Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDBibTeX records: Edward J. McCluskey
@article{DBLP:journals/tc/MontuschiMCCRDE16,
author = {Paolo Montuschi and
Edward J. McCluskey and
Samarjit Chakraborty and
Jason Cong and
Ram{\'{o}}n M. Rodr{\'{\i}}guez{-}Dagnino and
Fred Douglis and
Lieven Eeckhout and
Gernot Heiser and
Sushil Jajodia and
Ruby B. Lee and
Dinesh Manocha and
Tom{\'{a}}s F. Pena and
Isabelle Puaut and
Hanan Samet and
Donatella Sciuto},
title = {State of the Journal},
journal = {{IEEE} Trans. Computers},
volume = {65},
number = {7},
pages = {2014--2018},
year = {2016},
url = {https://doi.org/10.1109/TC.2016.2568358},
doi = {10.1109/TC.2016.2568358},
timestamp = {Thu, 27 Jul 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/MontuschiMCCRDE16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Al-YamaniM10,
author = {Ahmad A. Al{-}Yamani and
Edward J. McCluskey},
title = {Test Set Compression Through Alternation Between Deterministic and
Pseudorandom Test Patterns},
journal = {J. Electron. Test.},
volume = {26},
number = {5},
pages = {513--521},
year = {2010},
url = {https://doi.org/10.1007/s10836-010-5172-9},
doi = {10.1007/S10836-010-5172-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Al-YamaniM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeM08,
author = {Jaekwang Lee and
Edward J. McCluskey},
editor = {Douglas Young and
Nur A. Touba},
title = {Failing Frequency Signature Analysis},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700561},
doi = {10.1109/TEST.2008.4700561},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParkM08,
author = {Intaik Park and
Edward J. McCluskey},
editor = {Douglas Young and
Nur A. Touba},
title = {Launch-on-Shift-Capture Transition Tests},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700648},
doi = {10.1109/TEST.2008.4700648},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParkM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FerhaniSMN08,
author = {Fran{\c{c}}ois{-}Fabien Ferhani and
Nirmal R. Saxena and
Edward J. McCluskey and
Phil Nigh},
title = {How Many Test Patterns are Useless?},
booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
2008, San Diego, California, {USA}},
pages = {23--28},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/VTS.2008.27},
doi = {10.1109/VTS.2008.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/FerhaniSMN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ParkLCM08,
author = {Intaik Park and
Donghwi Lee and
Erik Chmelar and
Edward J. McCluskey},
title = {Inconsistent Fail due to Limited Tester Timing Accuracy},
booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
2008, San Diego, California, {USA}},
pages = {47--52},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/VTS.2008.23},
doi = {10.1109/VTS.2008.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ParkLCM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LeePM08,
author = {Jaekwang Lee and
Intaik Park and
Edward J. McCluskey},
title = {Error Sequence Analysis},
booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
2008, San Diego, California, {USA}},
pages = {255--260},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/VTS.2008.45},
doi = {10.1109/VTS.2008.45},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LeePM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChoMM07,
author = {Kyoung Youn Cho and
Subhasish Mitra and
Edward J. McCluskey},
editor = {Jill Sibert and
Janusz Rajski},
title = {California scan architecture for high quality and low power testing},
booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
California, USA, October 21-26, 2007},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/TEST.2007.4437634},
doi = {10.1109/TEST.2007.4437634},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChoMM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChoM07,
author = {Kyoung Youn Cho and
Edward J. McCluskey},
title = {Test Set Reordering Using the Gate Exhaustive Test Metric},
booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
California, {USA}},
pages = {199--204},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VTS.2007.79},
doi = {10.1109/VTS.2007.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChoM07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FerhaniM06,
author = {Fran{\c{c}}ois{-}Fabien Ferhani and
Edward J. McCluskey},
editor = {Scott Davidson and
Anne Gattiker},
title = {Classifying Bad Chips and Ordering Test Sets},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297736},
doi = {10.1109/TEST.2006.297736},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/FerhaniM06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChmelarM06,
author = {Erik Chmelar and
Edward J. McCluskey},
title = {Session Abstract},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {156--157},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.81},
doi = {10.1109/VTS.2006.81},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChmelarM06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/Al-YamaniMM05,
author = {Ahmad A. Al{-}Yamani and
Subhasish Mitra and
Edward J. McCluskey},
title = {Optimized reseeding by seed ordering and encoding},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {24},
number = {2},
pages = {264--270},
year = {2005},
url = {https://doi.org/10.1109/TCAD.2004.840550},
doi = {10.1109/TCAD.2004.840550},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/Al-YamaniMM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LiM05,
author = {Chien{-}Mo James Li and
Edward J. McCluskey},
title = {Diagnosis of resistive-open and stuck-open defects in digital {CMOS}
ICs},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {24},
number = {11},
pages = {1748--1759},
year = {2005},
url = {https://doi.org/10.1109/TCAD.2005.852457},
doi = {10.1109/TCAD.2005.852457},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/LiM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/Al-YamaniM05,
author = {Ahmad A. Al{-}Yamani and
Edward J. McCluskey},
title = {Test chip experimental results on high-level structural test},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {10},
number = {4},
pages = {690--701},
year = {2005},
url = {https://doi.org/10.1145/1109118.1109125},
doi = {10.1145/1109118.1109125},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/Al-YamaniM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/Al-YamaniM05,
author = {Ahmad A. Al{-}Yamani and
Edward J. McCluskey},
title = {BIST-Guided {ATPG}},
booktitle = {6th International Symposium on Quality of Electronic Design {(ISQED}
2005), 21-23 March 2005, San Jose, CA, {USA}},
pages = {244--249},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ISQED.2005.26},
doi = {10.1109/ISQED.2005.26},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/Al-YamaniM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChoMM05,
author = {Kyoung Youn Cho and
Subhasish Mitra and
Edward J. McCluskey},
title = {Gate exhaustive testing},
booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
Austin, TX, USA, November 8-10, 2005},
pages = {7},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/TEST.2005.1584040},
doi = {10.1109/TEST.2005.1584040},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChoMM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ParkAM05,
author = {Intaik Park and
Ahmad A. Al{-}Yamani and
Edward J. McCluskey},
title = {Effective {TARO} Pattern Generation},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {161--166},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.43},
doi = {10.1109/VTS.2005.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ParkAM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MitraHSYM04,
author = {Subhasish Mitra and
Wei{-}Je Huang and
Nirmal R. Saxena and
Shu{-}Yi Yu and
Edward J. McCluskey},
title = {Reconfigurable Architecture for Autonomous Self-Repair},
journal = {{IEEE} Des. Test Comput.},
volume = {21},
number = {3},
pages = {228--240},
year = {2004},
url = {https://doi.org/10.1109/MDT.2004.18},
doi = {10.1109/MDT.2004.18},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/MitraHSYM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/MitraSM04,
author = {Subhasish Mitra and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {Efficient Design Diversity Estimation for Combinational Circuits},
journal = {{IEEE} Trans. Computers},
volume = {53},
number = {11},
pages = {1483--1492},
year = {2004},
url = {https://doi.org/10.1109/TC.2004.95},
doi = {10.1109/TC.2004.95},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/MitraSM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hldvt/Al-YamaniM04,
author = {Ahmad A. Al{-}Yamani and
Edward J. McCluskey},
title = {Test quality for high level structural test},
booktitle = {Ninth {IEEE} International High-Level Design Validation and Test Workshop
2004, Sonoma Valley, CA, USA, November 10-12, 2004},
pages = {109--114},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/HLDVT.2004.1431250},
doi = {10.1109/HLDVT.2004.1431250},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/hldvt/Al-YamaniM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrandVMM04,
author = {Kenneth A. Brand and
Erik H. Volkerink and
Edward J. McCluskey and
Subhasish Mitra},
title = {Speed Clustering of Integrated Circuits},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1128--1137},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387387},
doi = {10.1109/TEST.2004.1387387},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrandVMM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/McCluskeyALTVFLM04,
author = {Edward J. McCluskey and
Ahmad A. Al{-}Yamani and
Chien{-}Mo James Li and
Chao{-}Wen Tseng and
Erik H. Volkerink and
Fran{\c{c}}ois{-}Fabien Ferhani and
Edward Li and
Subhasish Mitra},
title = {ELF-Murphy Data on Defects and Test Sets},
booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
Napa Valley, CA, {USA}},
pages = {16--22},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/VTEST.2004.1299220},
doi = {10.1109/VTEST.2004.1299220},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/McCluskeyALTVFLM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MitraVME04,
author = {Subhasish Mitra and
Erik H. Volkerink and
Edward J. McCluskey and
Stefan Eichenberger},
title = {Delay Defect Screening using Process Monitor Structures},
booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
Napa Valley, CA, {USA}},
pages = {43--52},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/VTEST.2004.1299224},
doi = {10.1109/VTEST.2004.1299224},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MitraVME04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TahooriMRF04,
author = {Mehdi Baradaran Tahoori and
Edward J. McCluskey and
Michel Renovell and
Philippe Faure},
title = {A Multi-Configuration Strategy for an Application Dependent Testing
of FPGAs},
booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
Napa Valley, CA, {USA}},
pages = {154--170},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/VTEST.2004.1299239},
doi = {10.1109/VTEST.2004.1299239},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TahooriMRF04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/Al-YamaniM03,
author = {Ahmad A. Al{-}Yamani and
Edward J. McCluskey},
title = {Seed encoding with LFSRs and cellular automata},
booktitle = {Proceedings of the 40th Design Automation Conference, {DAC} 2003,
Anaheim, CA, USA, June 2-6, 2003},
pages = {560--565},
publisher = {{ACM}},
year = {2003},
url = {https://doi.org/10.1145/775832.775975},
doi = {10.1145/775832.775975},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/Al-YamaniM03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Al-YamaniM03,
author = {Ahmad A. Al{-}Yamani and
Edward J. McCluskey},
title = {Built-In Reseeding for Serial Bist},
booktitle = {21st {IEEE} {VLSI} Test Symposium {(VTS} 2003), 27 April - 1 May 2003,
Napa Valley, CA, {USA}},
pages = {63--68},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/VTEST.2003.1197634},
doi = {10.1109/VTEST.2003.1197634},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Al-YamaniM03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Al-YamaniMM03,
author = {Ahmad A. Al{-}Yamani and
Subhasish Mitra and
Edward J. McCluskey},
title = {Bist Reseeding with very few Seeds},
booktitle = {21st {IEEE} {VLSI} Test Symposium {(VTS} 2003), 27 April - 1 May 2003,
Napa Valley, CA, {USA}},
pages = {69--76},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/VTEST.2003.1197635},
doi = {10.1109/VTEST.2003.1197635},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Al-YamaniMM03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/OhMM02,
author = {Nahmsuk Oh and
Subhasish Mitra and
Edward J. McCluskey},
title = {{ED4I:} Error Detection by Diverse Data and Duplicated Instructions},
journal = {{IEEE} Trans. Computers},
volume = {51},
number = {2},
pages = {180--199},
year = {2002},
url = {https://doi.org/10.1109/12.980007},
doi = {10.1109/12.980007},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/OhMM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/MitraSM02,
author = {Subhasish Mitra and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {A Design Diversity Metric and Analysis of Redundant Systems},
journal = {{IEEE} Trans. Computers},
volume = {51},
number = {5},
pages = {498--510},
year = {2002},
url = {https://doi.org/10.1109/TC.2002.1004589},
doi = {10.1109/TC.2002.1004589},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/MitraSM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/OhSM02,
author = {Nahmsuk Oh and
Philip P. Shirvani and
Edward J. McCluskey},
title = {Error detection by duplicated instructions in super-scalar processors},
journal = {{IEEE} Trans. Reliab.},
volume = {51},
number = {1},
pages = {63--75},
year = {2002},
url = {https://doi.org/10.1109/24.994913},
doi = {10.1109/24.994913},
timestamp = {Thu, 09 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tr/OhSM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/OhSM02a,
author = {Nahmsuk Oh and
Philip P. Shirvani and
Edward J. McCluskey},
title = {Control-flow checking by software signatures},
journal = {{IEEE} Trans. Reliab.},
volume = {51},
number = {1},
pages = {111--122},
year = {2002},
url = {https://doi.org/10.1109/24.994926},
doi = {10.1109/24.994926},
timestamp = {Thu, 09 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tr/OhSM02a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/OhM02,
author = {Nahmsuk Oh and
Edward J. McCluskey},
title = {Error detection by selective procedure call duplication for low energy
consumption},
journal = {{IEEE} Trans. Reliab.},
volume = {51},
number = {4},
pages = {392--402},
year = {2002},
url = {https://doi.org/10.1109/TR.2002.804735},
doi = {10.1109/TR.2002.804735},
timestamp = {Thu, 09 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tr/OhM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Al-YamaniMM02,
author = {Ahmad A. Al{-}Yamani and
Subhasish Mitra and
Edward J. McCluskey},
title = {Testing Digital Circuits with Constraints},
booktitle = {17th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2002), 6-8 November 2002, Vancouver, BC,
Canada, Proceedings},
pages = {195--206},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DFTVS.2002.1173516},
doi = {10.1109/DFTVS.2002.1173516},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Al-YamaniMM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eh/MitraM02,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Dependable Reconfigurable Computing Design Diversity and Self Repair},
booktitle = {4th {NASA} / DoD Workshop on Evolvable Hardware {(EH} 2002), 15-18
July 2002, Alexandria, VA, {USA}},
pages = {5},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/EH.2002.1029857},
doi = {10.1109/EH.2002.1029857},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/eh/MitraM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TahooriMTM02,
author = {Mehdi Baradaran Tahoori and
Subhasish Mitra and
Shahin Toutounchi and
Edward J. McCluskey},
title = {Fault Grading {FPGA} Interconnect Test Configurations},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {608--617},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041812},
doi = {10.1109/TEST.2002.1041812},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TahooriMTM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TsengLM02,
author = {Chao{-}Wen Tseng and
James Li and
Edward J. McCluskey},
title = {Experimental Results for Slow-Speed Testing},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {37--42},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/VTS.2002.1011108},
doi = {10.1109/VTS.2002.1011108},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TsengLM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiM02,
author = {Chien{-}Mo James Li and
Edward J. McCluskey},
title = {Diagnosis of Sequence-Dependent Chips},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {187--192},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/VTS.2002.1011137},
doi = {10.1109/VTS.2002.1011137},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MitraMM02,
author = {Subhasish Mitra and
Edward J. McCluskey and
Samy Makar},
title = {Design for Testability and Testing of {IEEE} 1149.1 Tap Controller},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {247--252},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/VTS.2002.1011145},
doi = {10.1109/VTS.2002.1011145},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MitraMM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/McCluskeMMMNR02,
author = {Edward J. McCluskey and
Subhasish Mitra and
Bob Madge and
Peter C. Maxwell and
Phil Nigh and
Mike Rodgers},
title = {Debating the Future of Burn-In},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {311--314},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2002.10015},
doi = {10.1109/VTS.2002.10015},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/McCluskeMMMNR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ToubaM01,
author = {Nur A. Touba and
Edward J. McCluskey},
title = {Bit-fixing in pseudorandom sequences for scan {BIST}},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {20},
number = {4},
pages = {545--555},
year = {2001},
url = {https://doi.org/10.1109/43.918212},
doi = {10.1109/43.918212},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/ToubaM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/YuM01,
author = {Shu{-}Yi Yu and
Edward J. McCluskey},
title = {Permanent Fault Repair for FPGAs with Limited Redundant Area},
booktitle = {16th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2001), 24-26 October 2001, San Francisco,
CA, USA, Proceedings},
pages = {125--133},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DFTVS.2001.966761},
doi = {10.1109/DFTVS.2001.966761},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/YuM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/OhM01,
author = {Nahmsuk Oh and
Edward J. McCluskey},
title = {Procedure Call Duplication: Minimization of Energy Consumption with
Constrained Error Detection Latency},
booktitle = {16th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2001), 24-26 October 2001, San Francisco,
CA, USA, Proceedings},
pages = {182},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DFTVS.2001.966768},
doi = {10.1109/DFTVS.2001.966768},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/OhM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HuangMM01,
author = {Wei{-}Je Huang and
Subhasish Mitra and
Edward J. McCluskey},
title = {Fast Run-Time Fault Location in Dependable FPGA-Based Applications},
booktitle = {16th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2001), 24-26 October 2001, San Francisco,
CA, USA, Proceedings},
pages = {206--214},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DFTVS.2001.966772},
doi = {10.1109/DFTVS.2001.966772},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/HuangMM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Al-YamaniOM01,
author = {Ahmad A. Al{-}Yamani and
Nahmsuk Oh and
Edward J. McCluskey},
title = {Performance Evaluation of Checksum-Based {ABFT}},
booktitle = {16th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2001), 24-26 October 2001, San Francisco,
CA, USA, Proceedings},
pages = {461},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DFTVS.2001.966800},
doi = {10.1109/DFTVS.2001.966800},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Al-YamaniOM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/MitraSM01,
author = {Subhasish Mitra and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {Techniques for Estimation of Design Diversity for Combinational Logic
Circuits},
booktitle = {2001 International Conference on Dependable Systems and Networks {(DSN}
2001) (formerly: FTCS), 1-4 July 2001, G{\"{o}}teborg, Sweden,
Proceedings},
pages = {25--36},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DSN.2001.941387},
doi = {10.1109/DSN.2001.941387},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsn/MitraSM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fccm/HuangM01,
author = {Wei{-}Je Huang and
Edward J. McCluskey},
title = {Column-Based Precompiled Configuration Techniques for {FPGA}},
booktitle = {The 9th Annual {IEEE} Symposium on Field-Programmable Custom Computing
Machines, {FCCM} 2001, Rohnert Park, California, USA, April 29 - May
2, 2001},
pages = {137--146},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.ieeecomputersociety.org/10.1109/FCCM.2001.17},
doi = {10.1109/FCCM.2001.17},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/fccm/HuangM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpga/HuangM01,
author = {Wei{-}Je Huang and
Edward J. McCluskey},
editor = {Scott Hauck and
Martine D. F. Schlag and
Russell Tessier},
title = {A memory coherence technique for online transient error recovery of
{FPGA} configurations},
booktitle = {Proceedings of the {ACM/SIGDA} International Symposium on Field Programmable
Gate Arrays, {FPGA} 2001, Monterey, CA, USA, February 11-13, 2001},
pages = {183--192},
publisher = {{ACM}},
year = {2001},
url = {https://doi.org/10.1145/360276.360344},
doi = {10.1145/360276.360344},
timestamp = {Tue, 06 Nov 2018 16:58:22 +0100},
biburl = {https://dblp.org/rec/conf/fpga/HuangM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/MitraM01,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Diversity Techniques for Concurrent Error Detection},
booktitle = {2nd International Symposium on Quality of Electronic Design {(ISQED}
2001), 26-28 March 2001, San Jose, CA, {USA}},
pages = {249--250},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ISQED.2001.915234},
doi = {10.1109/ISQED.2001.915234},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/MitraM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuM01,
author = {Shu{-}Yi Yu and
Edward J. McCluskey},
title = {On-line testing and recovery in {TMR} systems for real-time applications},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {240--249},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966639},
doi = {10.1109/TEST.2001.966639},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsengM01,
author = {Chao{-}Wen Tseng and
Edward J. McCluskey},
title = {Multiple-output propagation transition fault test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {358--366},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966652},
doi = {10.1109/TEST.2001.966652},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsengM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsengLPM01,
author = {Chao{-}Wen Tseng and
Chien{-}Mo James Li and
Mike Purtell and
Edward J. McCluskey},
title = {Testing for resistive opens and stuck opens},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1049--1058},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966731},
doi = {10.1109/TEST.2001.966731},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsengLPM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiM01,
author = {Chien{-}Mo James Li and
Edward J. McCluskey},
title = {Diagnosis of Tunneling Opens},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {22--27},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923413},
doi = {10.1109/VTS.2001.923413},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MitraM01,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Design Diversity for Concurrent Error Detection in Sequential Logic
Circuts},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {178--183},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923436},
doi = {10.1109/VTS.2001.923436},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MitraM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MitraM01a,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Design of Redundant Systems Protected Against Common-Mode Failures},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {190--197},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923438},
doi = {10.1109/VTS.2001.923438},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MitraM01a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TsengCMN01,
author = {Chao{-}Wen Tseng and
Ray Chen and
Edward J. McCluskey and
Phil Nigh},
title = {{MINVDD} Testing for Weak {CMOS} ICs},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {339--345},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923459},
doi = {10.1109/VTS.2001.923459},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TsengCMN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TsengMMD01,
author = {Chao{-}Wen Tseng and
Subhasish Mitra and
Edward J. McCluskey and
Scott Davidson},
title = {An Evaluation of Pseudo Random Testing for Detecting Real Defects},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {404--410},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923469},
doi = {10.1109/VTS.2001.923469},
timestamp = {Sat, 16 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TsengMMD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/SaxenaFHMYM00,
author = {Nirmal R. Saxena and
Santiago Fern{\'{a}}ndez{-}Gomez and
Wei{-}Je Huang and
Subhasish Mitra and
Shu{-}Yi Yu and
Edward J. McCluskey},
title = {Dependable Computing and Online Testing in Adaptive and Configurable
Systems},
journal = {{IEEE} Des. Test Comput.},
volume = {17},
number = {1},
pages = {29--41},
year = {2000},
url = {https://doi.org/10.1109/54.825675},
doi = {10.1109/54.825675},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/SaxenaFHMYM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MitraAM00,
author = {Subhasish Mitra and
LaNae J. Avra and
Edward J. McCluskey},
title = {Efficient Multiplexer Synthesis Techniques},
journal = {{IEEE} Des. Test Comput.},
volume = {17},
number = {4},
pages = {90--97},
year = {2000},
url = {https://doi.org/10.1109/54.895009},
doi = {10.1109/54.895009},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/MitraAM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/ShirvaniSM00,
author = {Philip P. Shirvani and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {Software-implemented {EDAC} protection against SEUs},
journal = {{IEEE} Trans. Reliab.},
volume = {49},
number = {3},
pages = {273--284},
year = {2000},
url = {https://doi.org/10.1109/24.914544},
doi = {10.1109/24.914544},
timestamp = {Thu, 09 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tr/ShirvaniSM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/MitraSM00,
author = {Subhasish Mitra and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {Common-mode failures in redundant {VLSI} systems: a survey},
journal = {{IEEE} Trans. Reliab.},
volume = {49},
number = {3},
pages = {285--295},
year = {2000},
url = {https://doi.org/10.1109/24.914545},
doi = {10.1109/24.914545},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tr/MitraSM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fccm/YuSM00,
author = {Shu{-}Yi Yu and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {An {ACS} Robotic Control Algorithm with Fault Tolerant Capabilities},
booktitle = {8th {IEEE} Symposium on Field-Programmable Custom Computing Machines
{(FCCM} 2000), 17-19 April 2000, Napa Valley, CA, USA, Proceedings},
pages = {175--184},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/FPGA.2000.903404},
doi = {10.1109/FPGA.2000.903404},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/fccm/YuSM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fccm/HuangSM00,
author = {Wei{-}Je Huang and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {A Reliable {LZ} Data Compressor on Reconfigurable Coprocessors},
booktitle = {8th {IEEE} Symposium on Field-Programmable Custom Computing Machines
{(FCCM} 2000), 17-19 April 2000, Napa Valley, CA, USA, Proceedings},
pages = {249--258},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/FPGA.2000.903412},
doi = {10.1109/FPGA.2000.903412},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/fccm/HuangSM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiM00,
author = {Chien{-}Mo James Li and
Edward J. McCluskey},
title = {Testing for tunneling opens},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {85--94},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894195},
doi = {10.1109/TEST.2000.894195},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MitraM00,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Combinational logic synthesis for diversity in duplex systems},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {179--188},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894205},
doi = {10.1109/TEST.2000.894205},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MitraM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskeyT00,
author = {Edward J. McCluskey and
Chao{-}Wen Tseng},
title = {Stuck-fault tests vs. actual defects},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {336--343},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894222},
doi = {10.1109/TEST.2000.894222},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McCluskeyT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MitraM00a,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Which concurrent error detection scheme to choose ?},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {985--994},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894311},
doi = {10.1109/TEST.2000.894311},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MitraM00a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/prdc/HuangM00,
author = {Wei{-}Je Huang and
Edward J. McCluskey},
title = {Transient errors and rollback recovery in {LZ} compression},
booktitle = {2000 Pacific Rim International Symposium on Dependable Computing {(PRDC}
2000), 18-20 December 2000, Los Angeles, CA, {USA}},
pages = {128--138},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/PRDC.2000.897295},
doi = {10.1109/PRDC.2000.897295},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/prdc/HuangM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TsengMSW00,
author = {Chao{-}Wen Tseng and
Edward J. McCluskey and
Xiaoping Shao and
David M. Wu},
title = {Cold Delay Defect Screening},
booktitle = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
Montreal, Canada},
pages = {183--188},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/VTEST.2000.843843},
doi = {10.1109/VTEST.2000.843843},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TsengMSW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MitraSM00,
author = {Subhasish Mitra and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {Fault Escapes in Duplex Systems},
booktitle = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
Montreal, Canada},
pages = {453--458},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/VTEST.2000.843878},
doi = {10.1109/VTEST.2000.843878},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MitraSM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MitraM00,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Word Voter: {A} New Voter Design for Triple Modular Redundant Systems},
booktitle = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
Montreal, Canada},
pages = {465--470},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/VTEST.2000.843880},
doi = {10.1109/VTEST.2000.843880},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MitraM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MitraAM99,
author = {Subhasish Mitra and
LaNae J. Avra and
Edward J. McCluskey},
title = {An output encoding problem and a solution technique},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {18},
number = {6},
pages = {761--768},
year = {1999},
url = {https://doi.org/10.1109/43.766726},
doi = {10.1109/43.766726},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MitraAM99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ToubaM99,
author = {Nur A. Touba and
Edward J. McCluskey},
title = {{RP-SYN:} synthesis of random pattern testable circuits with test
point insertion},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {18},
number = {8},
pages = {1202--1213},
year = {1999},
url = {https://doi.org/10.1109/43.775638},
doi = {10.1109/43.775638},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/ToubaM99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MetraSM99,
author = {Subhasish Mitra and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {A design diversity metric and reliability analysis for redundant systems},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {662--671},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805794},
doi = {10.1109/TEST.1999.805794},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MetraSM99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZengSM99,
author = {Chaohuang Zeng and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {Finite state machine synthesis with concurrent error detection},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {672--679},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805795},
doi = {10.1109/TEST.1999.805795},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZengSM99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ShirvaniM99,
author = {Philip P. Shirvani and
Edward J. McCluskey},
title = {PADded Cache: {A} New Fault-Tolerance Technique for Cache Memories},
booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
Diego, CA, {USA}},
pages = {440--445},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/VTEST.1999.766701},
doi = {10.1109/VTEST.1999.766701},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ShirvaniM99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangTLPM98,
author = {Jonathan T.{-}Y. Chang and
Chao{-}Wen Tseng and
Chien{-}Mo James Li and
Mike Purtell and
Edward J. McCluskey},
title = {Analysis of pattern-dependent and timing-dependent failures in an
experimental test chip},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {184--193},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743151},
doi = {10.1109/TEST.1998.743151},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChangTLPM98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangM98,
author = {Jonathan T.{-}Y. Chang and
Edward J. McCluskey},
title = {Detecting resistive shorts for {CMOS} domino circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {890--899},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743280},
doi = {10.1109/TEST.1998.743280},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChangM98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/smc/SaxenaM98,
author = {Nirmal R. Saxena and
Edward J. McCluskey},
title = {Dependable adaptive computing systems-the {ROAR} project},
booktitle = {Proceedings of the {IEEE} International Conference on Systems, Man
and Cybernetics, {SMC} 1998, Hyatt Regency La Jolla, San Diego, California,
USA, October 11-14,1998},
pages = {2172--2177},
publisher = {{IEEE}},
year = {1998},
url = {https://doi.org/10.1109/ICSMC.1998.724977},
doi = {10.1109/ICSMC.1998.724977},
timestamp = {Wed, 16 Oct 2019 14:14:51 +0200},
biburl = {https://dblp.org/rec/conf/smc/SaxenaM98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChangTCWPM98,
author = {Jonathan T.{-}Y. Chang and
Chao{-}Wen Tseng and
Yi{-}Chin Chu and
Sanjay Wattal and
Mike Purtell and
Edward J. McCluskey},
title = {Experimental Results for {IDDQ} and {VLV} Testing},
booktitle = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998,
Princeton, NJ, {USA}},
pages = {118--125},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/VTEST.1998.670858},
doi = {10.1109/VTEST.1998.670858},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChangTCWPM98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/SaxenaM97,
author = {Nirmal R. Saxena and
Edward J. McCluskey},
title = {Parallel Signatur Analysis Design with Bounds on Aliasing},
journal = {{IEEE} Trans. Computers},
volume = {46},
number = {4},
pages = {425--438},
year = {1997},
url = {https://doi.org/10.1109/12.588057},
doi = {10.1109/12.588057},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/SaxenaM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ToubaM97,
author = {Nur A. Touba and
Edward J. McCluskey},
title = {Logic synthesis of multilevel circuits with concurrent error detection},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {16},
number = {7},
pages = {783--789},
year = {1997},
url = {https://doi.org/10.1109/43.644041},
doi = {10.1109/43.644041},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/ToubaM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/MitraAM97,
author = {Subhasish Mitra and
LaNae J. Avra and
Edward J. McCluskey},
editor = {Ralph H. J. M. Otten and
Hiroto Yasuura},
title = {An output encoding problem and a solution technique},
booktitle = {Proceedings of the 1997 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1997, San Jose, CA, USA, November 9-13, 1997},
pages = {304--307},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1997},
url = {https://doi.org/10.1109/ICCAD.1997.643535},
doi = {10.1109/ICCAD.1997.643535},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/MitraAM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/ToubaM97,
author = {Nur A. Touba and
Edward J. McCluskey},
title = {Pseudo-Random Pattern Testing of Bridging Faults},
booktitle = {Proceedings 1997 International Conference on Computer Design: {VLSI}
in Computers {\&} Processors, {ICCD} '97, Austin, Texas, USA,
October 12-15, 1997},
pages = {54--60},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ICCD.1997.628849},
doi = {10.1109/ICCD.1997.628849},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/ToubaM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MitraAM97,
author = {Subhasish Mitra and
LaNae J. Avra and
Edward J. McCluskey},
title = {Scan Synthesis for One-Hot Signals},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {714--722},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639684},
doi = {10.1109/TEST.1997.639684},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MitraAM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MakaM97,
author = {Samy Makar and
Edward J. McCluskey},
title = {{ATPG} for scan chain latches and flip-flops},
booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
Monterey, California, {USA}},
pages = {364--369},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/VTEST.1997.600306},
doi = {10.1109/VTEST.1997.600306},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MakaM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NorwoodM97,
author = {Robert B. Norwood and
Edward J. McCluskey},
title = {High-Level Synthesis for Orthogonal Sca},
booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
Monterey, California, {USA}},
pages = {370--375},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/VTEST.1997.600308},
doi = {10.1109/VTEST.1997.600308},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NorwoodM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChangM97,
author = {Jonathan T.{-}Y. Chang and
Edward J. McCluskey},
title = {SHOrt voltage elevation {(SHOVE)} test for weak {CMOS} ICs},
booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
Monterey, California, {USA}},
pages = {446},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/VTEST.1997.600331},
doi = {10.1109/VTEST.1997.600331},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChangM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/SaxenaM96,
author = {Nirmal R. Saxena and
Edward J. McCluskey},
title = {Counting Two-State Transition-Tour Sequences},
journal = {{IEEE} Trans. Computers},
volume = {45},
number = {11},
pages = {1337--1342},
year = {1996},
url = {https://doi.org/10.1109/12.544493},
doi = {10.1109/12.544493},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/SaxenaM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ToubaM96,
author = {Nur A. Touba and
Edward J. McCluskey},
title = {Altering a Pseudo-Random Bit Sequence for Scan-Based {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {167--175},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.556959},
doi = {10.1109/TEST.1996.556959},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ToubaM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangM96,
author = {Jonathan T.{-}Y. Chang and
Edward J. McCluskey},
title = {Detecting Delay Flaws by Very-Low-Voltage Testing},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {367--376},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.556983},
doi = {10.1109/TEST.1996.556983},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChangM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NorwoodM96,
author = {Robert B. Norwood and
Edward J. McCluskey},
title = {Orthogonal Scan: Low-Overhead Scan for Data Paths},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {659--668},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.557123},
doi = {10.1109/TEST.1996.557123},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NorwoodM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FrancoMCCWMSF96,
author = {Piero Franco and
Siyad C. Ma and
Jonathan Chang and
Yi{-}Chin Chu and
Sanjay Wattal and
Edward J. McCluskey and
Robert L. Stokes and
William D. Farwell},
title = {Analysis and Detection of Timing Failures in an Experimental Test
Chip},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {691--700},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.557127},
doi = {10.1109/TEST.1996.557127},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FrancoMCCWMSF96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ToubaM96,
author = {Nur A. Touba and
Edward J. McCluskey},
title = {Test point insertion based on path tracing},
booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
Princeton, NJ, {USA}},
pages = {2--8},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/VTEST.1996.510828},
doi = {10.1109/VTEST.1996.510828},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ToubaM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NorwoodM96,
author = {Robert B. Norwood and
Edward J. McCluskey},
title = {Synthesis-for-scan and scan chain ordering},
booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
Princeton, NJ, {USA}},
pages = {87--92},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/VTEST.1996.510840},
doi = {10.1109/VTEST.1996.510840},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NorwoodM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChangM96,
author = {Jonathan T.{-}Y. Chang and
Edward J. McCluskey},
title = {Quantitative analysis of very-low-voltage testing},
booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
Princeton, NJ, {USA}},
pages = {332--337},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/VTEST.1996.510876},
doi = {10.1109/VTEST.1996.510876},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChangM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ToubaM96a,
author = {Nur A. Touba and
Edward J. McCluskey},
title = {Applying two-pattern tests using scan-mapping},
booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
Princeton, NJ, {USA}},
pages = {393--399},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/VTEST.1996.510884},
doi = {10.1109/VTEST.1996.510884},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ToubaM96a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/FuruyaSM95,
author = {Kiyoshi Furuya and
Seiji Seki and
Edward J. McCluskey},
title = {Design of Autonomous {TPG} Circuits for Use in Two-Pattern Testing},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {78-D},
number = {7},
pages = {882--888},
year = {1995},
url = {http://search.ieice.org/bin/summary.php?id=e78-d\_7\_882},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/FuruyaSM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/BoleyGMSM95,
author = {Daniel Boley and
Gene H. Golub and
Samy Makar and
Nirmal R. Saxena and
Edward J. McCluskey},
title = {Floating Point Fault Tolerance with Backward Error Assertions},
journal = {{IEEE} Trans. Computers},
volume = {44},
number = {2},
pages = {302--311},
year = {1995},
url = {https://doi.org/10.1109/12.364541},
doi = {10.1109/12.364541},
timestamp = {Tue, 16 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/BoleyGMSM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MaM95,
author = {Siyad C. Ma and
Edward J. McCluskey},
title = {Open faults in BiCMOS gates},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {14},
number = {5},
pages = {567--575},
year = {1995},
url = {https://doi.org/10.1109/43.384417},
doi = {10.1109/43.384417},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MaM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamadaYM95,
author = {Teruhiko Yamada and
Koji Yamazaki and
Edward J. McCluskey},
title = {A simple technique for locating gate-level faults in combinational
circuits},
booktitle = {4th Asian Test Symposium {(ATS} '95), November 23-24, 1995. Bangalore,
India},
pages = {65--70},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/ATS.1995.485318},
doi = {10.1109/ATS.1995.485318},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YamadaYM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MakarM95,
author = {Samy Makar and
Edward J. McCluskey},
title = {Functional Tests for Scan Chain Latches},
booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
the Cost of Test, Washington, DC, USA, October 21-25, 1995},
pages = {606--615},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/TEST.1995.529889},
doi = {10.1109/TEST.1995.529889},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MakarM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FrancoFSM95,
author = {Piero Franco and
William D. Farwell and
Robert L. Stokes and
Edward J. McCluskey},
title = {An Experimental Chip to Evaluate Test Techniques: Chip and Experiment
Design},
booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
the Cost of Test, Washington, DC, USA, October 21-25, 1995},
pages = {653--662},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/TEST.1995.529894},
doi = {10.1109/TEST.1995.529894},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FrancoFSM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaFM95,
author = {Siyad C. Ma and
Piero Franco and
Edward J. McCluskey},
title = {An Experimental Chip to Evaluate Test Techniques: Experiment Results},
booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
the Cost of Test, Washington, DC, USA, October 21-25, 1995},
pages = {663--672},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/TEST.1995.529895},
doi = {10.1109/TEST.1995.529895},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaFM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ToubaM95,
author = {Nur A. Touba and
Edward J. McCluskey},
title = {Synthesis of Mapping Logic for Generating Transformed Pseudo-Random
Patterns for {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
the Cost of Test, Washington, DC, USA, October 21-25, 1995},
pages = {674--682},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/TEST.1995.529897},
doi = {10.1109/TEST.1995.529897},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ToubaM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MukundMR95,
author = {Shridhar K. Mukund and
Edward J. McCluskey and
T. R. N. Rao},
title = {An apparatus for pseudo-deterministic testing},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {125--131},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512627},
doi = {10.1109/VTEST.1995.512627},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MukundMR95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MakarM95,
author = {Samy Makar and
Edward J. McCluskey},
title = {Checking experiments to test latches},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {196--201},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512637},
doi = {10.1109/VTEST.1995.512637},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MakarM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ToubaM95,
author = {Nur A. Touba and
Edward J. McCluskey},
title = {Transformed pseudo-random patterns for {BIST}},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {410--416},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512668},
doi = {10.1109/VTEST.1995.512668},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ToubaM95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tse/SaxenaM94,
author = {Nirmal R. Saxena and
Edward J. McCluskey},
title = {Linear Complexity Assertions for Sorting},
journal = {{IEEE} Trans. Software Eng.},
volume = {20},
number = {6},
pages = {424--431},
year = {1994},
url = {https://doi.org/10.1109/32.295891},
doi = {10.1109/32.295891},
timestamp = {Wed, 17 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tse/SaxenaM94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/ToubaM94,
author = {Nur A. Touba and
Edward J. McCluskey},
editor = {Jochen A. G. Jess and
Richard L. Rudell},
title = {Logic synthesis techniques for reduced area implementation of multilevel
circuits with concurrent error detection},
booktitle = {Proceedings of the 1994 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1994, San Jose, California, USA, November 6-10, 1994},
pages = {651--654},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1994},
url = {https://doi.org/10.1109/ICCAD.1994.629891},
doi = {10.1109/ICCAD.1994.629891},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/ToubaM94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ToubaM94,
author = {Nur A. Touba and
Edward J. McCluskey},
title = {Automated Logic Synthesis of Random-Pattern-Testable Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
Next 25 Years, Washington, DC, USA, October 2-6, 1994},
pages = {174--183},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/TEST.1994.527948},
doi = {10.1109/TEST.1994.527948},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ToubaM94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FrancoM94,
author = {Piero Franco and
Edward J. McCluskey},
title = {On-line delay testing of digital circuits},
booktitle = {12th {IEEE} {VLSI} Test Symposium (VTS'94), April 25-28, 1994, Cherry
Hill, New Jersey, {USA}},
pages = {167--173},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/VTEST.1994.292318},
doi = {10.1109/VTEST.1994.292318},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/FrancoM94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MaM94,
author = {Siyad C. Ma and
Edward J. McCluskey},
title = {Open faults in BiCMOS gates},
booktitle = {12th {IEEE} {VLSI} Test Symposium (VTS'94), April 25-28, 1994, Cherry
Hill, New Jersey, {USA}},
pages = {434--439},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/VTEST.1994.292277},
doi = {10.1109/VTEST.1994.292277},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MaM94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FrancoM94a,
author = {Piero Franco and
Edward J. McCluskey},
title = {Three-pattern tests for delay faults},
booktitle = {12th {IEEE} {VLSI} Test Symposium (VTS'94), April 25-28, 1994, Cherry
Hill, New Jersey, {USA}},
pages = {452--456},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/VTEST.1994.292274},
doi = {10.1109/VTEST.1994.292274},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/FrancoM94a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/HaoM93,
author = {Hong Hao and
Edward J. McCluskey},
title = {Analysis of Gate Oxide Shorts in {CMOS} Circuits},
journal = {{IEEE} Trans. Computers},
volume = {42},
number = {12},
pages = {1510--1516},
year = {1993},
url = {https://doi.org/10.1109/12.260643},
doi = {10.1109/12.260643},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/HaoM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HaoM93,
author = {Hong Hao and
Edward J. McCluskey},
title = {Very-Low-Voltage Testing for Weak {CMOS} Logic ICs},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {275--284},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470686},
doi = {10.1109/TEST.1993.470686},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HaoM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskey93,
author = {Edward J. McCluskey},
title = {Quality and Single-Stuck Faults},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {597},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470645},
doi = {10.1109/TEST.1993.470645},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McCluskey93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AvraM93,
author = {LaNae J. Avra and
Edward J. McCluskey},
title = {Synthesizing for Scan Dependence in Built-In Self-Testable Desings},
booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
17-21, 1993},
pages = {734--743},
publisher = {{IEEE} Computer Society},
year = {1993},
url = {https://doi.org/10.1109/TEST.1993.470629},
doi = {10.1109/TEST.1993.470629},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AvraM93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/SaxenaFM92,
author = {Nirmal R. Saxena and
Piero Franco and
Edward J. McCluskey},
title = {Simple Bounds on Serial Signature Analysis Aliasing for Random Testing},
journal = {{IEEE} Trans. Computers},
volume = {41},
number = {5},
pages = {638--645},
year = {1992},
url = {https://doi.org/10.1109/12.142690},
doi = {10.1109/12.142690},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/SaxenaFM92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaM92,
author = {Siyad C. Ma and
Edward J. McCluskey},
title = {Non-Conventional Faults in BiCMOS Digital Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
New World of Test and Design, Baltimore, Maryland, USA, September
20-24, 1992},
pages = {882--891},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/TEST.1992.527914},
doi = {10.1109/TEST.1992.527914},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaM92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/SaxenaFM91,
author = {Nirmal R. Saxena and
Piero Franco and
Edward J. McCluskey},
title = {Bounds on Signature Analysis Aliasing for Random Testing},
booktitle = {Proceedings of the 1991 International Symposium on Fault-Tolerant
Computing, Montreal, Canada},
pages = {104--113},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/FTCS.1991.146641},
doi = {10.1109/FTCS.1991.146641},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/SaxenaFM91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/MillmanM91,
author = {Steven D. Millman and
Edward J. McCluskey},
title = {Bridging, Transition, and Stuck-Open Faults in Self-Testing {CMOS}
Checkers},
booktitle = {Proceedings of the 1991 International Symposium on Fault-Tolerant
Computing, Montreal, Canada},
pages = {154--161},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/FTCS.1991.146655},
doi = {10.1109/FTCS.1991.146655},
timestamp = {Tue, 23 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/MillmanM91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HaoM91,
author = {Hong Hao and
Edward J. McCluskey},
title = {"Resistive Shorts" Within {CMOS} Gates},
booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
pages = {292--301},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/TEST.1991.519521},
doi = {10.1109/TEST.1991.519521},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/HaoM91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FuruyaM91,
author = {Kiyoshi Furuya and
Edward J. McCluskey},
title = {Two-Pattern Test Capabilities of Autonomous {TPG} Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
pages = {704--711},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/TEST.1991.519735},
doi = {10.1109/TEST.1991.519735},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FuruyaM91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FrancoM91,
author = {Piero Franco and
Edward J. McCluskey},
title = {Delay Testing of Digital Circuits by Output Waveform Analysis},
booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
pages = {798--807},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/TEST.1991.519745},
doi = {10.1109/TEST.1991.519745},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FrancoM91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaxenaFM91,
author = {Nirmal R. Saxena and
Piero Franco and
Edward J. McCluskey},
title = {Refined Bounds on Signature Analysis Aliasing for Random Testing},
booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
pages = {818--827},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/TEST.1991.519747},
doi = {10.1109/TEST.1991.519747},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SaxenaFM91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/McCluskey90,
author = {Edward J. McCluskey},
title = {Design Techniques for Testable Embedded Error Checkers},
journal = {Computer},
volume = {23},
number = {7},
pages = {84--88},
year = {1990},
url = {https://doi.org/10.1109/2.56855},
doi = {10.1109/2.56855},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/McCluskey90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/SaxenaM90,
author = {Nirmal R. Saxena and
Edward J. McCluskey},
title = {Control-Flow Checking Using Watchdog Assists and Extended-Precision
Checksums},
journal = {{IEEE} Trans. Computers},
volume = {39},
number = {4},
pages = {554--559},
year = {1990},
url = {https://doi.org/10.1109/12.54849},
doi = {10.1109/12.54849},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/SaxenaM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/SaxenaM90a,
author = {Nirmal R. Saxena and
Edward J. McCluskey},
title = {Analysis of Checksums, Extended-Precision Checksums, and Cyclic Redundancy
Checks},
journal = {{IEEE} Trans. Computers},
volume = {39},
number = {7},
pages = {969--975},
year = {1990},
url = {https://doi.org/10.1109/12.55701},
doi = {10.1109/12.55701},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/SaxenaM90a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/compcon/AvraM90,
author = {LaNae J. Avra and
Edward J. McCluskey},
title = {Behavioral synthesis of testable systems with {VHDL}},
booktitle = {Intellectual Leverage: Thirty-Fifth {IEEE} Computer Society International
Conference, Compcon Spring '90, San Francisco, California, USA, February
26 - March 2, 1992, Digest of Papers},
pages = {410--415},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/CMPCON.1990.63717},
doi = {10.1109/CMPCON.1990.63717},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/compcon/AvraM90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MillmanMA90,
author = {Steven D. Millman and
Edward J. McCluskey and
John M. Acken},
title = {Diagnosing {CMOS} bridging faults with stuck-at fault dictionaries},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {860--870},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114104},
doi = {10.1109/TEST.1990.114104},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MillmanMA90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/UdellM89,
author = {Jon G. Jr. Udell and
Edward J. McCluskey},
title = {Pseudo-exhaustive test and segmentation: formal definitions and extended
fault coverage results},
booktitle = {Proceedings of the Nineteenth International Symposium on Fault-Tolerant
Computing, {FTCS} 1989, Chicago, IL, USA, 21-23 June, 1989},
pages = {292--298},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/FTCS.1989.105582},
doi = {10.1109/FTCS.1989.105582},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/UdellM89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/SaxenaM89,
author = {Nirmal R. Saxena and
Edward J. McCluskey},
title = {Control-flow checking using watchdog assists and extended-precision
checksums},
booktitle = {Proceedings of the Nineteenth International Symposium on Fault-Tolerant
Computing, {FTCS} 1989, Chicago, IL, USA, 21-23 June, 1989},
pages = {428--435},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/FTCS.1989.105615},
doi = {10.1109/FTCS.1989.105615},
timestamp = {Tue, 23 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/SaxenaM89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/MakarM89,
author = {Samy Makar and
Edward J. McCluskey},
title = {The critical path for multiple faults},
booktitle = {1989 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical
Papers},
pages = {162--165},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/ICCAD.1989.76927},
doi = {10.1109/ICCAD.1989.76927},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/MakarM89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/SaxenaM89,
author = {Nirmal R. Saxena and
Edward J. McCluskey},
title = {Arithmetic and galois checksums},
booktitle = {1989 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical
Papers},
pages = {570--573},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/ICCAD.1989.77015},
doi = {10.1109/ICCAD.1989.77015},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/SaxenaM89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/MahmoodM88,
author = {Aamer Mahmood and
Edward J. McCluskey},
title = {Concurrent Error Detection Using Watchdog Processors - {A} Survey},
journal = {{IEEE} Trans. Computers},
volume = {37},
number = {2},
pages = {160--174},
year = {1988},
url = {https://doi.org/10.1109/12.2145},
doi = {10.1109/12.2145},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/MahmoodM88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/WangM88,
author = {Laung{-}Terng Wang and
Edward J. McCluskey},
title = {Linear Feedback Shift Register Design Using Cyclic Codes},
journal = {{IEEE} Trans. Computers},
volume = {37},
number = {10},
pages = {1302--1306},
year = {1988},
url = {https://doi.org/10.1109/12.5994},
doi = {10.1109/12.5994},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/WangM88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LiuM88,
author = {Dick L. Liu and
Edward J. McCluskey},
title = {Design of large embedded {CMOS} PLAs for built-in self-test},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {7},
number = {1},
pages = {50--59},
year = {1988},
url = {https://doi.org/10.1109/43.3129},
doi = {10.1109/43.3129},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/LiuM88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/McCluskeyMMW88,
author = {Edward J. McCluskey and
Samy Makar and
Samiha Mourad and
Kenneth D. Wagner},
title = {Probability models for pseudorandom test sequences},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {7},
number = {1},
pages = {68--74},
year = {1988},
url = {https://doi.org/10.1109/43.3131},
doi = {10.1109/43.3131},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/McCluskeyMMW88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WangM88,
author = {Laung{-}Terng Wang and
Edward J. McCluskey},
title = {Hybrid designs generating maximum-length sequences},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {7},
number = {1},
pages = {91--99},
year = {1988},
url = {https://doi.org/10.1109/43.3134},
doi = {10.1109/43.3134},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WangM88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WangM88a,
author = {Laung{-}Terng Wang and
Edward J. McCluskey},
title = {Circuits for pseudoexhaustive test pattern generation},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {7},
number = {10},
pages = {1068--1080},
year = {1988},
url = {https://doi.org/10.1109/43.7806},
doi = {10.1109/43.7806},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WangM88a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/NanyaMM88,
author = {Takashi Nanya and
Samiha Mourad and
Edward J. McCluskey},
title = {Multiple stuck-at fault testability of self-testing checkers},
booktitle = {Proceedings of the Eighteenth International Symposium on Fault-Tolerant
Computing, {FTCS} 1988, Tokyo, Japan, 27-30 June, 1988},
pages = {381--386},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/FTCS.1988.5347},
doi = {10.1109/FTCS.1988.5347},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/NanyaMM88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskey88,
author = {Edward J. McCluskey},
title = {Practice and Theory},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {203--204},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207802},
doi = {10.1109/TEST.1988.207802},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/McCluskey88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskeyB88,
author = {Edward J. McCluskey and
Fred Buelow},
title = {{IC} Quality and Test Transparency},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {295--301},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207814},
doi = {10.1109/TEST.1988.207814},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/McCluskeyB88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MakarM88,
author = {Samy Makar and
Edward J. McCluskey},
title = {On the Testing of Multiplexers},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {669--679},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207851},
doi = {10.1109/TEST.1988.207851},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MakarM88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MillmanM88,
author = {Steven D. Millman and
Edward J. McCluskey},
title = {Detecting Bridging Faults with Stuck-at Test Sets},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {773--783},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207864},
doi = {10.1109/TEST.1988.207864},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MillmanM88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MouradM88,
author = {Samiha Mourad and
Edward J. McCluskey},
title = {On Benchmarking Digital Testing Systems},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {997},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207892},
doi = {10.1109/TEST.1988.207892},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MouradM88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/UdeliM88,
author = {Jon G. Udeli Jr. and
Edward J. McCluskey},
title = {Partial Hardware Partitioning: {A} New Pseudo-Exhaustive Test Implementation},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {1000},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207895},
doi = {10.1109/TEST.1988.207895},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/UdeliM88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/LiuM87,
author = {Dick L. Liu and
Edward J. McCluskey},
title = {Designing {CMOS} Circuits for Switch-Level Testability},
journal = {{IEEE} Des. Test},
volume = {4},
number = {4},
pages = {42--49},
year = {1987},
url = {https://doi.org/10.1109/MDT.1987.295148},
doi = {10.1109/MDT.1987.295148},
timestamp = {Tue, 02 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/LiuM87.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/ChinM87,
author = {Cary K. Chin and
Edward J. McCluskey},
title = {Test Length for Pseudorandom Testing},
journal = {{IEEE} Trans. Computers},
volume = {36},
number = {2},
pages = {252--256},
year = {1987},
url = {https://doi.org/10.1109/TC.1987.1676892},
doi = {10.1109/TC.1987.1676892},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/ChinM87.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/WagnerCM87,
author = {Kenneth D. Wagner and
Cary K. Chin and
Edward J. McCluskey},
title = {Pseudorandom Testing},
journal = {{IEEE} Trans. Computers},
volume = {36},
number = {3},
pages = {332--343},
year = {1987},
url = {https://doi.org/10.1109/TC.1987.1676905},
doi = {10.1109/TC.1987.1676905},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/WagnerCM87.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icde/AmerM87,
author = {Hassanein H. Amer and
Edward J. McCluskey},
title = {Modeling the Effect of Chip Failures on Cache Memory Systems},
booktitle = {Proceedings of the Third International Conference on Data Engineering,
February 3-5, 1987, Los Angeles, California, {USA}},
pages = {340--346},
publisher = {{IEEE} Computer Society},
year = {1987},
url = {https://doi.org/10.1109/ICDE.1987.7272399},
doi = {10.1109/ICDE.1987.7272399},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/icde/AmerM87.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@book{DBLP:books/daglib/0067165,
author = {Edward J. McCluskey},
title = {Logic design principles - with emphasis on testable semicustom circuits},
series = {Prentice Hall series in computer engineering},
publisher = {Prentice Hall},
year = {1986},
isbn = {978-0-13-539768-8},
timestamp = {Fri, 08 Apr 2011 01:00:00 +0200},
biburl = {https://dblp.org/rec/books/daglib/0067165.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/WangM86,
author = {Laung{-}Terng Wang and
Edward J. McCluskey},
title = {Condensed Linear Feedback Shift Register {(LFSR)} Testing - {A} Pseudoexhaustive
Test Technique},
journal = {{IEEE} Trans. Computers},
volume = {35},
number = {4},
pages = {367--370},
year = {1986},
url = {https://doi.org/10.1109/TC.1986.1676772},
doi = {10.1109/TC.1986.1676772},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/WangM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/Bozorgui-NesbatM86,
author = {Saied Bozorgui{-}Nesbat and
Edward J. McCluskey},
title = {Lower Overhead Design for Testability of Programmable Logic Arrays},
journal = {{IEEE} Trans. Computers},
volume = {35},
number = {4},
pages = {379--383},
year = {1986},
url = {https://doi.org/10.1109/TC.1986.1676775},
doi = {10.1109/TC.1986.1676775},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/Bozorgui-NesbatM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/compcon/MouradHM86,
author = {Samiha Mourad and
Joseph L. A. Hughes and
Edward J. McCluskey},
title = {Multiple Fault Detection in Parity Trees},
booktitle = {Spring COMPCON'86, Digest of Papers, Thirty-First {IEEE} Computer
Society International Conference, San Francisco, California, USA,
March 3-6, 1986},
pages = {441--444},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Wed, 28 Jun 2006 09:47:20 +0200},
biburl = {https://dblp.org/rec/conf/compcon/MouradHM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fjcc/MouradHM86,
author = {Samiha Mourad and
Joseph L. A. Hughes and
Edward J. McCluskey},
title = {Stuck-At Fault Detection in Parity Trees},
booktitle = {Proceedings of the Fall Joint Computer Conference, November 2-6, 1986,
Dallas, Texas, {USA}},
pages = {836--840},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Fri, 29 Sep 2017 14:35:52 +0200},
biburl = {https://dblp.org/rec/conf/fjcc/MouradHM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangM86,
author = {Laung{-}Terng Wang and
Edward J. McCluskey},
title = {Circuits for Pseudo-Exhaustive Test Pattern Generation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {25--37},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 12:22:37 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangM86a,
author = {Laung{-}Terng Wang and
Edward J. McCluskey},
title = {A Hybrid Design of Maximum-Length Sequence Generators},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {38--47},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangM86a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FreemanLWM86,
author = {Greg G. Freeman and
Dick L. Liu and
Bruce A. Wooley and
Edward J. McCluskey},
title = {Two {CMOS} Metastability Sensors},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {140--144},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Wed, 02 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FreemanLWM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HughesM86,
author = {Joseph L. A. Hughes and
Edward J. McCluskey},
title = {Multiple Stuck-At Fault Coverage of Single Stuck-At Fault Test Sets},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {368--374},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HughesM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CortesM86,
author = {Mario L{\'{u}}cio C{\^{o}}rtes and
Edward J. McCluskey},
title = {An Experiment on Intermittent-Failure Mechanisms},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {435--442},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Thu, 28 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CortesM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/McCluskey85,
author = {Edward J. McCluskey},
title = {Built-In Self-Test Techniques},
journal = {{IEEE} Des. Test},
volume = {2},
number = {2},
pages = {21--28},
year = {1985},
url = {https://doi.org/10.1109/MDT.1985.294856},
doi = {10.1109/MDT.1985.294856},
timestamp = {Fri, 05 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/McCluskey85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/McCluskey85a,
author = {Edward J. McCluskey},
title = {Built-In Self-Test Structures},
journal = {{IEEE} Des. Test},
volume = {2},
number = {2},
pages = {29--36},
year = {1985},
url = {https://doi.org/10.1109/MDT.1985.294857},
doi = {10.1109/MDT.1985.294857},
timestamp = {Fri, 05 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/McCluskey85a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/compcon/McCluskey85,
author = {Edward J. McCluskey},
title = {Hardware Fault-Tolerance},
booktitle = {Spring COMPCON'85, Digest of Papers, Thirtieth {IEEE} Computer Society
International Conference, San Francisco, California, USA, February
25-28, 1985},
pages = {260--263},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Wed, 28 Jun 2006 12:59:39 +0200},
biburl = {https://dblp.org/rec/conf/compcon/McCluskey85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/compcon/HughesMM85,
author = {Joseph L. A. Hughes and
Samiha Mourad and
Edward J. McCluskey},
title = {An Experimental Study Comparing 74LS181 Test Sets},
booktitle = {Spring COMPCON'85, Digest of Papers, Thirtieth {IEEE} Computer Society
International Conference, San Francisco, California, USA, February
25-28, 1985},
pages = {384--387},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Wed, 28 Jun 2006 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/compcon/HughesMM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChinM85,
author = {Cary K. Chin and
Edward J. McCluskey},
title = {Test Length for Pseudo Random Testing},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {94--99},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 15:59:32 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChinM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MahmoodME85,
author = {Aamer Mahmood and
Edward J. McCluskey and
Aydin Ersoz},
title = {Concurrent System-Level Error Detection Using a Watchdog Processor},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {145--152},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MahmoodME85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskey85,
author = {Edward J. McCluskey},
title = {Test Teaching},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {235},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McCluskey85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/McCluskey84,
author = {Edward J. McCluskey},
title = {Verification Testing - {A} Pseudoexhaustive Test Technique},
journal = {{IEEE} Trans. Computers},
volume = {33},
number = {6},
pages = {541--546},
year = {1984},
url = {https://doi.org/10.1109/TC.1984.1676477},
doi = {10.1109/TC.1984.1676477},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/McCluskey84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/HughesML84,
author = {Joseph L. A. Hughes and
Edward J. McCluskey and
David J. Lu},
title = {Design of Totally Self-Checking Comparators with an Arbitrary Number
of Inputs},
journal = {{IEEE} Trans. Computers},
volume = {33},
number = {6},
pages = {546--550},
year = {1984},
url = {https://doi.org/10.1109/TC.1984.1676478},
doi = {10.1109/TC.1984.1676478},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/HughesML84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/KhakbazM84,
author = {Javad Khakbaz and
Edward J. McCluskey},
title = {Self-Testing Embedded Parity Checkers},
journal = {{IEEE} Trans. Computers},
volume = {33},
number = {8},
pages = {753--756},
year = {1984},
url = {https://doi.org/10.1109/TC.1984.5009365},
doi = {10.1109/TC.1984.5009365},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/KhakbazM84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LuM84,
author = {David J. Lu and
Edward J. McCluskey},
title = {Quantitative Evaluation of Self-Checking Circuits},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {3},
number = {2},
pages = {150--155},
year = {1984},
url = {https://doi.org/10.1109/TCAD.1984.1270069},
doi = {10.1109/TCAD.1984.1270069},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/LuM84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HughesM84,
author = {Joseph L. A. Hughes and
Edward J. McCluskey},
title = {An Analysis of the Multiple Fault Detection Capabilities of Single
Stuck-at Fault Test Sets},
booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA,
USA, October 1984},
pages = {52--58},
publisher = {{IEEE} Computer Society},
year = {1984},
timestamp = {Fri, 22 Nov 2002 13:40:15 +0100},
biburl = {https://dblp.org/rec/conf/itc/HughesM84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HassanM84,
author = {Syed Zahoor Hassan and
Edward J. McCluskey},
title = {Pseudo-Exhaustive Testing of Sequential Machines Using Signature Analysis},
booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA,
USA, October 1984},
pages = {320--326},
publisher = {{IEEE} Computer Society},
year = {1984},
timestamp = {Fri, 22 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HassanM84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bozorgui-NesbatM84,
author = {Saied Bozorgui{-}Nesbat and
Edward J. McCluskey},
title = {Lower Overhead Design for Testability of Programmable Logic Arrays},
booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA,
USA, October 1984},
pages = {856--865},
publisher = {{IEEE} Computer Society},
year = {1984},
timestamp = {Fri, 22 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bozorgui-NesbatM84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskeyL83,
author = {Edward J. McCluskey and
David J. Lu},
title = {Recurrent Test Patterns},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA,
USA, October 1983},
pages = {76--82},
publisher = {{IEEE} Computer Society},
year = {1983},
timestamp = {Tue, 05 Nov 2002 15:16:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/McCluskeyL83.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskey83,
author = {Edward J. McCluskey},
title = {Teaching Testing},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA,
USA, October 1983},
pages = {166--169},
publisher = {{IEEE} Computer Society},
year = {1983},
timestamp = {Tue, 05 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McCluskey83.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MahmoodML83,
author = {Aamer Mahmood and
Edward J. McCluskey and
David J. Lu},
title = {Concurrent Fault Detection Using a Watchdog Processor and Assertions},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA,
USA, October 1983},
pages = {622--628},
publisher = {{IEEE} Computer Society},
year = {1983},
timestamp = {Tue, 05 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MahmoodML83.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/IyerBM82,
author = {Ravishankar K. Iyer and
Steven E. Butner and
Edward J. McCluskey},
title = {A Statistical Failure/Load Relationship: Results of a Multicomputer
Study},
journal = {{IEEE} Trans. Computers},
volume = {31},
number = {7},
pages = {697--706},
year = {1982},
url = {https://doi.org/10.1109/TC.1982.1676070},
doi = {10.1109/TC.1982.1676070},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/IyerBM82.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/McCluskey82,
author = {Edward J. McCluskey},
editor = {James S. Crabbe and
Charles E. Radke and
Hillel Ofek},
title = {Verification testing},
booktitle = {Proceedings of the 19th Design Automation Conference, {DAC} '82, Las
Vegas, Nevada, USA, June 14-16, 1982},
pages = {495--500},
publisher = {{ACM/IEEE}},
year = {1982},
url = {https://doi.org/10.1145/800263.809250},
doi = {10.1145/800263.809250},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/McCluskey82.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskey82,
author = {Edward J. McCluskey},
title = {Built-In Verification Test},
booktitle = {Proceedings International Test Conference 1982, Philadelphia, PA,
USA, November 1982},
pages = {183--190},
publisher = {{IEEE} Computer Society},
year = {1982},
timestamp = {Wed, 23 Oct 2002 15:42:03 +0200},
biburl = {https://dblp.org/rec/conf/itc/McCluskey82.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/McCluskeyB81,
author = {Edward J. McCluskey and
Saied Bozorgui{-}Nesbat},
title = {Design for Autonomous Test},
journal = {{IEEE} Trans. Computers},
volume = {30},
number = {11},
pages = {866--875},
year = {1981},
url = {https://doi.org/10.1109/TC.1981.1675717},
doi = {10.1109/TC.1981.1675717},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/McCluskeyB81.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/HayesM80,
author = {John P. Hayes and
Edward J. McCluskey},
title = {Testability Considerotions in Microprocessor-Based Design},
journal = {Computer},
volume = {13},
number = {3},
pages = {17--26},
year = {1980},
url = {https://doi.org/10.1109/MC.1980.1653526},
doi = {10.1109/MC.1980.1653526},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/HayesM80.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/rtss/LuMN80,
author = {David J. Lu and
Edward J. McCluskey and
Masood Namjoo},
title = {Summary of Structural integrity Checking},
booktitle = {Distributed Data Acquisition, Computing, and Control Symposium, December
3-5, 1980, Miami Beach, Florida, {USA}},
pages = {107--109},
publisher = {{IEEE} Computer Society},
year = {1980},
timestamp = {Wed, 23 Jan 2013 07:55:26 +0100},
biburl = {https://dblp.org/rec/conf/rtss/LuMN80.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/McCluskey79,
author = {Edward J. McCluskey},
title = {Logic Design of Multivalued I\({}^{\mbox{2}}\)L Logic Circuits},
journal = {{IEEE} Trans. Computers},
volume = {28},
number = {8},
pages = {546--559},
year = {1979},
url = {https://doi.org/10.1109/TC.1979.1675410},
doi = {10.1109/TC.1979.1675410},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/McCluskey79.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/McCluskeyPS78,
author = {Edward J. McCluskey and
Kenneth P. Parker and
John J. Shedletsky},
title = {Boolean Network Probabilities and Network Design},
journal = {{IEEE} Trans. Computers},
volume = {27},
number = {2},
pages = {187--189},
year = {1978},
url = {https://doi.org/10.1109/TC.1978.1675058},
doi = {10.1109/TC.1978.1675058},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/McCluskeyPS78.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/ParkerM78,
author = {Kenneth P. Parker and
Edward J. McCluskey},
title = {Sequential Circuit Output Probabilities From Regular Expressions},
journal = {{IEEE} Trans. Computers},
volume = {27},
number = {3},
pages = {222--231},
year = {1978},
url = {https://doi.org/10.1109/TC.1978.1675075},
doi = {10.1109/TC.1978.1675075},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/ParkerM78.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ismvl/McCluskey78,
author = {Edward J. McCluskey},
title = {Logic design of multi-valued {I2L} logic circuits},
booktitle = {Proceedings of the eighth international symposium on Multiple-valued
logic, {MVL} 1978, Rosemont, Illinois, USA, 1978},
pages = {14--22},
publisher = {{IEEE} Computer Society Press},
year = {1978},
url = {http://dl.acm.org/citation.cfm?id=804180},
timestamp = {Mon, 09 Aug 2021 11:27:20 +0200},
biburl = {https://dblp.org/rec/conf/ismvl/McCluskey78.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isca/1978,
editor = {Edward J. McCluskey and
John F. Wakerly and
E. David Crockett and
Thomas H. Bredt and
David J. Lu and
William M. van Cleemput and
Susan S. Owicki and
Roy C. Ogus and
Ravi Apte and
M. Danielle Beaurdy and
Jacques Losq},
title = {Proceedings of the 5th Annual Symposium on Computer Architecture,
Palo Alto, CA, USA, April 1978},
publisher = {{ACM}},
year = {1978},
url = {https://doi.org/10.1145/800094},
doi = {10.1145/800094},
isbn = {978-1-4503-7400-2},
timestamp = {Fri, 09 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/isca/1978.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/WakerlyM77,
author = {John F. Wakerly and
Edward J. McCluskey},
title = {Microcomputers in the Computer Engineering Curriculum},
journal = {Computer},
volume = {10},
number = {1},
pages = {32--38},
year = {1977},
url = {https://doi.org/10.1109/C-M.1977.217494},
doi = {10.1109/C-M.1977.217494},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/WakerlyM77.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/DaoMR77,
author = {Tich T. Dao and
Edward J. McCluskey and
Lewis K. Russel},
title = {Multivalued Integrated Injection Logic},
journal = {{IEEE} Trans. Computers},
volume = {26},
number = {12},
pages = {1233--1241},
year = {1977},
url = {https://doi.org/10.1109/TC.1977.1674784},
doi = {10.1109/TC.1977.1674784},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/DaoMR77.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dam/TeetsRM77,
author = {John Teets and
Charles W. Rose and
Edward J. McCluskey},
editor = {William M. van Cleemput and
John C. Foster and
Donald C. S. Allison},
title = {Panel Discussions},
booktitle = {Proceedings of the Symposium on Design Automation and Microprocessors,
Palo Alto, California, February 24-25, 1977},
pages = {110},
publisher = {{IEEE} Press / {ACM} Digital Library},
year = {1977},
url = {http://dl.acm.org/citation.cfm?id=805511},
timestamp = {Fri, 13 Aug 2021 10:37:08 +0200},
biburl = {https://dblp.org/rec/conf/dam/TeetsRM77.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@book{DBLP:series/mcs/GschwindM75,
author = {Hans W. Gschwind and
Edward J. McCluskey},
title = {Design of Digital Computers - An Introduction},
series = {Texts and Monographs in Computer Science},
publisher = {Springer},
year = {1975},
url = {https://doi.org/10.1007/978-3-642-86190-1},
doi = {10.1007/978-3-642-86190-1},
isbn = {978-3-642-86192-5},
timestamp = {Tue, 16 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/series/mcs/GschwindM75.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/ParkerM75a,
author = {Kenneth P. Parker and
Edward J. McCluskey},
title = {Analysis of Logic Circuits with Faults Using Input Signal Probabilities},
journal = {{IEEE} Trans. Computers},
volume = {24},
number = {5},
pages = {573--578},
year = {1975},
url = {https://doi.org/10.1109/T-C.1975.224264},
doi = {10.1109/T-C.1975.224264},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/ParkerM75a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/ParkerM75,
author = {Kenneth P. Parker and
Edward J. McCluskey},
title = {Probabilistic Treatment of General Combinational Networks},
journal = {{IEEE} Trans. Computers},
volume = {24},
number = {6},
pages = {668--670},
year = {1975},
url = {https://doi.org/10.1109/T-C.1975.224279},
doi = {10.1109/T-C.1975.224279},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/ParkerM75.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/afips/SimmonsMFDN74,
author = {Dick B. Simmons and
Edward J. McCluskey and
Aaron Finerman and
Michael L. Dertouzos and
J{\"{u}}rg Nievergelt},
title = {University computer curricula},
booktitle = {American Federation of Information Processing Societies: 1974 National
Computer Conference, 6-10 May 1974, Chicago, Illinois, {USA}},
series = {{AFIPS} Conference Proceedings},
volume = {43},
pages = {1028},
publisher = {{AFIPS} Press},
year = {1974},
url = {https://doi.org/10.1145/1500175.1500385},
doi = {10.1145/1500175.1500385},
timestamp = {Wed, 14 Apr 2021 16:50:07 +0200},
biburl = {https://dblp.org/rec/conf/afips/SimmonsMFDN74.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ifip/WakerlyM74,
author = {John F. Wakerly and
Edward J. McCluskey},
editor = {Jack L. Rosenfeld},
title = {Design of Low-Cost General-Purpose Self-Diagnosing Computers},
booktitle = {Information Processing, Proceedings of the 6th {IFIP} Congress 1974,
Stockholm, Sweden, August 5-10, 1974},
pages = {108--111},
publisher = {North-Holland},
year = {1974},
timestamp = {Fri, 26 Jul 2019 22:58:40 +0200},
biburl = {https://dblp.org/rec/conf/ifip/WakerlyM74.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/BoothBCGMMR73,
author = {Taylor L. Booth and
C. Gordon Bell and
Cecil H. Coker and
Robert M. Glorioso and
Edward J. McCluskey and
Frederic J. Mowle and
David M. Robinson},
title = {Minicomputers in the Digital Laboratory Program},
journal = {Computer},
volume = {6},
number = {1},
pages = {28--42},
year = {1973},
url = {https://doi.org/10.1109/C-M.1973.217015},
doi = {10.1109/C-M.1973.217015},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/BoothBCGMMR73.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/SloanCM73,
author = {Martha E. Sloan and
Clarence L. Coates and
Edward J. McCluskey},
title = {Cosine survey of electrical engineering departments},
journal = {Computer},
volume = {6},
number = {6},
pages = {30--39},
year = {1973},
url = {https://doi.org/10.1109/MC.1973.6536796},
doi = {10.1109/MC.1973.6536796},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/SloanCM73.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/SiewiorekM73,
author = {Daniel P. Siewiorek and
Edward J. McCluskey},
title = {Switch Complexity in Systems with Hybrid Redundancy},
journal = {{IEEE} Trans. Computers},
volume = {22},
number = {3},
pages = {276--282},
year = {1973},
url = {https://doi.org/10.1109/T-C.1973.223707},
doi = {10.1109/T-C.1973.223707},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/SiewiorekM73.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/SiewiorekM73a,
author = {Daniel P. Siewiorek and
Edward J. McCluskey},
title = {An Iterative Cell Switch Design for Hybrid Redundancy},
journal = {{IEEE} Trans. Computers},
volume = {22},
number = {3},
pages = {290--297},
year = {1973},
url = {https://doi.org/10.1109/T-C.1973.223709},
doi = {10.1109/T-C.1973.223709},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/SiewiorekM73a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/sosp/1971,
editor = {Edward J. McCluskey and
Nicholas A. Fortis and
Butler W. Lampson and
Thomas H. Bredt},
title = {Proceedings of the Third Symposium on Operating System Principles,
{SOSP} 1971, Stanford University, Palo Alto, California, USA, October
18-20, 1971},
publisher = {{ACM}},
year = {1972},
url = {https://doi.org/10.1145/800212},
doi = {10.1145/800212},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/sosp/1971.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/McCluskey71,
author = {Edward J. McCluskey},
title = {Test and Diagnosis Procedure for Digital Networks},
journal = {Computer},
volume = {4},
number = {1},
pages = {17--20},
year = {1971},
url = {https://doi.org/10.1109/C-M.1971.216740},
doi = {10.1109/C-M.1971.216740},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/McCluskey71.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/McCluskeyC71,
author = {Edward J. McCluskey and
Frederick W. Clegg},
title = {Fault Equivalence in Combinational Logic Networks},
journal = {{IEEE} Trans. Computers},
volume = {20},
number = {11},
pages = {1286--1293},
year = {1971},
url = {https://doi.org/10.1109/T-C.1971.223129},
doi = {10.1109/T-C.1971.223129},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/McCluskeyC71.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/cacm/AtchisonCHHKKMNRSVY68,
author = {William F. Atchison and
Samuel D. Conte and
John W. Hamblen and
Thomas E. Hull and
Thomas A. Keenan and
William B. Kehl and
Edward J. McCluskey and
Silvio O. Navarro and
Werner C. Rheinboldt and
Earl J. Schweppe and
William Viavant and
David M. Young},
title = {Curriculum 68: Recommendations for academic programs in computer science:
a report of the {ACM} curriculum committee on computer science},
journal = {Commun. {ACM}},
volume = {11},
number = {3},
pages = {151--197},
year = {1968},
url = {https://doi.org/10.1145/362929.362976},
doi = {10.1145/362929.362976},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/cacm/AtchisonCHHKKMNRSVY68.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/BrzozowskiM64,
author = {Janusz A. Brzozowski and
Edward J. McCluskey},
title = {About Signal Flow Graph Techniques for Sequential Circuits},
journal = {{IEEE} Trans. Electron. Comput.},
volume = {13},
number = {2},
pages = {154},
year = {1964},
url = {https://doi.org/10.1109/PGEC.1964.263787},
doi = {10.1109/PGEC.1964.263787},
timestamp = {Wed, 20 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/BrzozowskiM64.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/DolottaM64,
author = {Ted A. Dolotta and
Edward J. McCluskey},
title = {The Coding of Internal States of Sequential Circuits},
journal = {{IEEE} Trans. Electron. Comput.},
volume = {13},
number = {5},
pages = {549--562},
year = {1964},
url = {https://doi.org/10.1109/PGEC.1964.263726},
doi = {10.1109/PGEC.1964.263726},
timestamp = {Wed, 20 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/DolottaM64.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/focs/PoageM64,
author = {J. F. Poage and
Edward J. McCluskey},
title = {Derivation of optimum test sequences for sequential machines},
booktitle = {5th Annual Symposium on Switching Circuit Theory and Logical Design,
Princeton, New Jersey, USA, November 11-13, 1964},
pages = {121--132},
publisher = {{IEEE} Computer Society},
year = {1964},
url = {https://doi.org/10.1109/SWCT.1964.7},
doi = {10.1109/SWCT.1964.7},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/focs/PoageM64.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iandc/McCluskey63,
author = {Edward J. McCluskey},
title = {Reduction of Feedback Loops in Sequential Circuits and Carry Leads
in Iterative Networks},
journal = {Inf. Control.},
volume = {6},
number = {2},
pages = {99--118},
year = {1963},
url = {https://doi.org/10.1016/S0019-9958(63)90139-6},
doi = {10.1016/S0019-9958(63)90139-6},
timestamp = {Fri, 12 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/iandc/McCluskey63.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/BrzozowskiM63,
author = {Janusz A. Brzozowski and
Edward J. McCluskey},
title = {Signal Flow Graph Techniques for Sequential Circuit State Diagrams},
journal = {{IEEE} Trans. Electron. Comput.},
volume = {12},
number = {2},
pages = {67--76},
year = {1963},
url = {https://doi.org/10.1109/PGEC.1963.263416},
doi = {10.1109/PGEC.1963.263416},
timestamp = {Wed, 20 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/BrzozowskiM63.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/focs/McCluskey63,
author = {Edward J. McCluskey},
title = {Logical design theory of {NOR} gate networks with no complemented
inputs},
booktitle = {4th Annual Symposium on Switching Circuit Theory and Logical Design,
Chicago, Illinois, USA, October 28-30, 1963},
pages = {137--148},
publisher = {{IEEE} Computer Society},
year = {1963},
url = {https://doi.org/10.1109/SWCT.1963.9},
doi = {10.1109/SWCT.1963.9},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/focs/McCluskey63.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/PyneM62,
author = {Insley B. Pyne and
Edward Joseph McCluskey Jr.},
title = {The Reduction of Redundancy in Solving Prime Implicant Tables},
journal = {{IRE} Trans. Electron. Comput.},
volume = {11},
number = {4},
pages = {473--482},
year = {1962},
url = {https://doi.org/10.1109/TEC.1962.5219386},
doi = {10.1109/TEC.1962.5219386},
timestamp = {Mon, 25 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/PyneM62.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/focs/McCluskey62,
author = {Edward J. McCluskey},
title = {Reduction of feedback loops in sequential circuits and carry leads
in iterative networks},
booktitle = {3rd Annual Symposium on Switching Circuit Theory and Logical Design,
Chicago, Illinois, USA, October 7-12, 1962},
pages = {91--102},
publisher = {{IEEE} Computer Society},
year = {1962},
url = {https://doi.org/10.1109/FOCS.1962.12},
doi = {10.1109/FOCS.1962.12},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/focs/McCluskey62.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ifip/McCluskey62,
author = {Edward J. McCluskey},
title = {Fundamental Mode and Pulse Mode Operations of Sequential Circuits},
booktitle = {Information Processing, Proceedings of the 2nd {IFIP} Congress 1962,
Munich, Germany, August 27 - September 1, 1962},
pages = {725--730},
publisher = {North-Holland},
year = {1962},
timestamp = {Fri, 26 Jul 2019 12:25:11 +0200},
biburl = {https://dblp.org/rec/conf/ifip/McCluskey62.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/focs/McCluskey61,
author = {Edward J. McCluskey},
title = {Minimal sums for Boolean functions having many unspecified fundamental
products},
booktitle = {2nd Annual Symposium on Switching Circuit Theory and Logical Design,
Detroit, Michigan, USA, October 17-20, 1961},
pages = {10--17},
publisher = {{IEEE} Computer Society},
year = {1961},
url = {https://doi.org/10.1109/FOCS.1961.21},
doi = {10.1109/FOCS.1961.21},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/focs/McCluskey61.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aieeire/DolottaM60,
author = {Ted A. Dolotta and
Edward Joseph McCluskey Jr.},
editor = {R. M. Bennett},
title = {Encoding of incompletely specified Boolean matrices},
booktitle = {Papers presented at the 1960 western joint {IRE-AIEE-ACM} computer
conference, {IRE-AIEE-ACM} 1960 (Western), San Francisco, California,
USA, May 3-5, 1960},
pages = {231--238},
publisher = {{ACM}},
year = {1960},
url = {https://doi.org/10.1145/1460361.1460393},
doi = {10.1145/1460361.1460393},
timestamp = {Fri, 23 Apr 2021 17:08:37 +0200},
biburl = {https://dblp.org/rec/conf/aieeire/DolottaM60.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/McCluskeyU59,
author = {Edward Joseph McCluskey Jr. and
Stephen H. Unger},
title = {A Note on the Number of Internal Variable Assignments for Sequential
Switching Circuits},
journal = {{IRE} Trans. Electron. Comput.},
volume = {8},
number = {4},
pages = {439--440},
year = {1959},
url = {https://doi.org/10.1109/TEC.1959.5222055},
doi = {10.1109/TEC.1959.5222055},
timestamp = {Mon, 25 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/McCluskeyU59.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/McCluskey58,
author = {Edward J. McCluskey},
title = {Iterative Combinational Switching Networks{\unicode{2014}} General
Design Considerations},
journal = {{IRE} Trans. Electron. Comput.},
volume = {7},
number = {4},
pages = {285--291},
year = {1958},
url = {https://doi.org/10.1109/TEC.1958.5222661},
doi = {10.1109/TEC.1958.5222661},
timestamp = {Mon, 25 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/McCluskey58.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tit/McCluskey57,
author = {Edward J. McCluskey},
title = {Comments on Determination of Redundancies in a Set of Patterns},
journal = {{IRE} Trans. Inf. Theory},
volume = {3},
number = {2},
pages = {167},
year = {1957},
url = {https://doi.org/10.1109/TIT.1957.1057403},
doi = {10.1109/TIT.1957.1057403},
timestamp = {Mon, 18 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tit/McCluskey57.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
last updated on 2023-12-18 20:27 CET by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
