BibTeX records: Ankan K. Pramanick

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@inproceedings{DBLP:conf/itc/AdachiPE05,
  author       = {Toshiaki Adachi and
                  Ankan K. Pramanick and
                  Mark Elston},
  title        = {Parallel, multi-DUT testing in an open architecture test system},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {9},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1584053},
  doi          = {10.1109/TEST.2005.1584053},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/AdachiPE05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/ParnasPEA04,
  author       = {Bruce R. Parnas and
                  Ankan K. Pramanick and
                  Mark Elston and
                  Toshiaki Adachi},
  title        = {Software development for an open architecture test system},
  booktitle    = {9th European Test Symposium, {ETS} 2004, Ajaccio, France, May 23-26,
                  2004},
  pages        = {38--43},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/ETSYM.2004.1347597},
  doi          = {10.1109/ETSYM.2004.1347597},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/ParnasPEA04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/PramanickKEASP04,
  author       = {Ankan K. Pramanick and
                  Ramachandran Krishnaswamy and
                  Mark Elston and
                  Toshiaki Adachi and
                  Harsanjeet Singh and
                  Bruce R. Parnas},
  title        = {Test Programming Environment in a Modular, Open Architecture Test
                  System},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {413--422},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386977},
  doi          = {10.1109/TEST.2004.1386977},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/PramanickKEASP04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/PramanickR97,
  author       = {Ankan K. Pramanick and
                  Sudhakar M. Reddy},
  title        = {On the fault coverage of gate delay fault detecting tests},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {16},
  number       = {1},
  pages        = {78--94},
  year         = {1997},
  url          = {https://doi.org/10.1109/43.559333},
  doi          = {10.1109/43.559333},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/PramanickR97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/PramanickR95,
  author       = {Ankan K. Pramanick and
                  Sudhakar M. Reddy},
  title        = {Efficient multiple path propagating tests for delay faults},
  journal      = {J. Electron. Test.},
  volume       = {7},
  number       = {3},
  pages        = {157--172},
  year         = {1995},
  url          = {https://doi.org/10.1007/BF00995311},
  doi          = {10.1007/BF00995311},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/PramanickR95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/PramanickP95,
  author       = {Ira Pramanick and
                  Ankan K. Pramanick},
  title        = {Parallel Delay Fault Coverage and Test Quality Evaluation},
  booktitle    = {Proceedings {IEEE} International Test Conference 1995, Driving Down
                  the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages        = {113--122},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/TEST.1995.529824},
  doi          = {10.1109/TEST.1995.529824},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/PramanickP95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/hpdc/PramanickP94,
  author       = {Ira Pramanick and
                  Ankan K. Pramanick},
  title        = {Distributed Solutions to the Delay Fault Test Quality Evaluation Problem},
  booktitle    = {Proceedings of the Third International Symposium on High Performance
                  Distributed Computing, {HPDC} '94, San Francisco, CA, USA, April 2-5,
                  1994},
  pages        = {177--185},
  publisher    = {{IEEE}},
  year         = {1994},
  url          = {https://doi.org/10.1109/HPDC.1994.340246},
  doi          = {10.1109/HPDC.1994.340246},
  timestamp    = {Wed, 16 Oct 2019 14:14:50 +0200},
  biburl       = {https://dblp.org/rec/conf/hpdc/PramanickP94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/PramanickK93,
  author       = {Ankan K. Pramanick and
                  Sandip Kundu},
  title        = {Design of Scan-Based Path-Delay-Testable Sequential Circuits},
  booktitle    = {Proceedings {IEEE} International Test Conference 1993, Designing,
                  Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
                  17-21, 1993},
  pages        = {962--971},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/TEST.1993.470603},
  doi          = {10.1109/TEST.1993.470603},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/PramanickK93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/PramanickR93,
  author       = {Ankan K. Pramanick and
                  Sudhakar M. Reddy},
  title        = {On Unified Delay Fault Testing},
  booktitle    = {Proceedings of the Sixth International Conference on {VLSI} Design,
                  {VLSI} Design 1993, Bombay, India, January 3-6, 1993},
  pages        = {265--268},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/ICVD.1993.669694},
  doi          = {10.1109/ICVD.1993.669694},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/PramanickR93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/KunduP93,
  author       = {Sandip Kundu and
                  Ankan K. Pramanick},
  title        = {Testability preserving Boolean transforms for logic synthesis},
  booktitle    = {11th {IEEE} {VLSI} Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993,
                  Atlantic City, NJ, {USA}},
  pages        = {131--138},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/VTEST.1993.313336},
  doi          = {10.1109/VTEST.1993.313336},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/KunduP93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/PramanickR91,
  author       = {Ankan K. Pramanick and
                  Sudhakar M. Reddy},
  title        = {On Multiple Path Propagating Tests for Path Delay Faults},
  booktitle    = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
                  Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages        = {393--402},
  publisher    = {{IEEE} Computer Society},
  year         = {1991},
  url          = {https://doi.org/10.1109/TEST.1991.519699},
  doi          = {10.1109/TEST.1991.519699},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/PramanickR91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/eurodac/PramanickR90,
  author       = {Ankan K. Pramanick and
                  Sudhakar M. Reddy},
  editor       = {Gordon Adshead and
                  Jochen A. G. Jess},
  title        = {On the fault coverage of delay fault detecting tests},
  booktitle    = {European Design Automation Conference, {EURO-DAC} 1990, Glasgow, Scotland,
                  UK, March 12-15, 1990},
  pages        = {334--338},
  publisher    = {{IEEE} Computer Society},
  year         = {1990},
  url          = {https://doi.org/10.1109/EDAC.1990.136669},
  doi          = {10.1109/EDAC.1990.136669},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/eurodac/PramanickR90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ftcs/PramanickR90,
  author       = {Ankan K. Pramanick and
                  Sudhakar M. Reddy},
  title        = {On the design of path delay fault testable combinational circuits},
  booktitle    = {Proceedings of the 20th International Symposium on Fault-Tolerant
                  Computing, {FTCS} 1990, Newcastle Upon Tyne, UK, 26-28 June, 1990},
  pages        = {374--381},
  publisher    = {{IEEE} Computer Society},
  year         = {1990},
  url          = {https://doi.org/10.1109/FTCS.1990.89391},
  doi          = {10.1109/FTCS.1990.89391},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/ftcs/PramanickR90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iccad/PramanickR89,
  author       = {Ankan K. Pramanick and
                  Sudhakar M. Reddy},
  title        = {On the computation of the ranges of detected delay fault sizes},
  booktitle    = {1989 {IEEE} International Conference on Computer-Aided Design, {ICCAD}
                  1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical
                  Papers},
  pages        = {126--129},
  publisher    = {{IEEE} Computer Society},
  year         = {1989},
  url          = {https://doi.org/10.1109/ICCAD.1989.76919},
  doi          = {10.1109/ICCAD.1989.76919},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iccad/PramanickR89.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/PramanickR88,
  author       = {Ankan K. Pramanick and
                  Sudhakar M. Reddy},
  title        = {On the Detection of Delay Faults},
  booktitle    = {Proceedings International Test Conference 1988, Washington, D.C.,
                  USA, September 1988},
  pages        = {845--856},
  publisher    = {{IEEE} Computer Society},
  year         = {1988},
  url          = {https://doi.org/10.1109/TEST.1988.207872},
  doi          = {10.1109/TEST.1988.207872},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/PramanickR88.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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