Wojciech Maly and
               Andrzej J. Strojwas},
  title     = {An algorithm for determining repetitive patterns in very large {IC}
               layouts},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {18},
  number    = {4},
  pages     = {494--501},
  year      = {1999},
  url       = {https://doi.org/10.1109/43.752932},
  doi       = {10.1109/43.752932},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/NiewczasMS99},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/MalyNHK98,
  author    = {Wojciech Maly and
               Pranab K. Nag and
               Hans T. Heineken and
               Jitendra Khare},
  title     = {Design-Manufacturing Interface: Part {I} - Vision},
  booktitle = {1998 Design, Automation and Test in Europe {(DATE} '98), February
               23-26, 1998, Le Palais des Congr{\`{e}}s de Paris, Paris, France},
  pages     = {550--556},
  year      = {1998},
  crossref  = {DBLP:conf/date/1998},
  url       = {https://doi.org/10.1109/DATE.1998.655912},
  doi       = {10.1109/DATE.1998.655912},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/MalyNHK98},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/MalyNOHKS98,
  author    = {Wojciech Maly and
               Pranab K. Nag and
               Charles H. Ouyang and
               Hans T. Heineken and
               Jitendra Khare and
               P. Simon},
  title     = {Design-Manufacturing Interface: Part {II} - Applications},
  booktitle = {1998 Design, Automation and Test in Europe {(DATE} '98), February
               23-26, 1998, Le Palais des Congr{\`{e}}s de Paris, Paris, France},
  pages     = {557--562},
  year      = {1998},
  crossref  = {DBLP:conf/date/1998},
  url       = {https://doi.org/10.1109/DATE.1998.655913},
  doi       = {10.1109/DATE.1998.655913},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/MalyNOHKS98},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/HeinekenM98,
  author    = {Hans T. Heineken and
               Wojciech Maly},
  title     = {Performance - Manufacturability Tradeoffs in {IC} Design},
  booktitle = {1998 Design, Automation and Test in Europe {(DATE} '98), February
               23-26, 1998, Le Palais des Congr{\`{e}}s de Paris, Paris, France},
  pages     = {563--567},
  year      = {1998},
  crossref  = {DBLP:conf/date/1998},
  url       = {https://doi.org/10.1109/DATE.1998.655914},
  doi       = {10.1109/DATE.1998.655914},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/HeinekenM98},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/Maly98,
  author    = {Wojciech Maly},
  title     = {Moore's law and physical design of ICs},
  booktitle = {Proceedings of the 1998 International Symposium on Physical Design,
               {ISPD} 1998, Monterey, CA, USA, April 6-8, 1998},
  pages     = {36},
  year      = {1998},
  crossref  = {DBLP:conf/ispd/1998},
  url       = {https://doi.org/10.1145/274535.274540},
  doi       = {10.1145/274535.274540},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/Maly98},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ispd/NiewczasMS98,
  author    = {Mariusz Niewczas and
               Wojciech Maly and
               Andrzej J. Strojwas},
  title     = {A pattern matching algorithm for verification and analysis of very
               large {IC} layouts},
  booktitle = {Proceedings of the 1998 International Symposium on Physical Design,
               {ISPD} 1998, Monterey, CA, USA, April 6-8, 1998},
  pages     = {129--134},
  year      = {1998},
  crossref  = {DBLP:conf/ispd/1998},
  url       = {https://doi.org/10.1145/274535.274554},
  doi       = {10.1145/274535.274554},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/NiewczasMS98},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GattikerM98,
  author    = {Anne E. Gattiker and
               Wojciech Maly},
  title     = {Toward understanding "Iddq-only" fails},
  booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
               DC, USA, October 18-22, 1998},
  pages     = {174--183},
  year      = {1998},
  crossref  = {DBLP:conf/itc/1998},
  url       = {https://doi.org/10.1109/TEST.1998.743150},
  doi       = {10.1109/TEST.1998.743150},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/GattikerM98},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GattikerM97a,
  author    = {Anne E. Gattiker and
               Wojciech Maly},
  title     = {Current signatures: application [to {CMOS]}},
  booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
               DC, USA, October 18-22, 1998},
  pages     = {1168--1177},
  year      = {1998},
  crossref  = {DBLP:conf/itc/1998},
  url       = {https://doi.org/10.1109/TEST.1998.743360},
  doi       = {10.1109/TEST.1998.743360},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/GattikerM97a},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GattikerM97,
  author    = {Anne E. Gattiker and
               Wojciech Maly},
  title     = {Smart Substrate MCMs},
  journal   = {J. Electronic Testing},
  volume    = {10},
  number    = {1-2},
  pages     = {39--53},
  year      = {1997},
  url       = {https://doi.org/10.1023/A:1008218414112},
  doi       = {10.1023/A:1008218414112},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/et/GattikerM97},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/El-MalehMRM97,
  author    = {Aiman H. El{-}Maleh and
               Thomas E. Marchok and
               Janusz Rajski and
               Wojciech Maly},
  title     = {Behavior and testability preservation under the retiming transformation},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {16},
  number    = {5},
  pages     = {528--543},
  year      = {1997},
  url       = {https://doi.org/10.1109/43.631217},
  doi       = {10.1109/43.631217},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/El-MalehMRM97},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/HeinekenKMNOP97,
  author    = {Hans T. Heineken and
               Jitendra Khare and
               Wojciech Maly and
               Pranab K. Nag and
               Charles H. Ouyang and
               Witold A. Pleskacz},
  title     = {{CAD} at the Design-Manufacturing Interface},
  booktitle = {Proceedings of the 34st Conference on Design Automation, Anaheim,
               California, USA, Anaheim Convention Center, June 9-13, 1997},
  pages     = {321--326},
  year      = {1997},
  crossref  = {DBLP:conf/dac/1997},
  url       = {https://doi.org/10.1145/266021.266123},
  doi       = {10.1145/266021.266123},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/HeinekenKMNOP97},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PleskaczM97,
  author    = {Witold A. Pleskacz and
               Wojciech Maly},
  title     = {Improved Yield Model for Submicron Domain},
  booktitle = {1997 Workshop on Defect and Fault-Tolerance in {VLSI} Systems {(DFT}
               '97), 20-22 October 1997, Paris, France},
  pages     = {2--10},
  year      = {1997},
  crossref  = {DBLP:conf/dft/1997},
  url       = {https://doi.org/10.1109/DFTVS.1997.628303},
  doi       = {10.1109/DFTVS.1997.628303},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/PleskaczM97},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PleskaczMH97,
  author    = {Witold A. Pleskacz and
               Wojciech Maly and
               Hans T. Heineken},
  title     = {Detection of Yield Trends},
  booktitle = {1997 Workshop on Defect and Fault-Tolerance in {VLSI} Systems {(DFT}
               '97), 20-22 October 1997, Paris, France},
  pages     = {62--68},
  year      = {1997},
  crossref  = {DBLP:conf/dft/1997},
  url       = {https://doi.org/10.1109/DFTVS.1997.628310},
  doi       = {10.1109/DFTVS.1997.628310},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/PleskaczMH97},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GattikerM97,
  author    = {Anne E. Gattiker and
               Wojciech Maly},
  title     = {Current Signatures: Application},
  booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
               DC, USA, November 3-5, 1997},
  pages     = {156--165},
  year      = {1997},
  crossref  = {DBLP:conf/itc/1997},
  url       = {https://doi.org/10.1109/TEST.1997.639608},
  doi       = {10.1109/TEST.1997.639608},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/GattikerM97},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WeiNBGM97,
  author    = {Sichao Wei and
               Pranab K. Nag and
               Ronald D. Blanton and
               Anne E. Gattiker and
               Wojciech Maly},
  title     = {To {DFT} or Not to DFT?},
  booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
               DC, USA, November 3-5, 1997},
  pages     = {557--566},
  year      = {1997},
  crossref  = {DBLP:conf/itc/1997},
  url       = {https://doi.org/10.1109/TEST.1997.639664},
  doi       = {10.1109/TEST.1997.639664},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/WeiNBGM97},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NighNBMAM97,
  author    = {Phil Nigh and
               Wayne M. Needham and
               Kenneth M. Butler and
               Peter C. Maxwell and
               Robert C. Aitken and
               Wojciech Maly},
  title     = {So What Is an Optimal Test Mix? {A} Discussion of the {SEMATECH} Methods
               Experiment},
  booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
               DC, USA, November 3-5, 1997},
  pages     = {1037--1038},
  year      = {1997},
  crossref  = {DBLP:conf/itc/1997},
  url       = {https://doi.org/10.1109/TEST.1997.639727},
  doi       = {10.1109/TEST.1997.639727},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/NighNBMAM97},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Maly96,
  author    = {Wojciech Maly},
  title     = {The future of {IC} design, testing, and manufacturing},
  journal   = {{IEEE} Design {\&} Test of Computers},
  volume    = {13},
  number    = {4},
  pages     = {8, 89--91},
  year      = {1996},
  url       = {http://doi.ieeecomputersociety.org/10.1109/MDT.1996.10021},
  doi       = {10.1109/MDT.1996.10021},
  timestamp = {Wed, 26 Oct 2011 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/dt/Maly96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MarchokEMR96,
  author    = {Thomas E. Marchok and
               Aiman H. El{-}Maleh and
               Wojciech Maly and
               Janusz Rajski},
  title     = {A complexity analysis of sequential {ATPG}},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {15},
  number    = {11},
  pages     = {1409--1423},
  year      = {1996},
  url       = {https://doi.org/10.1109/43.543773},
  doi       = {10.1109/43.543773},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/MarchokEMR96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WilliamsKMDM96,
  author    = {Thomas W. Williams and
               Rohit Kapur and
               M. Ray Mercer and
               Robert H. Dennard and
               Wojciech Maly},
  title     = {Iddq Testing for High Performance {CMOS} - The Next Ten Years},
  booktitle = {1996 European Design and Test Conference, ED{\&}TC 1996, Paris,
               France, March 11-14, 1996},
  pages     = {578--583},
  year      = {1996},
  crossref  = {DBLP:conf/date/1996},
  url       = {https://doi.org/10.1109/EDTC.1996.494359},
  doi       = {10.1109/EDTC.1996.494359},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/WilliamsKMDM96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/OuyangPM96,
  author    = {Charles H. Ouyang and
               Witold A. Pleskacz and
               Wojciech Maly},
  title     = {Extraction of critical areas for opens in large {VLSI} circuits},
  booktitle = {1996 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1996, Boston, MA, USA,
               November 6-8, 1996},
  pages     = {21--29},
  year      = {1996},
  crossref  = {DBLP:conf/dft/1996},
  url       = {https://doi.org/10.1109/DFTVS.1996.571981},
  doi       = {10.1109/DFTVS.1996.571981},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/OuyangPM96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GaitondeMW96,
  author    = {Dinesh D. Gaitonde and
               Wojciech Maly and
               D. M. H. Walker},
  title     = {Fatal Fault Probability Prediction for Array Based Designs},
  booktitle = {1996 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1996, Boston, MA, USA,
               November 6-8, 1996},
  pages     = {30--38},
  year      = {1996},
  crossref  = {DBLP:conf/dft/1996},
  url       = {https://doi.org/10.1109/DFTVS.1996.571982},
  doi       = {10.1109/DFTVS.1996.571982},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/GaitondeMW96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MalyOGM96,
  author    = {Wojciech Maly and
               Charles H. Ouyang and
               Subhendra Ghosh and
               Sury Maturi},
  title     = {Detection of an antenna effect in {VLSI} designs},
  booktitle = {1996 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1996, Boston, MA, USA,
               November 6-8, 1996},
  pages     = {86--95},
  year      = {1996},
  crossref  = {DBLP:conf/dft/1996},
  url       = {https://doi.org/10.1109/DFTVS.1996.571999},
  doi       = {10.1109/DFTVS.1996.571999},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/MalyOGM96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/HeinekenM96,
  author    = {Hans T. Heineken and
               Wojciech Maly},
  title     = {Interconnect yield model for manufacturability prediction in synthesis
               of standard cell based designs},
  booktitle = {Proceedings of the 1996 {IEEE/ACM} International Conference on Computer-Aided
               Design, {ICCAD} 1996, San Jose, CA, USA, November 10-14, 1996},
  pages     = {368--373},
  year      = {1996},
  crossref  = {DBLP:conf/iccad/1996},
  url       = {https://doi.org/10.1109/ICCAD.1996.569823},
  doi       = {10.1109/ICCAD.1996.569823},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/HeinekenM96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/MalyHKN96,
  author    = {Wojciech Maly and
               Hans T. Heineken and
               Jitendra Khare and
               Pranab K. Nag},
  title     = {Design for manufacturability in submicron domain},
  booktitle = {Proceedings of the 1996 {IEEE/ACM} International Conference on Computer-Aided
               Design, {ICCAD} 1996, San Jose, CA, USA, November 10-14, 1996},
  pages     = {690--697},
  year      = {1996},
  crossref  = {DBLP:conf/iccad/1996},
  url       = {https://doi.org/10.1109/ICCAD.1996.571365},
  doi       = {10.1109/ICCAD.1996.571365},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/MalyHKN96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/MarchokM96,
  author    = {Thomas E. Marchok and
               Wojciech Maly},
  title     = {Modeling the Difficulty of Sequential Automatic Test Pattern Generation},
  booktitle = {1996 International Conference on Computer Design {(ICCD} '96), {VLSI}
               in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings},
  pages     = {261--271},
  year      = {1996},
  crossref  = {DBLP:conf/iccd/1996},
  url       = {https://doi.org/10.1109/ICCD.1996.563566},
  doi       = {10.1109/ICCD.1996.563566},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccd/MarchokM96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maly96,
  author    = {Wojciech Maly},
  title     = {New and Not-So-New Test Challenges of the Next Decade},
  booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
               Validity, Washington, DC, USA, October 20-25, 1996},
  pages     = {11},
  year      = {1996},
  crossref  = {DBLP:conf/itc/1996},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ITC.1996.10009},
  doi       = {10.1109/ITC.1996.10009},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/Maly96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WilliamsDKMM96,
  author    = {Thomas W. Williams and
               Robert H. Dennard and
               Rohit Kapur and
               M. Ray Mercer and
               Wojciech Maly},
  title     = {I\({}_{\mbox{DDQ}}\) Test: Sensitivity Analysis of Scaling},
  booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
               Validity, Washington, DC, USA, October 20-25, 1996},
  pages     = {786--792},
  year      = {1996},
  crossref  = {DBLP:conf/itc/1996},
  url       = {https://doi.org/10.1109/TEST.1996.557138},
  doi       = {10.1109/TEST.1996.557138},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/WilliamsDKMM96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GattikerM96,
  author    = {Anne E. Gattiker and
               Wojciech Maly},
  title     = {Current signatures {[VLSI} circuit testing]},
  booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
               Princeton, NJ, {USA}},
  pages     = {112--117},
  year      = {1996},
  crossref  = {DBLP:conf/vts/1996},
  url       = {https://doi.org/10.1109/VTEST.1996.510844},
  doi       = {10.1109/VTEST.1996.510844},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/GattikerM96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CampbellKLMNO96,
  author    = {R. L. Campbell and
               P. Kuekes and
               David Y. Lepejian and
               Wojciech P. Maly and
               Michael Nicolaidis and
               Alex Orailoglu},
  title     = {Can Defect-Tolerant Chips Better Meet the Quality Challenge?},
  booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
               Princeton, NJ, {USA}},
  pages     = {362--363},
  year      = {1996},
  crossref  = {DBLP:conf/vts/1996},
  url       = {http://doi.ieeecomputersociety.org/10.1109/VTS.1996.10016},
  doi       = {10.1109/VTS.1996.10016},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/CampbellKLMNO96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KhareMT96,
  author    = {Jitendra Khare and
               Wojciech Maly and
               Nathan Tiday},
  title     = {Fault characterization of standard cell libraries using inductive
               contamination},
  booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
               Princeton, NJ, {USA}},
  pages     = {405--413},
  year      = {1996},
  crossref  = {DBLP:conf/vts/1996},
  url       = {https://doi.org/10.1109/VTEST.1996.510886},
  doi       = {10.1109/VTEST.1996.510886},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/KhareMT96},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MarchokERM95,
  author    = {Thomas E. Marchok and
               Aiman H. El{-}Maleh and
               Janusz Rajski and
               Wojciech Maly},
  title     = {Testability Implications of Performance-Driven Logic Synthesis},
  journal   = {{IEEE} Design {\&} Test of Computers},
  volume    = {12},
  number    = {2},
  pages     = {32--39},
  year      = {1995},
  url       = {https://doi.org/10.1109/54.386003},
  doi       = {10.1109/54.386003},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/dt/MarchokERM95},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/El-MalehMRM95,
  author    = {Aiman H. El{-}Maleh and
               Thomas E. Marchok and
               Janusz Rajski and
               Wojciech Maly},
  title     = {On Test Set Preservation of Retimed Circuits},
  booktitle = {Proceedings of the 32st Conference on Design Automation, San Francisco,
               California, USA, Moscone Center, June 12-16, 1995},
  pages     = {176--182},
  year      = {1995},
  crossref  = {DBLP:conf/dac/1995},
  url       = {https://doi.org/10.1145/217474.217526},
  doi       = {10.1145/217474.217526},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/El-MalehMRM95},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/MarchokEMR95,
  author    = {Thomas E. Marchok and
               Aiman El{-}Maleh and
               Wojciech Maly and
               Janusz Rajski},
  title     = {Complexity of sequential {ATPG}},
  booktitle = {1995 European Design and Test Conference, ED{\&}TC 1995, Paris,
               France, March 6-9, 1995},
  pages     = {252--261},
  year      = {1995},
  crossref  = {DBLP:conf/date/1995},
  url       = {https://doi.org/10.1109/EDTC.1995.470387},
  doi       = {10.1109/EDTC.1995.470387},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/MarchokEMR95},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BubelMWNHSG95,
  author    = {Igor Bubel and
               Wojciech Maly and
               Thomas Waas and
               Pranab K. Nag and
               Hans Hartmann and
               Doris Schmitt{-}Landsiedel and
               Susanne Griep},
  title     = {{AFFCCA:} a tool for critical area analysis with circular defects
               and lithography deformed layout},
  booktitle = {1995 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1995, Lafayette, LA, USA,
               November 13-15, 1995},
  pages     = {10--18},
  year      = {1995},
  crossref  = {DBLP:conf/dft/1995},
  url       = {https://doi.org/10.1109/DFTVS.1995.476932},
  doi       = {10.1109/DFTVS.1995.476932},
  timestamp = {Wed, 17 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/BubelMWNHSG95},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/NagM95,
  author    = {Pranab K. Nag and
               Wojciech Maly},
  title     = {Hierarchical extraction of critical area for shorts in very large
               ICs},
  booktitle = {1995 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1995, Lafayette, LA, USA,
               November 13-15, 1995},
  pages     = {19--27},
  year      = {1995},
  crossref  = {DBLP:conf/dft/1995},
  url       = {https://doi.org/10.1109/DFTVS.1995.476933},
  doi       = {10.1109/DFTVS.1995.476933},
  timestamp = {Wed, 17 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/NagM95},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GaitondeWM95,
  author    = {Dinesh D. Gaitonde and
               D. M. H. Walker and
               Wojciech Maly},
  title     = {Accurate yield estimation of circuits with redundancy},
  booktitle = {1995 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1995, Lafayette, LA, USA,
               November 13-15, 1995},
  pages     = {155--163},
  year      = {1995},
  crossref  = {DBLP:conf/dft/1995},
  url       = {https://doi.org/10.1109/DFTVS.1995.476948},
  doi       = {10.1109/DFTVS.1995.476948},
  timestamp = {Wed, 17 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/GaitondeWM95},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhareM95,
  author    = {Jitendra Khare and
               Wojciech Maly},
  title     = {Inductive Contamination Analysis {(ICA)} with {SRAM} Application},
  booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
               the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages     = {552--560},
  year      = {1995},
  crossref  = {DBLP:conf/itc/1995},
  url       = {https://doi.org/10.1109/TEST.1995.529883},
  doi       = {10.1109/TEST.1995.529883},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/KhareM95},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MalyFGHBT94,
  author    = {Wojciech Maly and
               Derek Feltham and
               Anne E. Gattiker and
               Mark D. Hobaugh and
               Kenneth Backus and
               Michael E. Thomas},
  title     = {Smart-Substrate Multichip-Module Systems},
  journal   = {{IEEE} Design {\&} Test of Computers},
  volume    = {11},
  number    = {2},
  pages     = {64--73},
  year      = {1994},
  url       = {https://doi.org/10.1109/54.282446},
  doi       = {10.1109/54.282446},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/dt/MalyFGHBT94},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/Maly94,
  author    = {Wojciech Maly},
  title     = {Cost of Silicon Viewed from {VLSI} Design Perspective},
  booktitle = {Proceedings of the 31st Conference on Design Automation, San Diego,
               California, USA, June 6-10, 1994},
  pages     = {135--142},
  year      = {1994},
  crossref  = {DBLP:conf/dac/1994},
  url       = {https://doi.org/10.1145/196244.196311},
  doi       = {10.1145/196244.196311},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/Maly94},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GattikerM94,
  author    = {Anne E. Gattiker and
               Wojciech Maly},
  title     = {Feasibility Study of Smart Substrate Multichip Modules},
  booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
               Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages     = {41--49},
  year      = {1994},
  crossref  = {DBLP:conf/itc/1994},
  url       = {https://doi.org/10.1109/TEST.1994.527934},
  doi       = {10.1109/TEST.1994.527934},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/GattikerM94},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maly94,
  author    = {Wojciech Maly},
  title     = {Integration of Design, Manufacturing and Testing},
  booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
               Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  pages     = {1017},
  year      = {1994},
  crossref  = {DBLP:conf/itc/1994},
  url       = {https://doi.org/10.1109/TEST.1994.528051},
  doi       = {10.1109/TEST.1994.528051},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/Maly94},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/NaikAM93,
  author    = {Samir Naik and
               Frank Agricola and
               Wojciech Maly},
  title     = {Failure Analysis of High-Density {CMOS} SRAMs: Using Realistic Defect
               Modeling and I/Sub {DDQ/} Testing},
  journal   = {{IEEE} Design {\&} Test of Computers},
  volume    = {10},
  number    = {2},
  pages     = {13--23},
  year      = {1993},
  url       = {https://doi.org/10.1109/54.211524},
  doi       = {10.1109/54.211524},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/dt/NaikAM93},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NaikM93,
  author    = {Samir B. Naik and
               Wojciech P. Maly},
  title     = {Computer-aided failure analysis of {VLSI} circuits using I\({}_{\mbox{DDQ
               }}\) testing},
  booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
               Atlantic City, NJ, {USA}},
  pages     = {106--108},
  year      = {1993},
  crossref  = {DBLP:conf/vts/1993},
  url       = {https://doi.org/10.1109/VTEST.1993.313300},
  doi       = {10.1109/VTEST.1993.313300},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/NaikM93},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GaitondeKWM93,
  author    = {Dinesh D. Gaitonde and
               Jitendra Khare and
               D. M. H. Walker and
               Wojciech P. Maly},
  title     = {Estimation of reject ratio in testing of combinatorial circuits},
  booktitle = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
               Atlantic City, NJ, {USA}},
  pages     = {319--325},
  year      = {1993},
  crossref  = {DBLP:conf/vts/1993},
  url       = {https://doi.org/10.1109/VTEST.1993.313370},
  doi       = {10.1109/VTEST.1993.313370},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/GaitondeKWM93},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/Maly92,
  author    = {Wojciech Maly},
  title     = {Prospects for {WSI:} {A} Manufacturing Perspective},
  journal   = {{IEEE} Computer},
  volume    = {25},
  number    = {4},
  pages     = {58--65},
  year      = {1992},
  url       = {https://doi.org/10.1109/2.129050},
  doi       = {10.1109/2.129050},
  timestamp = {Wed, 17 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/computer/Maly92},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MalyP92,
  author    = {Wojciech Maly and
               Marek J. Patyra},
  title     = {Design of ICs applying built-in current testing},
  journal   = {J. Electronic Testing},
  volume    = {3},
  number    = {4},
  pages     = {397--406},
  year      = {1992},
  url       = {https://doi.org/10.1007/BF00135343},
  doi       = {10.1007/BF00135343},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/et/MalyP92},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/FelthamKM92,
  author    = {Derek Feltham and
               Jitendra Khare and
               Wojciech Maly},
  title     = {Design for testability view on placement and routing},
  booktitle = {Proceedings of the conference on European design automation, {EURO-DAC}
               '92, Hamburg, Germany, September 7-10, 1992},
  pages     = {382--387},
  year      = {1992},
  crossref  = {DBLP:conf/eurodac/1992},
  url       = {https://doi.org/10.1109/EURDAC.1992.246215},
  doi       = {10.1109/EURDAC.1992.246215},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/eurodac/FelthamKM92},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/Maly91,
  author    = {Wojciech Maly},
  title     = {What is Design for Manufacturability (DFM)? (Panel Abstract)},
  booktitle = {Proceedings of the 28th Design Automation Conference, San Francisco,
               California, USA, June 17-21, 1991},
  pages     = {252},
  year      = {1991},
  crossref  = {DBLP:conf/dac/1991},
  timestamp = {Thu, 16 Mar 2017 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/Maly91},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StoreyMAM91,
  author    = {Thomas M. Storey and
               Wojciech Maly and
               John Andrews and
               Myron Miske},
  title     = {Stuck Fault and Current Testing Comparison Using {CMOS} Chip Test},
  booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
               Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages     = {311--318},
  year      = {1991},
  crossref  = {DBLP:conf/itc/1991},
  url       = {https://doi.org/10.1109/TEST.1991.519523},
  doi       = {10.1109/TEST.1991.519523},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/StoreyMAM91},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MeixnerM91,
  author    = {Anne Meixner and
               Wojciech Maly},
  title     = {Fault Modeling for the Testing of Mixed Integrated Circuits},
  booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
               Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages     = {564--572},
  year      = {1991},
  crossref  = {DBLP:conf/itc/1991},
  url       = {https://doi.org/10.1109/TEST.1991.519719},
  doi       = {10.1109/TEST.1991.519719},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/MeixnerM91},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maly91,
  author    = {Wojciech Maly},
  title     = {Improving the Quality of Test Education},
  booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
               Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages     = {1119},
  year      = {1991},
  crossref  = {DBLP:conf/itc/1991},
  url       = {https://doi.org/10.1109/TEST.1991.519793},
  doi       = {10.1109/TEST.1991.519793},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/Maly91},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/NighM90,
  author    = {Phil Nigh and
               Wojciech Maly},
  title     = {Test Generation for Current Testing {(CMOS} ICs)},
  journal   = {{IEEE} Design {\&} Test of Computers},
  volume    = {7},
  number    = {1},
  pages     = {26--38},
  year      = {1990},
  url       = {https://doi.org/10.1109/54.46891},
  doi       = {10.1109/54.46891},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/dt/NighM90},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maly90,
  author    = {Wojciech Maly},
  title     = {Current testing},
  booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
               D.C., USA, September 10-14, 1990},
  pages     = {257},
  year      = {1990},
  crossref  = {DBLP:conf/itc/1990},
  url       = {https://doi.org/10.1109/TEST.1990.114027},
  doi       = {10.1109/TEST.1990.114027},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/Maly90},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StoreyM90a,
  author    = {Thomas M. Storey and
               Wojciech Maly},
  title     = {{CMOS} bridging fault detection},
  booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
               D.C., USA, September 10-14, 1990},
  pages     = {842--851},
  year      = {1990},
  crossref  = {DBLP:conf/itc/1990},
  url       = {https://doi.org/10.1109/TEST.1990.114102},
  doi       = {10.1109/TEST.1990.114102},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/StoreyM90a},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StoreyM90,
  author    = {Thomas M. Storey and
               Wojciech Maly},
  title     = {{CMOS} Bridging Fault Detection},
  booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
               D.C., USA, September 10-14, 1990},
  pages     = {1123--1132},
  year      = {1990},
  crossref  = {DBLP:conf/itc/1990},
  url       = {https://doi.org/10.1109/TEST.1991.519796},
  doi       = {10.1109/TEST.1991.519796},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/StoreyM90},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/NighM89,
  author    = {Phil Nigh and
               Wojciech Maly},
  title     = {Layout-driven test generation},
  booktitle = {1989 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
               1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical
               Papers},
  pages     = {154--157},
  year      = {1989},
  crossref  = {DBLP:conf/iccad/1989},
  url       = {https://doi.org/10.1109/ICCAD.1989.76925},
  doi       = {10.1109/ICCAD.1989.76925},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/NighM89},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MalyN89,
  author    = {Wojciech Maly and
               Samir B. Naik},
  title     = {Process Monitoring Oriented {IC} Testing},
  booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
               USA, August 1989},
  pages     = {527--532},
  year      = {1989},
  crossref  = {DBLP:conf/itc/1989},
  url       = {https://doi.org/10.1109/TEST.1989.82336},
  doi       = {10.1109/TEST.1989.82336},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/MalyN89},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/MalyN88,
  author    = {Wojciech Maly and
               Phil Nigh},
  title     = {Built-in current testing-feasibility study},
  booktitle = {1988 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
               1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical
               Papers},
  pages     = {340--343},
  year      = {1988},
  crossref  = {DBLP:conf/iccad/1988},
  url       = {https://doi.org/10.1109/ICCAD.1988.122524},
  doi       = {10.1109/ICCAD.1988.122524},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/MalyN88},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/MalyNN88,
  author    = {Wojciech Maly and
               Pranab K. Nag and
               Phil Nigh},
  title     = {Testing oriented analysis of {CMOS} ICs with opens},
  booktitle = {1988 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
               1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical
               Papers},
  pages     = {344--347},
  year      = {1988},
  crossref  = {DBLP:conf/iccad/1988},
  url       = {https://doi.org/10.1109/ICCAD.1988.122525},
  doi       = {10.1109/ICCAD.1988.122525},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/MalyNN88},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/Maly87,
  author    = {Wojciech Maly},
  title     = {Realistic Fault Modeling for {VLSI} Testing},
  booktitle = {Proceedings of the 24th {ACM/IEEE} Design Automation Conference. Miami
               Beach, FL, USA, June 28 - July 1, 1987},
  pages     = {173--180},
  year      = {1987},
  crossref  = {DBLP:conf/dac/1987},
  url       = {https://doi.org/10.1145/37888.37914},
  doi       = {10.1145/37888.37914},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/Maly87},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MalySD86,
  author    = {Wojciech Maly and
               Andrzej J. Strojwas and
               Stephen W. Director},
  title     = {{VLSI} Yield Prediction and Estimation: {A} Unified Framework},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {5},
  number    = {1},
  pages     = {114--130},
  year      = {1986},
  url       = {https://doi.org/10.1109/TCAD.1986.1270182},
  doi       = {10.1109/TCAD.1986.1270182},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/MalySD86},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/Maly86,
  author    = {Wojciech Maly},
  title     = {Optimal order of the {VLSI} {IC} testing sequence},
  booktitle = {Proceedings of the 23rd {ACM/IEEE} Design Automation Conference. Las
               Vegas, NV, USA, June, 1986},
  pages     = {560--566},
  year      = {1986},
  crossref  = {DBLP:conf/dac/1986},
  url       = {https://doi.org/10.1145/318013.318103},
  doi       = {10.1145/318013.318103},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/Maly86},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MalyP85,
  author    = {Wojciech Maly and
               Zygmunt Pizlo},
  title     = {Tolerance Assignment for {IC} Selection Tests},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {4},
  number    = {2},
  pages     = {156--162},
  year      = {1985},
  url       = {https://doi.org/10.1109/TCAD.1985.1270109},
  doi       = {10.1109/TCAD.1985.1270109},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/MalyP85},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/Maly85,
  author    = {Wojciech Maly},
  title     = {Modeling of Lithography Related Yield Losses for {CAD} of {VLSI} Circuits},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {4},
  number    = {3},
  pages     = {166--177},
  year      = {1985},
  url       = {https://doi.org/10.1109/TCAD.1985.1270112},
  doi       = {10.1109/TCAD.1985.1270112},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/Maly85},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MalyFS84,
  author    = {Wojciech Maly and
               F. Joel Ferguson and
               John Paul Shen},
  title     = {Systematic Characterization of Physical Defects for Fault Analysis
               of {MOS} {IC} Cells},
  booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA,
               USA, October 1984},
  pages     = {390--399},
  year      = {1984},
  crossref  = {DBLP:conf/itc/1984},
  timestamp = {Fri, 22 Nov 2002 13:40:15 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/MalyFS84},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MalyS82,
  author    = {Wojciech Maly and
               Andrzej J. Strojwas},
  title     = {Statistical Simulation of the {IC} Manufacturing Process},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {1},
  number    = {3},
  pages     = {120--131},
  year      = {1982},
  url       = {https://doi.org/10.1109/TCAD.1982.1270003},
  doi       = {10.1109/TCAD.1982.1270003},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/MalyS82},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ispd/2013,
  editor    = {Cheng{-}Kok Koh and
               Cliff C. N. Sze},
  title     = {International Symposium on Physical Design, ISPD'13, Stateline, NV,
               USA, March 24-27, 2013},
  publisher = {{ACM}},
  year      = {2013},
  url       = {https://doi.org/10.1145/2451916},
  doi       = {10.1145/2451916},
  isbn      = {978-1-4503-1954-6},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/2013},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2012,
  editor    = {Keith A. Bowman and
               Kamesh V. Gadepally and
               Pallab Chatterjee and
               Mark M. Budnik and
               Lalitha Immaneni},
  title     = {Thirteenth International Symposium on Quality Electronic Design, {ISQED}
               2012, Santa Clara, CA, USA, March 19-21, 2012},
  publisher = {{IEEE}},
  year      = {2012},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6182938/proceeding},
  isbn      = {978-1-4673-1034-5},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2012},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ispd/2011,
  editor    = {Yao{-}Wen Chang and
               Jiang Hu},
  title     = {Proceedings of the 2011 International Symposium on Physical Design,
               {ISPD} 2011, Santa Barbara, California, USA, March 27-30, 2011},
  publisher = {{ACM}},
  year      = {2011},
  url       = {https://doi.org/10.1145/1960397},
  doi       = {10.1145/1960397},
  isbn      = {978-1-4503-0550-1},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ispd/2010,
  editor    = {Prashant Saxena and
               Yao{-}Wen Chang},
  title     = {Proceedings of the 2010 International Symposium on Physical Design,
               {ISPD} 2010, San Francisco, California, USA, March 14-17, 2010},
  publisher = {{ACM}},
  year      = {2010},
  url       = {https://doi.org/10.1145/1735023},
  doi       = {10.1145/1735023},
  isbn      = {978-1-60558-920-6},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/2010},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2010,
  title     = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
               Santa Cruz, California, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5464131/proceeding},
  isbn      = {978-1-4244-6648-1},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2010},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iscas/2009,
  title     = {International Symposium on Circuits and Systems {(ISCAS} 2009), 24-17
               May 2009, Taipei, Taiwan},
  publisher = {{IEEE}},
  year      = {2009},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5076158/proceeding},
  isbn      = {978-1-4244-3827-3},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iscas/2009},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ispd/2009,
  editor    = {Gi{-}Joon Nam and
               Prashant Saxena},
  title     = {Proceedings of the 2009 International Symposium on Physical Design,
               {ISPD} 2009, San Diego, California, USA, March 29 - April 1, 2009},
  publisher = {{ACM}},
  year      = {2009},
  url       = {https://doi.org/10.1145/1514932},
  doi       = {10.1145/1514932},
  isbn      = {978-1-60558-449-2},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/2009},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccad/2008,
  editor    = {Sani R. Nassif and
               Jaijeet S. Roychowdhury},
  title     = {2008 International Conference on Computer-Aided Design, {ICCAD} 2008,
               San Jose, CA, USA, November 10-13, 2008},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4670335/proceeding},
  isbn      = {978-1-4244-2820-5},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccd/2008,
  title     = {26th International Conference on Computer Design, {ICCD} 2008, 12-15
               October 2008, Lake Tahoe, CA, USA, Proceedings},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4740204/proceeding},
  isbn      = {978-1-4244-2657-7},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccd/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/2007,
  title     = {Proceedings of the 44th Design Automation Conference, {DAC} 2007,
               San Diego, CA, USA, June 4-8, 2007},
  publisher = {{IEEE}},
  year      = {2007},
  url       = {http://dl.acm.org/citation.cfm?id=1278480},
  timestamp = {Wed, 30 Nov 2011 16:28:52 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/2007},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2006p,
  editor    = {Georges G. E. Gielen},
  title     = {Proceedings of the Conference on Design, Automation and Test in Europe,
               {DATE} 2006, Munich, Germany, March 6-10, 2006},
  publisher = {European Design and Automation Association, Leuven, Belgium},
  year      = {2006},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/11014/proceeding},
  isbn      = {3-9810801-1-4},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2006p},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/aspdac/2004,
  editor    = {Masaharu Imai},
  title     = {Proceedings of the 2004 Conference on Asia South Pacific Design Automation:
               Electronic Design and Solution Fair 2004, Yokohama, Japan, January
               27-30, 2004},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/9284/proceeding},
  isbn      = {0-7803-8175-0},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/aspdac/2004},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2004,
  title     = {Proceedings 2004 International Test Conference {(ITC} 2004), October
               26-28, 2004, Charlotte, NC, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/9526/proceeding},
  isbn      = {0-7803-8581-0},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2004},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccd/2003,
  title     = {21st International Conference on Computer Design {(ICCD} 2003),VLSI
               in Computers and Processors, 13-15 October 2003, San Jose, CA, USA,
               Proceedings},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8790/proceeding},
  isbn      = {0-7695-2025-1},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccd/2003},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2003,
  title     = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
               Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
               NC, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8970/proceeding},
  isbn      = {0-7803-8106-8},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2003},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2002,
  title     = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8073/proceeding},
  isbn      = {0-7803-7543-2},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2002},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/2001,
  title     = {Proceedings of the 38th Design Automation Conference, {DAC} 2001,
               Las Vegas, NV, USA, June 18-22, 2001},
  publisher = {{ACM}},
  year      = {2001},
  url       = {http://dl.acm.org/citation.cfm?id=378239},
  isbn      = {1-58113-297-2},
  timestamp = {Tue, 15 Nov 2011 16:45:56 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ispd/2001,
  editor    = {Sachin S. Sapatnekar and
               Manfred Wiesel},
  title     = {Proceedings of the 2001 International Symposium on Physical Design,
               {ISPD} 2001, Sonoma County, CA, USA, April 1-4, 2001},
  publisher = {{ACM}},
  year      = {2001},
  url       = {https://doi.org/10.1145/369691},
  doi       = {10.1145/369691},
  isbn      = {1-58113-347-2},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2001,
  title     = {2nd International Symposium on Quality of Electronic Design {(ISQED}
               2001), 26-28 March 2001, San Jose, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7308/proceeding},
  isbn      = {0-7695-1025-6},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2001,
  title     = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
               MD, USA, 30 October - 1 November 2001},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7640/proceeding},
  isbn      = {0-7803-7169-0},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2001,
  title     = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
               in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
               {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7354/proceeding},
  isbn      = {0-7695-1122-8},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/slip/2000,
  title     = {The Second {IEEE/ACM} International Workshop on System-Level Interconnect
               Prediction {(SLIP} 2000), April 8-9, 2000, San Diego, California,
               USA, Proceedings},
  publisher = {{ACM}},
  year      = {2000},
  timestamp = {Thu, 21 Jun 2018 08:01:42 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/slip/2000},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/1998,
  editor    = {Patrick Dewilde and
               Franz J. Rammig and
               Gerry Musgrave},
  title     = {1998 Design, Automation and Test in Europe {(DATE} '98), February
               23-26, 1998, Le Palais des Congr{\`{e}}s de Paris, Paris, France},
  publisher = {{IEEE} Computer Society},
  year      = {1998},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5270/proceeding},
  isbn      = {0-8186-8359-7},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/1998},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ispd/1998,
  editor    = {Majid Sarrafzadeh},
  title     = {Proceedings of the 1998 International Symposium on Physical Design,
               {ISPD} 1998, Monterey, CA, USA, April 6-8, 1998},
  publisher = {{ACM}},
  year      = {1998},
  url       = {https://doi.org/10.1145/274535},
  doi       = {10.1145/274535},
  isbn      = {1-58113-021-X},
  timestamp = {Tue, 06 Nov 2018 11:07:47 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ispd/1998},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1998,
  title     = {Proceedings {IEEE} International Test Conference 1998, Washington,
               DC, USA, October 18-22, 1998},
  publisher = {{IEEE} Computer Society},
  year      = {1998},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5947/proceeding},
  isbn      = {0-7803-5093-6},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/1998},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/1997,
  editor    = {Ellen J. Yoffa and
               Giovanni De Micheli and
               Jan M. Rabaey},
  title     = {Proceedings of the 34st Conference on Design Automation, Anaheim,
               California, USA, Anaheim Convention Center, June 9-13, 1997},
  publisher = {{ACM} Press},
  year      = {1997},
  url       = {http://dl.acm.org/citation.cfm?id=266021},
  isbn      = {0-89791-920-3},
  timestamp = {Wed, 30 Nov 2011 16:28:52 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/1997},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/1997,
  title     = {1997 Workshop on Defect and Fault-Tolerance in {VLSI} Systems {(DFT}
               '97), 20-22 October 1997, Paris, France},
  publisher = {{IEEE} Computer Society},
  year      = {1997},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4962/proceeding},
  isbn      = {0-8186-8168-3},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/1997},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1997,
  title     = {Proceedings {IEEE} International Test Conference 1997, Washington,
               DC, USA, November 3-5, 1997},
  publisher = {{IEEE} Computer Society},
  year      = {1997},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/5033/proceeding},
  isbn      = {0-7803-4209-7},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/1997},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/1996,
  title     = {1996 European Design and Test Conference, ED{\&}TC 1996, Paris,
               France, March 11-14, 1996},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/3563/proceeding},
  isbn      = {0-8186-7423-7},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/1996},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/1996,
  title     = {1996 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1996, Boston, MA, USA,
               November 6-8, 1996},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4201/proceeding},
  isbn      = {0-8186-7545-4},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dft/1996},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccad/1996,
  editor    = {Rob A. Rutenbar and
               Ralph H. J. M. Otten},
  title     = {Proceedings of the 1996 {IEEE/ACM} International Conference on Computer-Aided
               Design, {ICCAD} 1996, San Jose, CA, USA, November 10-14, 1996},
  publisher = {{IEEE} Computer Society / {ACM}},
  year      = {1996},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4215/proceeding},
  isbn      = {0-8186-7597-7},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/1996},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccd/1996,
  title     = {1996 International Conference on Computer Design {(ICCD} '96), {VLSI}
               in Computers and Processors, October 7-9, 1996, Austin, TX, USA, Proceedings},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4128/proceeding},
  isbn      = {0-8186-7554-3},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccd/1996},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1996,
  title     = {Proceedings {IEEE} International Test Conference 1996, Test and Design
               Validity, Washington, DC, USA, October 20-25, 1996},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4097/proceeding},
  isbn      = {0-7803-3541-4},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/1996},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/1996,
  title     = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
               Princeton, NJ, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/3739/proceeding},
  isbn      = {0-8186-7304-4},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/1996},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/1995,
  editor    = {Bryan Preas},
  title     = {Proceedings of the 32st Conference on Design Automation, San Francisco,
               California, USA, Moscone Center, June 12-16, 1995},
  publisher = {{ACM} Press},
  year      = {1995},
  url       = {http://dl.acm.org/citation.cfm?id=217474},
  isbn      = {0-89791-725-1},
  timestamp = {Wed, 30 Nov 2011 16:28:52 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/1995},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/1995,
  title     = {1995 European Design and Test Conference, ED{\&}TC 1995, Paris,
               France, March 6-9, 1995},
  publisher = {{IEEE} Computer Society},
  year      = {1995},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/3300/proceeding},
  isbn      = {0-8186-7039-8},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/1995},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/1995,
  title     = {1995 {IEEE} International Symposium on Defect and Fault Tolerance
               in {VLSI} and Nanotechnology Systems, {DFT} 1995, Lafayette, LA, USA,
               November 13-15, 1995},
  publisher = {{IEEE} Computer Society},
  year      = {1995},
  url       = {http://www.computer.org/csdl/proceedings/dft/1995/7107/00/index.html},
  isbn      = {0-8186-7107-6},
  timestamp = {Mon, 10 Nov 2014 18:15:17 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dft/1995},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1995,
  title     = {Proceedings {IEEE} International Test Conference 1995, Driving Down
               the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  publisher = {{IEEE} Computer Society},
  year      = {1995},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4046/proceeding},
  isbn      = {0-7803-2992-9},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/1995},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/1994,
  editor    = {Michael J. Lorenzetti},
  title     = {Proceedings of the 31st Conference on Design Automation, San Diego,
               California, USA, June 6-10, 1994},
  publisher = {{ACM} Press},
  year      = {1994},
  url       = {http://dl.acm.org/citation.cfm?id=196244},
  isbn      = {0-7803-1836-6},
  timestamp = {Thu, 23 Feb 2012 17:18:14 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/1994},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1994,
  title     = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
               Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  publisher = {{IEEE} Computer Society},
  year      = {1994},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4035/proceeding},
  isbn      = {0-7803-2103-0},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/1994},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/1993,
  title     = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
               Atlantic City, NJ, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {1993},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/464/proceeding},
  isbn      = {0-8186-3830-3},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/1993},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/eurodac/1992,
  editor    = {Gerald Musgrave},
  title     = {Proceedings of the conference on European design automation, {EURO-DAC}
               '92, Hamburg, Germany, September 7-10, 1992},
  publisher = {{IEEE} Computer Society Press},
  year      = {1992},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/409/proceeding},
  isbn      = {0-8186-2780-8},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/eurodac/1992},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/1991,
  editor    = {A. Richard Newton},
  title     = {Proceedings of the 28th Design Automation Conference, San Francisco,
               California, USA, June 17-21, 1991},
  publisher = {{ACM}},
  year      = {1991},
  url       = {http://dl.acm.org/citation.cfm?id=127601},
  isbn      = {0-89791395-7},
  timestamp = {Wed, 30 Nov 2011 16:28:52 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/1991},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1991,
  title     = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
               Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  publisher = {{IEEE} Computer Society},
  year      = {1991},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/3980/proceeding},
  isbn      = {0-8186-9156-5},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/1991},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1990,
  title     = {Proceedings {IEEE} International Test Conference 1990, Washington,
               D.C., USA, September 10-14, 1990},
  publisher = {{IEEE} Computer Society},
  year      = {1990},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/485/proceeding},
  isbn      = {0-8186-9064-X},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/1990},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccad/1989,
  title     = {1989 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
               1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical
               Papers},
  publisher = {{IEEE} Computer Society},
  year      = {1989},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/263/proceeding},
  isbn      = {0-8186-1986-4},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/1989},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1989,
  title     = {Proceedings International Test Conference 1989, Washington, D.C.,
               USA, August 1989},
  publisher = {{IEEE} Computer Society},
  year      = {1989},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/834/proceeding},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/1989},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iccad/1988,
  title     = {1988 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
               1988, Santa Clara, CA, USA, November 7-10, 1988. Digest of Technical
               Papers},
  publisher = {{IEEE} Computer Society},
  year      = {1988},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/212/proceeding},
  isbn      = {0-8186-0869-2},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iccad/1988},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/1987,
  editor    = {A. O'Neill and
               D. Thomas},
  title     = {Proceedings of the 24th {ACM/IEEE} Design Automation Conference. Miami
               Beach, FL, USA, June 28 - July 1, 1987},
  publisher = {{IEEE} Computer Society Press / {ACM}},
  year      = {1987},
  url       = {http://dl.acm.org/citation.cfm?id=37888},
  timestamp = {Tue, 19 Jun 2018 18:45:29 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dac/1987},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/1986,
  editor    = {Don Thomas},
  title     = {Proceedings of the 23rd {ACM/IEEE} Design Automation Conference. Las
               Vegas, NV, USA, June, 1986},
  publisher = {{IEEE} Computer Society Press},
  year      = {1986},
  url       = {http://dl.acm.org/citation.cfm?id=318013},
  timestamp = {Tue, 19 Jun 2018 18:45:02 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dac/1986},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1984,
  title     = {Proceedings International Test Conference 1984, Philadelphia, PA,
               USA, October 1984},
  publisher = {{IEEE} Computer Society},
  year      = {1984},
  timestamp = {Fri, 22 Nov 2002 13:40:15 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/1984},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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