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ORCIDBibTeX records: Michihiro Shintani
@article{DBLP:journals/ieiceta/NagaoNKEIS24,
author = {Takuma Nagao and
Tomoki Nakamura and
Masuo Kajiyama and
Makoto Eiki and
Michiko Inoue and
Michihiro Shintani},
title = {Wafer-Level Characteristic Variation Modeling Considering Systematic
Discontinuous Effects},
journal = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {107},
number = {1},
pages = {96--104},
year = {2024},
url = {https://doi.org/10.1587/transfun.2023kep0010},
doi = {10.1587/TRANSFUN.2023KEP0010},
timestamp = {Thu, 01 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieiceta/NagaoNKEIS24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/NagaoNKEIS23,
author = {Takuma Nagao and
Tomoki Nakamura and
Masuo Kajiyama and
Makoto Eiki and
Michiko Inoue and
Michihiro Shintani},
editor = {Atsushi Takahashi},
title = {Wafer-Level Characteristic Variation Modeling Considering Systematic
Discontinuous Effects},
booktitle = {Proceedings of the 28th Asia and South Pacific Design Automation Conference,
{ASPDAC} 2023, Tokyo, Japan, January 16-19, 2023},
pages = {442--448},
publisher = {{ACM}},
year = {2023},
url = {https://doi.org/10.1145/3566097.3567915},
doi = {10.1145/3566097.3567915},
timestamp = {Mon, 26 Jun 2023 20:46:40 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/NagaoNKEIS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EikiNKISS23,
author = {Makoto Eiki and
Tomoki Nakamura and
Masuo Kajiyama and
Michiko Inoue and
Takashi Sato and
Michihiro Shintani},
title = {Improving Efficiency and Robustness of Gaussian Process Based Outlier
Detection via Ensemble Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {132--140},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00029},
doi = {10.1109/ITC51656.2023.00029},
timestamp = {Tue, 09 Jan 2024 17:03:11 +0100},
biburl = {https://dblp.org/rec/conf/itc/EikiNKISS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/TakayaS23,
author = {Ayano Takaya and
Michihiro Shintani},
title = {Feasibility Study of Incremental Neural Network Based Test Escape
Detection by Introducing Transfer Learning Technique},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
Japan, September 12-14, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301182},
doi = {10.1109/ITC-ASIA58802.2023.10301182},
timestamp = {Wed, 15 Nov 2023 09:43:46 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/TakayaS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MoritaBSS22,
author = {Shumpei Morita and
Song Bian and
Michihiro Shintani and
Takashi Sato},
title = {Efficient Analysis for Mitigation of Workload-Dependent Aging Degradation},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {41},
number = {12},
pages = {5515--5525},
year = {2022},
url = {https://doi.org/10.1109/TCAD.2022.3149856},
doi = {10.1109/TCAD.2022.3149856},
timestamp = {Mon, 05 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/MoritaBSS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EikiNKIS22,
author = {Makoto Eiki and
Tomoki Nakamura and
Masuo Kajiyama and
Michiko Inoue and
Michihiro Shintani},
title = {Accurate Failure Rate Prediction Based on Gaussian Process Using {WAT}
Data},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {573--577},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00075},
doi = {10.1109/ITC50671.2022.00075},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EikiNKIS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2201-10126,
author = {Kyohei Shimozato and
Michihiro Shintani and
Takashi Sato},
title = {Adaptive Outlier Detection for Power MOSFETs Based on Gaussian Process
Regression},
journal = {CoRR},
volume = {abs/2201.10126},
year = {2022},
url = {https://arxiv.org/abs/2201.10126},
eprinttype = {arXiv},
eprint = {2201.10126},
timestamp = {Tue, 01 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-2201-10126.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2204-02159,
author = {Yuya Isaka and
Michihiro Shintani and
Foisal Ahmed and
Michiko Inoue},
title = {Systematic Unsupervised Recycled Field-Programmable Gate Array Detection},
journal = {CoRR},
volume = {abs/2204.02159},
year = {2022},
url = {https://doi.org/10.48550/arXiv.2204.02159},
doi = {10.48550/ARXIV.2204.02159},
eprinttype = {arXiv},
eprint = {2204.02159},
timestamp = {Wed, 06 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/corr/abs-2204-02159.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computers/MianSI21,
author = {Riaz{-}ul{-}haque Mian and
Michihiro Shintani and
Michiko Inoue},
title = {Hardware-Software Co-Design for Decimal Multiplication},
journal = {Comput.},
volume = {10},
number = {2},
pages = {17},
year = {2021},
url = {https://doi.org/10.3390/computers10020017},
doi = {10.3390/COMPUTERS10020017},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computers/MianSI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/AhmedSI21,
author = {Foisal Ahmed and
Michihiro Shintani and
Michiko Inoue},
title = {Accurate Recycled {FPGA} Detection Using an Exhaustive-Fingerprinting
Technique Assisted by {WID} Process Variation Modeling},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {40},
number = {8},
pages = {1626--1639},
year = {2021},
url = {https://doi.org/10.1109/TCAD.2020.3023684},
doi = {10.1109/TCAD.2020.3023684},
timestamp = {Thu, 29 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/AhmedSI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShintaniII21,
author = {Michihiro Shintani and
Mamoru Ishizaka and
Michiko Inoue},
title = {Robust Fault-Tolerant Design Based on Checksum and On-Line Testing
for Memristor Neural Network},
booktitle = {30th {IEEE} Asian Test Symposium, {ATS} 2021, Matsuyama, Ehime, Japan,
November 22-25, 2021},
pages = {25--30},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ATS52891.2021.00017},
doi = {10.1109/ATS52891.2021.00017},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShintaniII21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/IsakaASI21,
author = {Yuya Isaka and
Foisal Ahmed and
Michihiro Shintani and
Michiko Inoue},
title = {Unsupervised Recycled {FPGA} Detection Based on Direct Density Ratio
Estimation},
booktitle = {27th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2021, Torino, Italy, June 28-30, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IOLTS52814.2021.9486698},
doi = {10.1109/IOLTS52814.2021.9486698},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/IsakaASI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShintaniMINKE21,
author = {Michihiro Shintani and
Riaz{-}ul{-}haque Mian and
Michiko Inoue and
Tomoki Nakamura and
Masuo Kajiyama and
Makoto Eiki},
title = {Wafer-level Variation Modeling for Multi-site {RF} {IC} Testing via
Hierarchical Gaussian Process},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {103--112},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00018},
doi = {10.1109/ITC50571.2021.00018},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShintaniMINKE21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AhmedSI21,
author = {Foisal Ahmed and
Michihiro Shintani and
Michiko Inoue},
title = {Study on High-Accuracy and Low-Cost Recycled {FPGA} Detection},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {133--142},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00021},
doi = {10.1109/ITC50571.2021.00021},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AhmedSI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2110-15048,
author = {Michihiro Shintani and
Aoi Ueda and
Takashi Sato},
title = {Accelerating Parameter Extraction of Power {MOSFET} Models Using Automatic
Differentiation},
journal = {CoRR},
volume = {abs/2110.15048},
year = {2021},
url = {https://arxiv.org/abs/2110.15048},
eprinttype = {arXiv},
eprint = {2110.15048},
timestamp = {Tue, 02 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-2110-15048.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2111-01369,
author = {Michihiro Shintani and
Riaz{-}ul{-}haque Mian and
Tomoki Nakamura and
Masuo Kajiyama and
Makoto Eiki and
Michiko Inoue},
title = {Wafer-level Variation Modeling for Multi-site {RF} {IC} Testing via
Hierarchical Gaussian Process},
journal = {CoRR},
volume = {abs/2111.01369},
year = {2021},
url = {https://arxiv.org/abs/2111.01369},
eprinttype = {arXiv},
eprint = {2111.01369},
timestamp = {Mon, 08 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-2111-01369.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/IshizakaSI20,
author = {Mamoru Ishizaka and
Michihiro Shintani and
Michiko Inoue},
title = {Area-Efficient and Reliable Error Correcting Code Circuit Based on
Hybrid CMOS/Memristor Circuit},
journal = {J. Electron. Test.},
volume = {36},
number = {4},
pages = {537--546},
year = {2020},
url = {https://doi.org/10.1007/s10836-020-05892-3},
doi = {10.1007/S10836-020-05892-3},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/IshizakaSI20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieiceta/AhmedSI20,
author = {Foisal Ahmed and
Michihiro Shintani and
Michiko Inoue},
title = {Cost-Efficient Recycled {FPGA} Detection through Statistical Performance
Characterization Framework},
journal = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {103-A},
number = {9},
pages = {1045--1053},
year = {2020},
url = {https://doi.org/10.1587/transfun.2019KEP0014},
doi = {10.1587/TRANSFUN.2019KEP0014},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieiceta/AhmedSI20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NakamuraKYNSS20,
author = {Yohei Nakamura and
Naotaka Kuroda and
Atsushi Yamaguchi and
Ken Nakahara and
Michihiro Shintani and
Takashi Sato},
title = {Influence of Device Parameter Variability on Current Sharing of Parallel-Connected
SiC MOSFETs},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301592},
doi = {10.1109/ATS49688.2020.9301592},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NakamuraKYNSS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShintaniMI20,
author = {Michihiro Shintani and
Tomoki Mino and
Michiko Inoue},
title = {{LBIST-PUF:} An {LBIST} Scheme Towards Efficient Challenge-Response
Pairs Collection and Machine-Learning Attack Tolerance Improvement},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301590},
doi = {10.1109/ATS49688.2020.9301590},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShintaniMI20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/UedaSIS20,
author = {Aoi Ueda and
Michihiro Shintani and
Michiko Inoue and
Takashi Sato},
title = {Measurement of BTI-induced Threshold Voltage Shift for Power MOSFETs
under Switching Operation},
booktitle = {29th {IEEE} Asian Test Symposium, {ATS} 2020, Penang, Malaysia, November
23-26, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ATS49688.2020.9301598},
doi = {10.1109/ATS49688.2020.9301598},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/UedaSIS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/corr/abs-2003-05315,
author = {Riaz{-}ul{-}haque Mian and
Michihiro Shintani and
Michiko Inoue},
title = {Cycle-Accurate Evaluation of Software-Hardware Co-Design of Decimal
Computation in {RISC-V} Ecosystem},
journal = {CoRR},
volume = {abs/2003.05315},
year = {2020},
url = {https://arxiv.org/abs/2003.05315},
eprinttype = {arXiv},
eprint = {2003.05315},
timestamp = {Tue, 17 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/corr/abs-2003-05315.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/AhmedSI19,
author = {Foisal Ahmed and
Michihiro Shintani and
Michiko Inoue},
title = {Feature Engineering for Recycled {FPGA} Detection Based on {WID} Variation
Modeling},
booktitle = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
May 27-31, 2019},
pages = {1--2},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ETS.2019.8791542},
doi = {10.1109/ETS.2019.8791542},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/AhmedSI19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/AhmedSI19,
author = {Foisal Ahmed and
Michihiro Shintani and
Michiko Inoue},
title = {Low Cost Recycled {FPGA} Detection Using Virtual Probe Technique},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2019, Tokyo,
Japan, September 3-5, 2019},
pages = {103--108},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC-Asia.2019.00031},
doi = {10.1109/ITC-ASIA.2019.00031},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/AhmedSI19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/socc/MianSI19,
author = {Riaz{-}ul{-}haque Mian and
Michihiro Shintani and
Michiko Inoue},
title = {Cycle-Accurate Evaluation of Software-Hardware Co-Design of Decimal
Computation in {RISC-V} Ecosystem},
booktitle = {32nd {IEEE} International System-on-Chip Conference, {SOCC} 2019,
Singapore, September 3-6, 2019},
pages = {412--417},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/SOCC46988.2019.1570559752},
doi = {10.1109/SOCC46988.2019.1570559752},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/socc/MianSI19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/apccas/Riaz-ul-haqueSI18,
author = {Mian Riaz{-}ul{-}haque and
Michihiro Shintani and
Michiko Inoue},
title = {Decimal Multiplication Using Combination of Software and Hardware},
booktitle = {2018 {IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS}
2018, Chengdu, China, October 26-30, 2018},
pages = {239--242},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/APCCAS.2018.8605711},
doi = {10.1109/APCCAS.2018.8605711},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/apccas/Riaz-ul-haqueSI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/MoritaBSHS18,
author = {Shumpei Morita and
Song Bian and
Michihiro Shintani and
Masayuki Hiromoto and
Takashi Sato},
editor = {Youngsoo Shin},
title = {Efficient worst-case timing analysis of critical-path delay under
workload-dependent aging degradation},
booktitle = {23rd Asia and South Pacific Design Automation Conference, {ASP-DAC}
2018, Jeju, Korea (South), January 22-25, 2018},
pages = {631--636},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ASPDAC.2018.8297393},
doi = {10.1109/ASPDAC.2018.8297393},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/MoritaBSHS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IshizakaSI18,
author = {Mamoru Ishizaka and
Michihiro Shintani and
Michiko Inoue},
title = {Area-Efficient and Reliable Hybrid CMOS/Memristor {ECC} Circuit for
ReRAM Storage},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {167--172},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00040},
doi = {10.1109/ATS.2018.00040},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IshizakaSI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/ShinMBSHS18,
author = {Zuitoku Shin and
Shumpei Morita and
Song Bian and
Michihiro Shintani and
Masayuki Hiromoto and
Takashi Sato},
title = {A study on NBTI-induced delay degradation considering stress frequency
dependence},
booktitle = {19th International Symposium on Quality Electronic Design, {ISQED}
2018, Santa Clara, CA, USA, March 13-14, 2018},
pages = {251--256},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ISQED.2018.8357296},
doi = {10.1109/ISQED.2018.8357296},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/ShinMBSHS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HossainSIO18,
author = {Fakir Sharif Hossain and
Michihiro Shintani and
Michiko Inoue and
Alex Orailoglu},
title = {Variation-Aware Hardware Trojan Detection through Power Side-channel},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624866},
doi = {10.1109/TEST.2018.8624866},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HossainSIO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShintaniIN18,
author = {Michihiro Shintani and
Michiko Inoue and
Yoshiyuki Nakamura},
title = {Artificial Neural Network Based Test Escape Screening Using Generative
Model},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--8},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624821},
doi = {10.1109/TEST.2018.8624821},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShintaniIN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/MoritaBSHS17,
author = {Shumpei Morita and
Song Bian and
Michihiro Shintani and
Masayuki Hiromoto and
Takashi Sato},
title = {Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement
for {NBTI} Mitigation},
journal = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {100-A},
number = {7},
pages = {1464--1472},
year = {2017},
url = {https://doi.org/10.1587/transfun.E100.A.1464},
doi = {10.1587/TRANSFUN.E100.A.1464},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieicet/MoritaBSHS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/BianMSAHS17,
author = {Song Bian and
Shumpei Morita and
Michihiro Shintani and
Hiromitsu Awano and
Masayuki Hiromoto and
Takashi Sato},
title = {Identification and Application of Invariant Critical Paths under {NBTI}
Degradation},
journal = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {100-A},
number = {12},
pages = {2797--2806},
year = {2017},
url = {https://doi.org/10.1587/transfun.E100.A.2797},
doi = {10.1587/TRANSFUN.E100.A.2797},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieicet/BianMSAHS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/ChenSSSC17,
author = {Yu{-}Guang Chen and
Michihiro Shintani and
Takashi Sato and
Yiyu Shi and
Shih{-}Chieh Chang},
title = {Pattern based runtime voltage emergency prediction: An instruction-aware
block sparse compressed sensing approach},
booktitle = {22nd Asia and South Pacific Design Automation Conference, {ASP-DAC}
2017, Chiba, Japan, January 16-19, 2017},
pages = {543--548},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ASPDAC.2017.7858380},
doi = {10.1109/ASPDAC.2017.7858380},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/ChenSSSC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HossainYSIO17,
author = {Fakir Sharif Hossain and
Tomokazu Yoneda and
Michihiro Shintani and
Michiko Inoue and
Alex Orailoglu},
title = {Intra-Die-Variation-Aware Side Channel Analysis for Hardware Trojan
Detection},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {52--57},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.22},
doi = {10.1109/ATS.2017.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HossainYSIO17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/BianSHS17,
author = {Song Bian and
Michihiro Shintani and
Masayuki Hiromoto and
Takashi Sato},
title = {{LSTA:} Learning-Based Static Timing Analysis for High-Dimensional
Correlated On-Chip Variations},
booktitle = {Proceedings of the 54th Annual Design Automation Conference, {DAC}
2017, Austin, TX, USA, June 18-22, 2017},
pages = {66:1--66:6},
publisher = {{ACM}},
year = {2017},
url = {https://doi.org/10.1145/3061639.3062280},
doi = {10.1145/3061639.3062280},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/BianSHS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/MoritaBSHS17,
author = {Shumpei Morita and
Song Bian and
Michihiro Shintani and
Masayuki Hiromoto and
Takashi Sato},
title = {Comparative study of path selection and objective function in replacing
{NBTI} mitigation logic},
booktitle = {18th International Symposium on Quality Electronic Design, {ISQED}
2017, Santa Clara, CA, USA, March 14-15, 2017},
pages = {426--431},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ISQED.2017.7918353},
doi = {10.1109/ISQED.2017.7918353},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/MoritaBSHS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ShintaniUHMS16,
author = {Michihiro Shintani and
Takumi Uezono and
Kazumi Hatayama and
Kazuya Masu and
Takashi Sato},
title = {Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive
Path Delay Testing},
journal = {J. Electron. Test.},
volume = {32},
number = {5},
pages = {601--609},
year = {2016},
url = {https://doi.org/10.1007/s10836-016-5614-0},
doi = {10.1007/S10836-016-5614-0},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/ShintaniUHMS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/BianSHS16,
author = {Song Bian and
Michihiro Shintani and
Masayuki Hiromoto and
Takashi Sato},
title = {Fast Estimation of NBTI-Induced Delay Degradation Based on Signal
Probability},
journal = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {99-A},
number = {7},
pages = {1400--1409},
year = {2016},
url = {https://doi.org/10.1587/transfun.E99.A.1400},
doi = {10.1587/TRANSFUN.E99.A.1400},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieicet/BianSHS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BianS0HCS16,
author = {Song Bian and
Michihiro Shintani and
Zheng Wang and
Masayuki Hiromoto and
Anupam Chattopadhyay and
Takashi Sato},
title = {Runtime {NBTI} Mitigation for Processor Lifespan Extension via Selective
Node Control},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {234--239},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.31},
doi = {10.1109/ATS.2016.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BianS0HCS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/glvlsi/BianSMAHS16,
author = {Song Bian and
Michihiro Shintani and
Shumpei Morita and
Hiromitsu Awano and
Masayuki Hiromoto and
Takashi Sato},
editor = {Ayse K. Coskun and
Martin Margala and
Laleh Behjat and
Jie Han},
title = {Workload-Aware Worst Path Analysis of Processor-Scale {NBTI} Degradation},
booktitle = {Proceedings of the 26th edition on Great Lakes Symposium on VLSI,
{GLVLSI} 2016, Boston, MA, USA, May 18-20, 2016},
pages = {203--208},
publisher = {{ACM}},
year = {2016},
url = {https://doi.org/10.1145/2902961.2903013},
doi = {10.1145/2902961.2903013},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/glvlsi/BianSMAHS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/BianSMHS16,
author = {Song Bian and
Michihiro Shintani and
Shumpei Morita and
Masayuki Hiromoto and
Takashi Sato},
title = {Nonlinear delay-table approach for full-chip {NBTI} degradation prediction},
booktitle = {17th International Symposium on Quality Electronic Design, {ISQED}
2016, Santa Clara, CA, USA, March 15-16, 2016},
pages = {307--312},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ISQED.2016.7479219},
doi = {10.1109/ISQED.2016.7479219},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/BianSMHS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/ShintaniS14,
author = {Michihiro Shintani and
Takashi Sato},
title = {{IDDQ} Outlier Screening through Two-Phase Approach: Clustering-Based
Filtering and Estimation-Based Current-Threshold Determination},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {97-D},
number = {8},
pages = {2095--2104},
year = {2014},
url = {https://doi.org/10.1587/transinf.E97.D.2095},
doi = {10.1587/TRANSINF.E97.D.2095},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieicet/ShintaniS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ShintaniUTHAMS14,
author = {Michihiro Shintani and
Takumi Uezono and
Tomoyuki Takahashi and
Kazumi Hatayama and
Takashi Aikyo and
Kazuya Masu and
Takashi Sato},
title = {A Variability-Aware Adaptive Test Flow for Test Quality Improvement},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {33},
number = {7},
pages = {1056--1066},
year = {2014},
url = {https://doi.org/10.1109/TCAD.2014.2305835},
doi = {10.1109/TCAD.2014.2305835},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/ShintaniUTHAMS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/ShintaniS14,
author = {Michihiro Shintani and
Takashi Sato},
editor = {Yao{-}Wen Chang},
title = {Sensorless estimation of global device-parameters based on F\({}_{\mbox{max}}\)
testing},
booktitle = {The {IEEE/ACM} International Conference on Computer-Aided Design,
{ICCAD} 2014, San Jose, CA, USA, November 3-6, 2014},
pages = {498--503},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ICCAD.2014.7001397},
doi = {10.1109/ICCAD.2014.7001397},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/ShintaniS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/ShintaniS13,
author = {Michihiro Shintani and
Takashi Sato},
title = {Device-Parameter Estimation through {IDDQ} Signatures},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {96-D},
number = {2},
pages = {303--313},
year = {2013},
url = {https://doi.org/10.1587/transinf.E96.D.303},
doi = {10.1587/TRANSINF.E96.D.303},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieicet/ShintaniS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/ShintaniS13,
author = {Michihiro Shintani and
Takashi Sato},
title = {An adaptive current-threshold determination for {IDDQ} testing based
on Bayesian process parameter estimation},
booktitle = {18th Asia and South Pacific Design Automation Conference, {ASP-DAC}
2013, Yokohama, Japan, January 22-25, 2013},
pages = {614--619},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/ASPDAC.2013.6509666},
doi = {10.1109/ASPDAC.2013.6509666},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/ShintaniS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ShintaniS12,
author = {Michihiro Shintani and
Takashi Sato},
title = {A Bayesian-based process parameter estimation using {IDDQ} current
signature},
booktitle = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA,
23-26 April 2012},
pages = {86--91},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/VTS.2012.6231085},
doi = {10.1109/VTS.2012.6231085},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ShintaniS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/UezonoTSHMOS10,
author = {Takumi Uezono and
Tomoyuki Takahashi and
Michihiro Shintani and
Kazumi Hatayama and
Kazuya Masu and
Hiroyuki Ochi and
Takashi Sato},
title = {Scan based process parameter estimation through path-delay inequalities},
booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2010), May
30 - June 2, 2010, Paris, France},
pages = {3553--3556},
publisher = {{IEEE}},
year = {2010},
url = {https://doi.org/10.1109/ISCAS.2010.5537813},
doi = {10.1109/ISCAS.2010.5537813},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iscas/UezonoTSHMOS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/UezonoTSHMOS10,
author = {Takumi Uezono and
Tomoyuki Takahashi and
Michihiro Shintani and
Kazumi Hatayama and
Kazuya Masu and
Hiroyuki Ochi and
Takashi Sato},
title = {Path clustering for adaptive test},
booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
Santa Cruz, California, {USA}},
pages = {15--20},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VTS.2010.5469626},
doi = {10.1109/VTS.2010.5469626},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/UezonoTSHMOS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShintaniUTUSHAM09,
author = {Michihiro Shintani and
Takumi Uezono and
Tomoyuki Takahashi and
Hiroyuki Ueyama and
Takashi Sato and
Kazumi Hatayama and
Takashi Aikyo and
Kazuya Masu},
title = {An Adaptive Test for Parametric Faults Based on Statistical Timing
Information},
booktitle = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
November 2009, Taichung, Taiwan},
pages = {151--156},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ATS.2009.90},
doi = {10.1109/ATS.2009.90},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShintaniUTUSHAM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AraiSINSHA09,
author = {Masayuki Arai and
Akifumi Suto and
Kazuhiko Iwasaki and
Katsuyuki Nakano and
Michihiro Shintani and
Kazumi Hatayama and
Takashi Aikyo},
title = {Small Delay Fault Model for Intra-Gate Resistive Open Defects},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {27--32},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.25},
doi = {10.1109/VTS.2009.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AraiSINSHA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/IchiharaOSI07,
author = {Hideyuki Ichihara and
Toshihiro Ohara and
Michihiro Shintani and
Tomoo Inoue},
title = {A Variable-Length Coding Adjustable for Compressed Test Application},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {90-D},
number = {8},
pages = {1235--1242},
year = {2007},
url = {https://doi.org/10.1093/ietisy/e90-d.8.1235},
doi = {10.1093/IETISY/E90-D.8.1235},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieicet/IchiharaOSI07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/IchiharaSI05,
author = {Hideyuki Ichihara and
Michihiro Shintani and
Tomoo Inoue},
title = {Huffman-Based Test Response Coding},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {88-D},
number = {1},
pages = {158--161},
year = {2005},
url = {http://search.ieice.org/bin/summary.php?id=e88-d\_1\_158\&\#38;category=D\&\#38;year=2005\&\#38;lang=E\&\#38;abst=},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/IchiharaSI05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/ShintaniOII05,
author = {Michihiro Shintani and
Toshihiro Ohara and
Hideyuki Ichihara and
Tomoo Inoue},
editor = {Tingao Tang},
title = {A Huffman-based coding with efficient test application},
booktitle = {Proceedings of the 2005 Conference on Asia South Pacific Design Automation,
{ASP-DAC} 2005, Shanghai, China, January 18-21, 2005},
pages = {75--78},
publisher = {{ACM} Press},
year = {2005},
url = {https://doi.org/10.1145/1120725.1120747},
doi = {10.1145/1120725.1120747},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/ShintaniOII05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IchiharaOSI04,
author = {Hideyuki Ichihara and
Masakuni Ochi and
Michihiro Shintani and
Tomoo Inoue},
title = {A Test Decompression Scheme for Variable-Length Coding},
booktitle = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
Taiwan},
pages = {426--431},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ATS.2004.17},
doi = {10.1109/ATS.2004.17},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IchiharaOSI04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IchiharaSOI03,
author = {Hideyuki Ichihara and
Michihiro Shintani and
Toshihiro Ohara and
Tomoo Inoue},
title = {Test Response Compression Based on Huffman Coding},
booktitle = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian,
China},
pages = {446--451},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/ATS.2003.1250854},
doi = {10.1109/ATS.2003.1250854},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IchiharaSOI03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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