BibTeX records: Alberto Pagani

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@inproceedings{DBLP:conf/itc/BordognaBPS22,
  author       = {Lorella Bordogna and
                  Fabio Brembilla and
                  Alberto Pagani and
                  Marco Spinetta},
  title        = {New R{\&}R Methodology in Semiconductor Manufacturing Electrical
                  Testing},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {410--419},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00048},
  doi          = {10.1109/ITC50671.2022.00048},
  timestamp    = {Thu, 05 Jan 2023 13:13:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BordognaBPS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/jolpe/AppelloBBCCMPPR18,
  author       = {Davide Appello and
                  Paolo Bernardi and
                  Conrad Bugeja and
                  Riccardo Cantoro and
                  Andrea Colazzo and
                  Alessandro Motta and
                  Alberto Pagani and
                  Giorgio Pollaccia and
                  Marco Restifo and
                  Ernesto S{\'{a}}nchez and
                  Federico Venini},
  title        = {An Evolutionary Algorithm Approach to Stress Program Generation During
                  Burn-In},
  journal      = {J. Low Power Electron.},
  volume       = {14},
  number       = {1},
  pages        = {86--98},
  year         = {2018},
  url          = {https://doi.org/10.1166/jolpe.2018.1542},
  doi          = {10.1166/JOLPE.2018.1542},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/jolpe/AppelloBBCCMPPR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcas/FinocchiaroGMPR18,
  author       = {Alessandro Finocchiaro and
                  Giovanni Girlando and
                  Alessandro Motta and
                  Alberto Pagani and
                  Egidio Ragonese and
                  Giuseppe Palmisano},
  title        = {Wafer-Level Contactless Testing Based on {UHF} {RFID} Tags With Post-Process
                  On-Chip Antennas},
  journal      = {{IEEE} Trans. Circuits Syst. {II} Express Briefs},
  volume       = {65-II},
  number       = {10},
  pages        = {1355--1359},
  year         = {2018},
  url          = {https://doi.org/10.1109/TCSII.2018.2852949},
  doi          = {10.1109/TCSII.2018.2852949},
  timestamp    = {Wed, 27 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcas/FinocchiaroGMPR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/applepies/FinocchiaroGMPP18,
  author       = {Alessandro Finocchiaro and
                  Giovanni Girlando and
                  Alessandro Motta and
                  Alberto Pagani and
                  Giuseppe Palmisano},
  editor       = {Sergio Saponara and
                  Alessandro De Gloria},
  title        = {Main Parasitic Effects in Contactless Wafer Testing},
  booktitle    = {Applications in Electronics Pervading Industry, Environment and Society,
                  {APPLEPIES} 2018},
  pages        = {69--76},
  publisher    = {Springer},
  year         = {2018},
  url          = {https://doi.org/10.1007/978-3-030-11973-7\_9},
  doi          = {10.1007/978-3-030-11973-7\_9},
  timestamp    = {Thu, 11 Jul 2019 17:59:25 +0200},
  biburl       = {https://dblp.org/rec/conf/applepies/FinocchiaroGMPP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dtis/FinocchiaroGMPP18,
  author       = {Alessandro Finocchiaro and
                  Giovanni Girlando and
                  Alessandro Motta and
                  Alberto Pagani and
                  Giuseppe Palmisano},
  title        = {A fully contactless wafer-level testing for {UHF} {RFID} tag with
                  on-chip antenna},
  booktitle    = {13th International Conference on Design {\&} Technology of Integrated
                  Systems In Nanoscale Era, {DTIS} 2018, Taormina, Italy, April 9-12,
                  2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/DTIS.2018.8368554},
  doi          = {10.1109/DTIS.2018.8368554},
  timestamp    = {Wed, 16 Oct 2019 14:14:56 +0200},
  biburl       = {https://dblp.org/rec/conf/dtis/FinocchiaroGMPP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/AppelloBGMPPRRR17,
  author       = {Davide Appello and
                  Paolo Bernardi and
                  G. Giacopelli and
                  Alessandro Motta and
                  Alberto Pagani and
                  Giorgio Pollaccia and
                  C. Rabbi and
                  Marco Restifo and
                  P. Ruberg and
                  Ernesto S{\'{a}}nchez and
                  C. M. Villa and
                  Federico Venini},
  editor       = {David Atienza and
                  Giorgio Di Natale},
  title        = {A comprehensive methodology for stress procedures evaluation and comparison
                  for Burn-In of automotive SoC},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages        = {646--649},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.23919/DATE.2017.7927068},
  doi          = {10.23919/DATE.2017.7927068},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/date/AppelloBGMPPRRR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/AltBBCKLMMPPRS16,
  author       = {Juergen Alt and
                  Paolo Bernardi and
                  Alberto Bosio and
                  Riccardo Cantoro and
                  Hans G. Kerkhoff and
                  Andreas Leininger and
                  Wolfgang Molzer and
                  Alessandro Motta and
                  Christian Pacha and
                  Alberto Pagani and
                  Alireza Rohani and
                  R. Strasser},
  title        = {Thermal issues in test: An overview of the significant aspects and
                  industrial practice},
  booktitle    = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA,
                  April 25-27, 2016},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2016},
  url          = {https://doi.org/10.1109/VTS.2016.7477278},
  doi          = {10.1109/VTS.2016.7477278},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/AltBBCKLMMPPRS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ReverdyMFPGCAIG14,
  author       = {Antoine Reverdy and
                  M. Marchetti and
                  Allesandra Fudoli and
                  Alberto Pagani and
                  V. Goubier and
                  M. Cason and
                  Jesse Alton and
                  Martin Igarashi and
                  G. Gibbons},
  title        = {Electro Optical Terahertz Pulse Reflectometry, a non destructive technique
                  to localize defects on various type of package},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {2075--2080},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.036},
  doi          = {10.1016/J.MICROREL.2014.07.036},
  timestamp    = {Wed, 05 May 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ReverdyMFPGCAIG14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}