BibTeX records: Peter Sandborn

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@article{DBLP:journals/corr/abs-2307-12237,
  author       = {Ray Islam and
                  Peter Sandborn},
  title        = {Demonstration of a Response Time Based Remaining Useful Life {(RUL)}
                  Prediction for Software Systems},
  journal      = {CoRR},
  volume       = {abs/2307.12237},
  year         = {2023},
  url          = {https://doi.org/10.48550/arXiv.2307.12237},
  doi          = {10.48550/ARXIV.2307.12237},
  eprinttype    = {arXiv},
  eprint       = {2307.12237},
  timestamp    = {Tue, 01 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/corr/abs-2307-12237.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@book{DBLP:books/ws/SandbornL22,
  author       = {Peter Sandborn and
                  William Lucyshyn},
  title        = {System Sustainment - Acquisition and Engineering Processes for the
                  Sustainment of Critical and Legacy Systems},
  series       = {World Scientific Series on Emerging Technologies},
  volume       = {4},
  publisher    = {WorldScientific},
  year         = {2022},
  url          = {https://doi.org/10.1142/12860},
  doi          = {10.1142/12860},
  isbn         = {9789811256844},
  timestamp    = {Mon, 22 Apr 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/books/ws/SandbornL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangSPYW15,
  author       = {Moon{-}Hwan Chang and
                  Peter Sandborn and
                  Michael G. Pecht and
                  Winco K. C. Yung and
                  Wenbin Wang},
  title        = {A return on investment analysis of applying health monitoring to {LED}
                  lighting systems},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {3-4},
  pages        = {527--537},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.01.009},
  doi          = {10.1016/J.MICROREL.2015.01.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChangSPYW15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LillieSH15,
  author       = {Edwin Lillie and
                  Peter Sandborn and
                  David Humphrey},
  title        = {Assessing the value of a lead-free solder control plan using cost-based
                  {FMEA}},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {6},
  pages        = {969--979},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.02.022},
  doi          = {10.1016/J.MICROREL.2015.02.022},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LillieSH15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tem/SandbornP15,
  author       = {Peter A. Sandborn and
                  Varun J. Prabhakar},
  title        = {The Forecasting and Impact of the Loss of Critical Human Skills Necessary
                  for Supporting Legacy Systems},
  journal      = {{IEEE} Trans. Engineering Management},
  volume       = {62},
  number       = {3},
  pages        = {361--371},
  year         = {2015},
  url          = {https://doi.org/10.1109/TEM.2015.2438820},
  doi          = {10.1109/TEM.2015.2438820},
  timestamp    = {Wed, 04 Jul 2018 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tem/SandbornP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icphm/LeiSBKG15,
  author       = {Xin Lei and
                  Peter Sandborn and
                  Roozbeh Bakhshi and
                  Amir Kashani{-}Pour and
                  Navid Goudarzi},
  title        = {{PHM} based predictive maintenance optimization for offshore wind
                  farms},
  booktitle    = {2015 {IEEE} Conference on Prognostics and Health Management, {ICPHM}
                  2015, Austin, TX, USA, June 22-25, 2015},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ICPHM.2015.7245027},
  doi          = {10.1109/ICPHM.2015.7245027},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/icphm/LeiSBKG15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jcise/ZhengNTS13,
  author       = {Liyu Zheng and
                  Raymond Nelson and
                  Janis P. Terpenny and
                  Peter Sandborn},
  title        = {Ontology-Based Knowledge Representation for Obsolescence Forecasting},
  journal      = {J. Comput. Inf. Sci. Eng.},
  volume       = {13},
  number       = {1},
  year         = {2013},
  url          = {https://doi.org/10.1115/1.4023003},
  doi          = {10.1115/1.4023003},
  timestamp    = {Fri, 08 Jan 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/jcise/ZhengNTS13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ijcim/PrabhakarS12,
  author       = {Varun J. Prabhakar and
                  Peter Sandborn},
  title        = {A part total cost of ownership model for long life cycle electronic
                  systems},
  journal      = {Int. J. Comput. Integr. Manuf.},
  volume       = {25},
  number       = {4-5},
  pages        = {384--397},
  year         = {2012},
  url          = {https://doi.org/10.1080/0951192X.2010.531293},
  doi          = {10.1080/0951192X.2010.531293},
  timestamp    = {Mon, 11 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ijcim/PrabhakarS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/HaddadSP12,
  author       = {Gilbert Haddad and
                  Peter A. Sandborn and
                  Michael G. Pecht},
  title        = {An Options Approach for Decision Support of Systems With Prognostic
                  Capabilities},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {61},
  number       = {4},
  pages        = {872--883},
  year         = {2012},
  url          = {https://doi.org/10.1109/TR.2012.2220699},
  doi          = {10.1109/TR.2012.2220699},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/HaddadSP12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SandbornPA11,
  author       = {Peter Sandborn and
                  Varun J. Prabhakar and
                  O. Ahmad},
  title        = {Forecasting electronic part procurement lifetimes to enable the management
                  of {DMSMS} obsolescence},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {2},
  pages        = {392--399},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2010.08.005},
  doi          = {10.1016/J.MICROREL.2010.08.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SandbornPA11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tr/FeldmanJS09,
  author       = {Kiri Feldman and
                  Taoufik Jazouli and
                  Peter Sandborn},
  title        = {A Methodology for Determining the Return on Investment Associated
                  With Prognostics and Health Management},
  journal      = {{IEEE} Trans. Reliab.},
  volume       = {58},
  number       = {2},
  pages        = {305--316},
  year         = {2009},
  url          = {https://doi.org/10.1109/TR.2009.2020133},
  doi          = {10.1109/TR.2009.2020133},
  timestamp    = {Thu, 09 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tr/FeldmanJS09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SandbornP07,
  author       = {Peter Sandborn and
                  Michael G. Pecht},
  title        = {Introduction to special section on electronic systems prognostics
                  and health management},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {12},
  pages        = {1847--1848},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.03.004},
  doi          = {10.1016/J.MICROREL.2007.03.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SandbornP07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ScanffFGSGF07,
  author       = {E. Scanff and
                  K. L. Feldman and
                  S. Ghelam and
                  Peter Sandborn and
                  M. Glade and
                  B. Foucher},
  title        = {Life cycle cost impact of using prognostic health management {(PHM)}
                  for helicopter avionics},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {12},
  pages        = {1857--1864},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.02.014},
  doi          = {10.1016/J.MICROREL.2007.02.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ScanffFGSGF07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SandbornW07,
  author       = {Peter A. Sandborn and
                  Chris Wilkinson},
  title        = {A maintenance planning and business case development model for the
                  application of prognostics and health management {(PHM)} to electronic
                  systems},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {12},
  pages        = {1889--1901},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.02.016},
  doi          = {10.1016/J.MICROREL.2007.02.016},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SandbornW07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ShiS06,
  author       = {Zhen Shi and
                  Peter Sandborn},
  title        = {Optimization of Test/Diagnosis/Rework Location(s) and Characteristics
                  in Electronic System Assembly},
  journal      = {J. Electron. Test.},
  volume       = {22},
  number       = {1},
  pages        = {49--60},
  year         = {2006},
  url          = {https://doi.org/10.1007/s10836-006-6593-3},
  doi          = {10.1007/S10836-006-6593-3},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ShiS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ress/KleynerS05,
  author       = {Andre Kleyner and
                  Peter Sandborn},
  title        = {A warranty forecasting model based on piecewise statistical distributions
                  and stochastic simulation},
  journal      = {Reliab. Eng. Syst. Saf.},
  volume       = {88},
  number       = {3},
  pages        = {207--214},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.ress.2004.07.016},
  doi          = {10.1016/J.RESS.2004.07.016},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ress/KleynerS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShiS03,
  author       = {Zhen Shi and
                  Peter Sandborn},
  title        = {Optimization of Test/Diagnosis/Rework Location(s) and Characteristics
                  in Electronic Systems Assembly Using Real-Coded Genetic Algorithms},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {937--946},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1271080},
  doi          = {10.1109/TEST.2003.1271080},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ShiS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/RaganSS02,
  author       = {Daniel Ragan and
                  Peter Sandborn and
                  Paul Stoaks},
  title        = {A detailed cost model for concurrent use with hardware/software co-design},
  booktitle    = {Proceedings of the 39th Design Automation Conference, {DAC} 2002,
                  New Orleans, LA, USA, June 10-14, 2002},
  pages        = {269--274},
  publisher    = {{ACM}},
  year         = {2002},
  url          = {https://doi.org/10.1145/513918.513989},
  doi          = {10.1145/513918.513989},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/RaganSS02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RamakrishnanSP01,
  author       = {Bharatwaj Ramakrishnan and
                  Peter Sandborn and
                  Michael G. Pecht},
  title        = {Process capability indices and product reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {12},
  pages        = {2067--2070},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00227-X},
  doi          = {10.1016/S0026-2714(01)00227-X},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RamakrishnanSP01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ThiagarajanTrichySRS01,
  author       = {Thiagarajan Trichy and
                  Peter Sandborn and
                  Ravi Raghavan and
                  Shubhada Sahasrabudhe},
  title        = {A new test/diagnosis/rework model for use in technical cost modeling
                  of electronic systems assembly},
  booktitle    = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
                  MD, USA, 30 October - 1 November 2001},
  pages        = {1108--1117},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/TEST.2001.966737},
  doi          = {10.1109/TEST.2001.966737},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ThiagarajanTrichySRS01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/SandbornV98,
  author       = {Peter Sandborn and
                  Mike Vertal},
  title        = {Analyzing Packaging Trade-Offs During System Design},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {15},
  number       = {3},
  pages        = {10--19},
  year         = {1998},
  url          = {https://doi.org/10.1109/54.706028},
  doi          = {10.1109/54.706028},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/SandbornV98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MurphyAS97,
  author       = {Cynthia F. Murphy and
                  Magdy S. Abadir and
                  Peter Sandborn},
  title        = {Economic Analysis of Test Process Flows for Multichip Modules Using
                  Known Good Die},
  journal      = {J. Electron. Test.},
  volume       = {10},
  number       = {1-2},
  pages        = {151--166},
  year         = {1997},
  url          = {https://doi.org/10.1023/A:1008239018655},
  doi          = {10.1023/A:1008239018655},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/MurphyAS97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AbadirPBSD94,
  author       = {Magdy S. Abadir and
                  Ashish R. Parikh and
                  Linda Bal and
                  Peter Sandborn and
                  Ken Drake},
  title        = {Analyzing Multichip Module Testing Strategies},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {11},
  number       = {1},
  pages        = {40--52},
  year         = {1994},
  url          = {https://doi.org/10.1109/54.262321},
  doi          = {10.1109/54.262321},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/AbadirPBSD94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AbadirPBSM94,
  author       = {Magdy S. Abadir and
                  Ashish Parikh and
                  Linda Bal and
                  Peter Sandborn and
                  Cynthia F. Murphy},
  title        = {High Level Test Economics Advisor (Hi-TEA)},
  journal      = {J. Electron. Test.},
  volume       = {5},
  number       = {2-3},
  pages        = {195--206},
  year         = {1994},
  url          = {https://doi.org/10.1007/BF00972079},
  doi          = {10.1007/BF00972079},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/AbadirPBSM94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SandbornGDABP94,
  author       = {Peter Sandborn and
                  Rajarshi Ghosh and
                  Ken Drake and
                  Magdy S. Abadir and
                  Linda Bal and
                  Ashish Parikh},
  title        = {Multichip systems trade-off analysis tool},
  journal      = {J. Electron. Test.},
  volume       = {5},
  number       = {2-3},
  pages        = {207--218},
  year         = {1994},
  url          = {https://doi.org/10.1007/BF00972080},
  doi          = {10.1007/BF00972080},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/SandbornGDABP94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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