BibTeX records: Nobuto Ono

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@inproceedings{DBLP:conf/icphys/IshibashiTMOY19,
  author    = {Koichiro Ishibashi and
               Ryohei Takitoge and
               Duangchak Manyvone and
               Nobuto Ono and
               Shigeya Yamaguchi},
  title     = {Long Battery Life IoT Sensing by Beat Sensors},
  booktitle = {{IEEE} International Conference on Industrial Cyber Physical Systems,
               {ICPS} 2019, Taipei, Taiwan, May 6-9, 2019},
  pages     = {430--435},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/ICPHYS.2019.8780159},
  doi       = {10.1109/ICPHYS.2019.8780159},
  timestamp = {Wed, 16 Oct 2019 14:14:56 +0200},
  biburl    = {https://dblp.org/rec/conf/icphys/IshibashiTMOY19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/OkumuraKMKHTNOSS09,
  author    = {Takaaki Okumura and
               Atsushi Kurokawa and
               Hiroo Masuda and
               Toshiki Kanamoto and
               Masanori Hashimoto and
               Hiroshi Takafuji and
               Hidenari Nakashima and
               Nobuto Ono and
               Tsuyoshi Sakata and
               Takashi Sato},
  title     = {Improvement in Computational Accuracy of Output Transition Time Variation
               Considering Threshold Voltage Variations},
  journal   = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
  volume    = {92-A},
  number    = {4},
  pages     = {990--997},
  year      = {2009},
  url       = {https://doi.org/10.1587/transfun.E92.A.990},
  doi       = {10.1587/transfun.E92.A.990},
  timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/ieicet/OkumuraKMKHTNOSS09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/KobayashiOSINOH07,
  author    = {Hiroyuki Kobayashi and
               Nobuto Ono and
               Takashi Sato and
               Jiro Iwai and
               Hidenari Nakashima and
               Takaaki Okumura and
               Masanori Hashimoto},
  title     = {Proposal of Metrics for {SSTA} Accuracy Evaluation},
  journal   = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
  volume    = {90-A},
  number    = {4},
  pages     = {808--814},
  year      = {2007},
  url       = {https://doi.org/10.1093/ietfec/e90-a.4.808},
  doi       = {10.1093/ietfec/e90-a.4.808},
  timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/ieicet/KobayashiOSINOH07.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/SatoIOH06,
  author    = {Takashi Sato and
               Junji Ichimiya and
               Nobuto Ono and
               Masanori Hashimoto},
  title     = {On-Chip Thermal Gradient Analysis Considering Interdependence between
               Leakage Power and Temperature},
  journal   = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
  volume    = {89-A},
  number    = {12},
  pages     = {3491--3499},
  year      = {2006},
  url       = {https://doi.org/10.1093/ietfec/e89-a.12.3491},
  doi       = {10.1093/ietfec/e89-a.12.3491},
  timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/ieicet/SatoIOH06.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/NojimaONFOK06,
  author    = {Takashi Nojima and
               Nobuto Ono and
               Shigetoshi Nakatake and
               Toru Fujimura and
               Koji Okazaki and
               Yoji Kajitani},
  title     = {Adaptive Porting of Analog IPs with Reusable Conservative Properties},
  booktitle = {2006 {IEEE} Computer Society Annual Symposium on {VLSI} {(ISVLSI}
               2006), 2-3 March 2006, Karlsruhe, Germany},
  pages     = {18--23},
  publisher = {{IEEE} Computer Society},
  year      = {2006},
  url       = {https://doi.org/10.1109/ISVLSI.2006.15},
  doi       = {10.1109/ISVLSI.2006.15},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/isvlsi/NojimaONFOK06.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/SatoIOHH05,
  author    = {Takashi Sato and
               Junji Ichimiya and
               Nobuto Ono and
               Koutaro Hachiya and
               Masanori Hashimoto},
  title     = {On-Chip Thermal Gradient Analysis and Temperature Flattening for SoC
               Design},
  journal   = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
  volume    = {88-A},
  number    = {12},
  pages     = {3382--3389},
  year      = {2005},
  url       = {https://doi.org/10.1093/ietfec/e88-a.12.3382},
  doi       = {10.1093/ietfec/e88-a.12.3382},
  timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/ieicet/SatoIOHH05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/SatoIOHH05,
  author    = {Takashi Sato and
               Junji Ichimiya and
               Nobuto Ono and
               Koutaro Hachiya and
               Masanori Hashimoto},
  editor    = {Tingao Tang},
  title     = {On-chip thermal gradient analysis and temperature flattening for SoC
               design},
  booktitle = {Proceedings of the 2005 Conference on Asia South Pacific Design Automation,
               {ASP-DAC} 2005, Shanghai, China, January 18-21, 2005},
  pages     = {1074--1077},
  publisher = {{ACM} Press},
  year      = {2005},
  url       = {https://doi.org/10.1145/1120725.1120827},
  doi       = {10.1145/1120725.1120827},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/aspdac/SatoIOHH05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/KurokawaYOKIM05,
  author    = {Atsushi Kurokawa and
               Masaharu Yamamoto and
               Nobuto Ono and
               Tetsuro Kage and
               Yasuaki Inoue and
               Hiroo Masuda},
  title     = {Capacitance and Yield Evaluations Using a 90-nm Process Technology
               Based on the Dense Power-Ground Interconnect Architecture},
  booktitle = {6th International Symposium on Quality of Electronic Design {(ISQED}
               2005), 21-23 March 2005, San Jose, CA, {USA}},
  pages     = {153--158},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://doi.org/10.1109/ISQED.2005.29},
  doi       = {10.1109/ISQED.2005.29},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/conf/isqed/KurokawaYOKIM05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/KurokawaOKM04,
  author    = {Atsushi Kurokawa and
               Nobuto Ono and
               Tetsuro Kage and
               Hiroo Masuda},
  editor    = {Masaharu Imai},
  title     = {{DEPOGIT:} dense power-ground interconnect architecture for physical
               design integrity},
  booktitle = {Proceedings of the 2004 Conference on Asia South Pacific Design Automation:
               Electronic Design and Solution Fair 2004, Yokohama, Japan, January
               27-30, 2004},
  pages     = {517--522},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {http://doi.ieeecomputersociety.org/10.1109/ASPDAC.2004.76},
  doi       = {10.1109/ASPDAC.2004.76},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/aspdac/KurokawaOKM04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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