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ORCIDBibTeX records: Isabel C. Teixeira
@incollection{DBLP:books/sp/20/SemiaoSTT20,
author = {Jorge Semi{\~{a}}o and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {George Mastorakis and
Constandinos X. Mavromoustakis and
Jordi Mongay Batalla and
Evangelos Pallis},
title = {Internet of Things and Artificial Intelligence - {A} Wining Partnership?},
booktitle = {Convergence of Artificial Intelligence and the Internet of Things
- Technology, Communications and Computing},
pages = {369--390},
publisher = {Springer},
year = {2020},
url = {https://doi.org/10.1007/978-3-030-44907-0\_15},
doi = {10.1007/978-3-030-44907-0\_15},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/books/sp/20/SemiaoSTT20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/hci/SemiaoCSTT18,
author = {Jorge Semi{\~{a}}o and
Ruben Cabral and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Margherita Antona and
Constantine Stephanidis},
title = {Performance Sensor for Reliable Operation},
booktitle = {Universal Access in Human-Computer Interaction. Virtual, Augmented,
and Intelligent Environments - 12th International Conference, {UAHCI}
2018, Held as Part of {HCI} International 2018, Las Vegas, NV, USA,
July 15-20, 2018, Proceedings, Part {II}},
series = {Lecture Notes in Computer Science},
volume = {10908},
pages = {347--365},
publisher = {Springer},
year = {2018},
url = {https://doi.org/10.1007/978-3-319-92052-8\_28},
doi = {10.1007/978-3-319-92052-8\_28},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/hci/SemiaoCSTT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/LeongSSTT15,
author = {Carlos Leong and
Jorge Semi{\~{a}}o and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Fault-Tolerance in Field Programmable Gate Array with Dynamic Voltage
and Frequency Scaling},
journal = {J. Low Power Electron.},
volume = {11},
number = {4},
pages = {517--527},
year = {2015},
url = {https://doi.org/10.1166/jolpe.2015.1406},
doi = {10.1166/JOLPE.2015.1406},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/LeongSSTT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/LeongSSTT15,
author = {Carlos Leong and
Jorge Semi{\~{a}}o and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Fault-tolerance in {FPGA} focusing power reduction or performance
enhancement},
booktitle = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
Mexico, March 25-27, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/LATW.2015.7102523},
doi = {10.1109/LATW.2015.7102523},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/LeongSSTT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SemiaoSLRSTT14,
author = {Jorge Semi{\~{a}}o and
David Saraiva and
Carlos Leong and
Andr{\'{e}} Rom{\~{a}}o and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Performance sensor for tolerance and predictive detection of delay-faults},
booktitle = {2014 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2014, Amsterdam, The Netherlands,
October 1-3, 2014},
pages = {110--115},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DFT.2014.6962092},
doi = {10.1109/DFT.2014.6962092},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SemiaoSLRSTT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VazquezCSTST13,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Process Variations-Aware Statistical Analysis Framework for Aging
Sensors Insertion},
journal = {J. Electron. Test.},
volume = {29},
number = {3},
pages = {289--299},
year = {2013},
url = {https://doi.org/10.1007/s10836-013-5358-z},
doi = {10.1007/S10836-013-5358-Z},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/VazquezCSTST13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpl/LeongSTSTVFRV13,
author = {Carlos Leong and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira and
Mar{\'{\i}}a Dolores Vald{\'{e}}s and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas},
title = {Aging monitoring with local sensors in FPGA-based designs},
booktitle = {23rd International Conference on Field programmable Logic and Applications,
{FPL} 2013, Porto, Portugal, September 2-4, 2013},
pages = {1--4},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/FPL.2013.6645596},
doi = {10.1109/FPL.2013.6645596},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/fpl/LeongSTSTVFRV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PachitoMJSVCSTT12,
author = {Jackson Pachito and
Celestino V. Martins and
Bruno Jacinto and
Jorge Semi{\~{a}}o and
Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Aging-Aware Power or Frequency Tuning With Predictive Fault Detection},
journal = {{IEEE} Des. Test Comput.},
volume = {29},
number = {5},
pages = {27--36},
year = {2012},
url = {https://doi.org/10.1109/MDT.2012.2206009},
doi = {10.1109/MDT.2012.2206009},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/PachitoMJSVCSTT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FreijedoSRVTT12,
author = {Judit Freijedo and
Jorge Semi{\~{a}}o and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Modeling the Effect of Process, Power-Supply Voltage and Temperature
Variations on the Timing Response of Nanometer Digital Circuits},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {421--434},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5297-0},
doi = {10.1007/S10836-012-5297-0},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/FreijedoSRVTT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PachitoMSSTT12,
author = {Jackson Pachito and
Celestino V. Martins and
Jorge Semi{\~{a}}o and
Marcelino Bicho Dos Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {The influence of clock-gating on NBTI-induced delay degradation},
booktitle = {18th {IEEE} International On-Line Testing Symposium, {IOLTS} 2012,
Sitges, Spain, June 27-29, 2012},
pages = {61--66},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/IOLTS.2012.6313842},
doi = {10.1109/IOLTS.2012.6313842},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/PachitoMSSTT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/FreijedoVCMRSVTT11,
author = {Judit Freijedo and
Mar{\'{\i}}a Dolores Vald{\'{e}}s and
Luc{\'{\i}}a Costas and
Mar{\'{\i}}a Jos{\'{e}} Moure and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Jorge Semi{\~{a}}o and
Fabian Vargas and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Lower \emph{V}\({}_{\mbox{DD}}\) Operation of FPGA-Based Digital Circuits
Through Delay Modeling and Time Borrowing},
journal = {J. Low Power Electron.},
volume = {7},
number = {2},
pages = {185--198},
year = {2011},
url = {https://doi.org/10.1166/jolpe.2011.1127},
doi = {10.1166/JOLPE.2011.1127},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/FreijedoVCMRSVTT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/OliveiraSTST11,
author = {R. S. Oliveira and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {On-Line {BIST} for Performance Failure Prediction Under NBTI-Induced
Aging in Safety-Critical Applications},
journal = {J. Low Power Electron.},
volume = {7},
number = {4},
pages = {562--572},
year = {2011},
url = {https://doi.org/10.1166/jolpe.2011.1155},
doi = {10.1166/JOLPE.2011.1155},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/OliveiraSTST11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpl/BexigaLSTTVFRV11,
author = {Vasco Bexiga and
Carlos Leong and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira and
Mar{\'{\i}}a Dolores Vald{\'{e}}s and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas},
title = {Performance Failure Prediction Using Built-In Delay Sensors in FPGAs},
booktitle = {International Conference on Field Programmable Logic and Applications,
{FPL} 2011, September 5-7, Chania, Crete, Greece},
pages = {301--304},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/FPL.2011.61},
doi = {10.1109/FPL.2011.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/fpl/BexigaLSTTVFRV11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/FreijedoSR0T011,
author = {Judit Freijedo and
Jorge Semi{\~{a}}o and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Modeling the effect of process variations on the timing response of
nanometer digital circuits},
booktitle = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de
Galinhas, Brazil, March 27-30, 2011},
pages = {1--5},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/LATW.2011.5985927},
doi = {10.1109/LATW.2011.5985927},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/FreijedoSR0T011.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/OliveiraSTS011,
author = {R. S. Oliveira and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {On-line {BIST} for performance failure prediction under aging effects
in automotive safety-critical applications},
booktitle = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de
Galinhas, Brazil, March 27-30, 2011},
pages = {1--6},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/LATW.2011.5985919},
doi = {10.1109/LATW.2011.5985919},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/OliveiraSTS011.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/ValdesFMRS0T011,
author = {Mar{\'{\i}}a Dolores Vald{\'{e}}s and
Judit Freijedo and
Mar{\'{\i}}a Jos{\'{e}} Moure and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Jorge Semi{\~{a}}o and
Fabian Vargas and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Programmable sensor for on-line checking of signal integrity in FPGA-based
systems subject to aging effects},
booktitle = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de
Galinhas, Brazil, March 27-30, 2011},
pages = {1--7},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/LATW.2011.5985926},
doi = {10.1109/LATW.2011.5985926},
timestamp = {Sun, 06 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/ValdesFMRS0T011.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MartinsSVCSTT11,
author = {Celestino V. Martins and
Jorge Semi{\~{a}}o and
Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Adaptive Error-Prediction Flip-flop for performance failure prediction
with aging sensors},
booktitle = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
Point, California, {USA}},
pages = {203--208},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/VTS.2011.5783784},
doi = {10.1109/VTS.2011.5783784},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/MartinsSVCSTT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/FreijedoCSRMVTT10,
author = {Judit Freijedo and
Luc{\'{\i}}a Costas and
Jorge Semi{\~{a}}o and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Mar{\'{\i}}a Jos{\'{e}} Moure and
Fabian Vargas and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems
Performance},
journal = {J. Low Power Electron.},
volume = {6},
number = {2},
pages = {339--349},
year = {2010},
url = {https://doi.org/10.1166/jolpe.2010.1076},
doi = {10.1166/JOLPE.2010.1076},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/FreijedoCSRMVTT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/VazquezCTST10,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
editor = {Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller and
Enrico Macii},
title = {Programmable aging sensor for automotive safety-critical applications},
booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
March 8-12, 2010},
pages = {618--621},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DATE.2010.5457131},
doi = {10.1109/DATE.2010.5457131},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/VazquezCTST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/LeongMBTTSLV10,
author = {Carlos Leong and
Pedro Machado and
Vasco Bexiga and
Jo{\~{a}}o Paulo Teixeira and
Isabel C. Teixeira and
Jos{\'{e}} C. Silva and
Pedro Lous{\~{a}} and
Jo{\~{a}}o Varela},
editor = {Elena Gramatov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Andreas Steininger and
Heinrich Theodor Vierhaus and
Horst Zimmermann},
title = {Built-in Clock Domain Crossing {(CDC)} test and diagnosis in {GALS}
systems},
booktitle = {13th {IEEE} International Symposium on Design and Diagnostics of Electronic
Circuits and Systems, {DDECS} 2010, Vienna, Austria, April 14-16,
2010},
pages = {72--77},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DDECS.2010.5491815},
doi = {10.1109/DDECS.2010.5491815},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/LeongMBTTSLV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/VazquezCZRSTST10,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Adriel Ziesemer and
Ricardo Reis and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Predictive error detection by on-line aging monitoring},
booktitle = {16th {IEEE} International On-Line Testing Symposium {(IOLTS} 2010),
5-7 July, 2010, Corfu, Greece},
pages = {9--14},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/IOLTS.2010.5560241},
doi = {10.1109/IOLTS.2010.5560241},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/VazquezCZRSTST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/ChipanaBVSRTT10,
author = {Raul Chipana and
Let{\'{\i}}cia Maria Veiras Bolzani and
Fabian Vargas and
Jorge Semi{\~{a}}o and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Investigating the Use of {BICS} to detect resistive-open defects in
SRAMs},
booktitle = {16th {IEEE} International On-Line Testing Symposium {(IOLTS} 2010),
5-7 July, 2010, Corfu, Greece},
pages = {200--201},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/IOLTS.2010.5560207},
doi = {10.1109/IOLTS.2010.5560207},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/ChipanaBVSRTT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/LeongTTBFRSLV10,
author = {Carlos Leong and
Jo{\~{a}}o Paulo Teixeira and
Isabel C. Teixeira and
Ricardo Bugalho and
Manuel Ferreira and
Pedro Miguel Rodrigues and
Jos{\'{e}} C. Silva and
Pedro Lous{\~{a}} and
Jo{\~{a}}o Varela},
title = {Automatic Configuration of a Medical Imaging System to Unknown Delays
in Synchronous Input Data Channels},
booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2010), May
30 - June 2, 2010, Paris, France},
pages = {1185--1188},
publisher = {{IEEE}},
year = {2010},
url = {https://doi.org/10.1109/ISCAS.2010.5537302},
doi = {10.1109/ISCAS.2010.5537302},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/LeongTTBFRSLV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/VazquezCZRTST10,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Adriel Ziesemer and
Ricardo Reis and
Isabel Maria Cacho Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Low-sensitivity to process variations aging sensor for automotive
safety-critical applications},
booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
Santa Cruz, California, {USA}},
pages = {238--243},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VTS.2010.5469568},
doi = {10.1109/VTS.2010.5469568},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/VazquezCZRTST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/biostec/LeongMBJ09,
author = {Carlos Leong and
Pedro Machado and
Vasco Bexiga and
Jo{\~{a}}o Paulo Teixeira and
Isabel C. Teixeira and
Joel Rego and
Pedro Neves and
Fernando Piedade and
Pedro Lous{\~{a}} and
Pedro Miguel Rodrigues and
Andreia Trindade and
Ricardo Bugalho and
Jo{\~{a}}o F. Pinheiro and
Manuel Ferreira and
Jo{\~{a}}o Varela},
editor = {Teodiano Freire Bastos Filho and
Hugo Gamboa},
title = {Data Acquisition Electronics for {PET} Mammography Imaging},
booktitle = {{BIODEVICES} 2009 - Proceedings of the International Conference on
Biomedical Electronics and Devices, Porto, Portugal, January 14-17,
2009},
pages = {192--197},
publisher = {{INSTICC} Press},
year = {2009},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/biostec/LeongMBJ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/biostec/AlbuquerqueBBCFFGGLLMMNOPPRRRSSTTTV09,
author = {Edgar F. M. Albuquerque and
Vasco Bexiga and
Ricardo Bugalho and
Bruno Carri{\c{c}}o and
Cl{\'{a}}udia S. Ferreira and
Miguel Ferreira and
Joaquim Godinho and
Fernando M. Gon{\c{c}}alves and
Carlos Leong and
Pedro Lous{\~{a}} and
Pedro Machado and
Rui Moura and
Pedro Neves and
Catarina Ortig{\~{a}}o and
Fernando Piedade and
Jo{\~{a}}o F. Pinheiro and
P. Relvas and
Angelo Rivetti and
Pedro Miguel Rodrigues and
Jos{\'{e}} C. Silva and
Manuel M. Silva and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira and
Andreia Trindade and
Jo{\~{a}}o Varela},
editor = {Teodiano Freire Bastos Filho and
Hugo Gamboa},
title = {On-Detector Electronics of the Clear {PEM} Scanner},
booktitle = {{BIODEVICES} 2009 - Proceedings of the International Conference on
Biomedical Electronics and Devices, Porto, Portugal, January 14-17,
2009},
pages = {355--358},
publisher = {{INSTICC} Press},
year = {2009},
timestamp = {Fri, 14 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/biostec/AlbuquerqueBBCFFGGLLMMNOPPRRRSSTTTV09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/VazquezCZRTST09,
author = {Julio C{\'{e}}sar V{\'{a}}zquez and
V{\'{\i}}ctor H. Champac and
Adriel Ziesemer and
Ricardo Reis and
Isabel C. Teixeira and
Marcelino B. Santos and
Jo{\~{a}}o Paulo Teixeira},
title = {Built-in aging monitoring for safety-critical applications},
booktitle = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
24-26 June 2009, Sesimbra-Lisbon, Portugal},
pages = {9--14},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/IOLTS.2009.5195976},
doi = {10.1109/IOLTS.2009.5195976},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/VazquezCZRTST09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SemiaoFRVSTT09,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Delay-fault tolerance to power supply Voltage disturbances analysis
in nanometer technologies},
booktitle = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
24-26 June 2009, Sesimbra-Lisbon, Portugal},
pages = {223--228},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/IOLTS.2009.5196020},
doi = {10.1109/IOLTS.2009.5196020},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/SemiaoFRVSTT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/SemiaoFMMAB0STR09,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Marlon Moraes and
M. Mallmann and
C. Antunes and
Juliano Benfica and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Jo{\~{a}}o Paulo Teixeira and
Daniel Lupi and
Edmundo Gatti and
Luis Garcia and
Fernando Hernandez},
title = {Measuring clock-signal modulation efficiency for Systems-on-Chip in
electromagnetic interference environment},
booktitle = {10th Latin American Test Workshop, {LATW} 2009, Rio de Janeiro, Brazil,
March 2-5, 2009},
pages = {1--6},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/LATW.2009.4813817},
doi = {10.1109/LATW.2009.4813817},
timestamp = {Fri, 08 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/SemiaoFMMAB0STR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/SemiaoRRPVSTT08,
author = {Jorge Semi{\~{a}}o and
Marcial Jes{\'{u}}s Rodr{\'{\i}}guez{-}Irago and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Leonardo Bisch Piccoli and
Fabian Vargas and
Marcelino Bicho Dos Santos and
Isabel Maria Cacho Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Signal Integrity Enhancement in Digital Circuits},
journal = {{IEEE} Des. Test Comput.},
volume = {25},
number = {5},
pages = {452--461},
year = {2008},
url = {https://doi.org/10.1109/MDT.2008.146},
doi = {10.1109/MDT.2008.146},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/SemiaoRRPVSTT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/FreijedoSRVTT08,
author = {Judit Freijedo and
Jorge Semi{\~{a}}o and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Delay Modeling for Power Noise and Temperature-Aware Design and Test
of Digital Systems},
journal = {J. Low Power Electron.},
volume = {4},
number = {3},
pages = {385--391},
year = {2008},
url = {https://doi.org/10.1166/jolpe.2008.191},
doi = {10.1166/JOLPE.2008.191},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/FreijedoSRVTT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/SemiaoFRVSTT08,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Time Management for Low-Power Design of Digital Systems},
journal = {J. Low Power Electron.},
volume = {4},
number = {3},
pages = {410--419},
year = {2008},
url = {https://doi.org/10.1166/jolpe.2008.194},
doi = {10.1166/JOLPE.2008.194},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/SemiaoFRVSTT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/apccas/SemiaoVFRLTT08,
author = {Jorge Semi{\~{a}}o and
Jo{\~{a}}o Varela and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Carlos Leong and
Jo{\~{a}}o Paulo Teixeira and
Isabel C. Teixeira},
title = {Robust solution for synchronous communication among multi clock domains},
booktitle = {{IEEE} Asia Pacific Conference on Circuits and Systems, {APCCAS} 2008,
Macao, China, November 30 2008 - December 3, 2008},
pages = {1107--1110},
publisher = {{IEEE}},
year = {2008},
url = {https://doi.org/10.1109/APCCAS.2008.4746218},
doi = {10.1109/APCCAS.2008.4746218},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/apccas/SemiaoVFRLTT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/SemiaoRVSTT08,
author = {Jorge Semi{\~{a}}o and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Bernd Straube and
Milos Drutarovsk{\'{y}} and
Michel Renovell and
Peter Gramata and
M{\'{a}}ria Fischerov{\'{a}}},
title = {Process Tolerant Design Using Thermal and Power-Supply Tolerance in
Pipeline Based Circuits},
booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava,
Slovakia, April 16-18, 2008},
pages = {34--37},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DDECS.2008.4538752},
doi = {10.1109/DDECS.2008.4538752},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/SemiaoRVSTT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SemiaoFRVSTT08,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Exploiting Parametric Power Supply and/or Temperature Variations to
Improve Fault Tolerance in Digital Circuits},
booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008),
7-9 July 2008, Rhodes, Greece},
pages = {227--232},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/IOLTS.2008.51},
doi = {10.1109/IOLTS.2008.51},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/SemiaoFRVSTT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/SemiaoFRVSTT07,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Patrick Girard and
Andrzej Krasniewski and
Elena Gramatov{\'{a}} and
Adam Pawlak and
Tomasz Garbolino},
title = {Improving Tolerance to Power-Supply and Temperature Variations in
Synchronous Circuits},
booktitle = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w,
Poland, April 11-13, 2007},
pages = {295--300},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DDECS.2007.4295299},
doi = {10.1109/DDECS.2007.4295299},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/SemiaoFRVSTT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SemiaoRVSTT07,
author = {Jorge Semi{\~{a}}o and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino Bicho Dos Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Cristiana Bolchini and
Yong{-}Bin Kim and
Adelio Salsano and
Nur A. Touba},
title = {Improving the Tolerance of Pipeline Based Circuits to Power Supply
or Temperature Variations},
booktitle = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy},
pages = {303--311},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DFT.2007.60},
doi = {10.1109/DFT.2007.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SemiaoRVSTT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SemiaoFRVSTT07,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous
Circuits},
booktitle = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
8-11 July 2007, Heraklion, Crete, Greece},
pages = {167--172},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/IOLTS.2007.49},
doi = {10.1109/IOLTS.2007.49},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/SemiaoFRVSTT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/SemiaoFRVSTT07,
author = {Jorge Semi{\~{a}}o and
Judit Freijedo and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Enhancing the Tolerance to Power-Supply Instability in Digital Circuits},
booktitle = {2007 {IEEE} Computer Society Annual Symposium on {VLSI} {(ISVLSI}
2007), May 9-11, 2007, Porto Alegre, Brazil},
pages = {207--212},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ISVLSI.2007.44},
doi = {10.1109/ISVLSI.2007.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isvlsi/SemiaoFRVSTT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/GuerreiroSPSTT06,
author = {F. Guerreiro and
Jorge Semi{\~{a}}o and
A. Pierce and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Matteo Sonza Reorda and
Ondrej Nov{\'{a}}k and
Bernd Straube and
Hana Kub{\'{a}}tov{\'{a}} and
Zdenek Kot{\'{a}}sek and
Pavel Kubal{\'{\i}}k and
Raimund Ubar and
Jir{\'{\i}} Bucek},
title = {Functional-Oriented {BIST} of Sequential Circuits Aiming at Dynamic
Faults Coverage},
booktitle = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech
Republic, April 18-21, 2006},
pages = {279--284},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DDECS.2006.1649635},
doi = {10.1109/DDECS.2006.1649635},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/GuerreiroSPSTT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/Rodriguez-IragoAVSTT06,
author = {Marcial Jes{\'{u}}s Rodr{\'{\i}}guez{-}Irago and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Jorge Semi{\~{a}}o and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling
and Multi-Temperature Schemes},
booktitle = {12th {IEEE} International On-Line Testing Symposium {(IOLTS} 2006),
10-12 July 2006, Como, Italy},
pages = {257--262},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/IOLTS.2006.25},
doi = {10.1109/IOLTS.2006.25},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/Rodriguez-IragoAVSTT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/Rodriguez-Irago06,
author = {Marcial Jes{\'{u}}s Rodr{\'{\i}}guez{-}Irago and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Using Multiple Clock Schemes and Multi-Temperature Test for Dynamic
Fault Detection in Digital Systems},
booktitle = {7th Latin American Test Workshop, {LATW} 2006, Buenos Aires, Argentina,
March 26-29, 2006},
pages = {103--107},
publisher = {{IEEE}},
year = {2006},
timestamp = {Thu, 27 Jul 2023 13:45:38 +0200},
biburl = {https://dblp.org/rec/conf/latw/Rodriguez-Irago06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JuniorRSTVT05,
author = {D. Barros J{\'{u}}nior and
Marcial Jes{\'{u}}s Rodr{\'{\i}}guez{-}Irago and
Marcelino B. Santos and
Isabel C. Teixeira and
Fabian Vargas and
Jo{\~{a}}o Paulo Teixeira},
title = {Fault Modeling and Simulation of Power Supply Voltage Transients in
Digital Systems on a Chip},
journal = {J. Electron. Test.},
volume = {21},
number = {4},
pages = {349--363},
year = {2005},
url = {https://doi.org/10.1007/s10836-005-0972-z},
doi = {10.1007/S10836-005-0972-Z},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/JuniorRSTVT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpl/LeongBRTSLRNVTT05,
author = {Carlos Leong and
P. Bento and
Pedro Miguel Rodrigues and
Andreia Trindade and
Jos{\'{e}} C. Silva and
Pedro Lous{\~{a}} and
Joel Rego and
J. Nobre and
Jo{\~{a}}o Varela and
Jo{\~{a}}o Paulo Teixeira and
Isabel C. Teixeira},
editor = {Tero Rissa and
Steven J. E. Wilton and
Philip Heng Wai Leong},
title = {Design and Test Methodology for a Reconfigurable {PEM} Data Acquisition
Electronics System},
booktitle = {Proceedings of the 2005 International Conference on Field Programmable
Logic and Applications (FPL), Tampere, Finland, August 24-26, 2005},
pages = {523--526},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/FPL.2005.1515776},
doi = {10.1109/FPL.2005.1515776},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/fpl/LeongBRTSLRNVTT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/Rodriguez-IragoAVSTT05,
author = {Marcial Jes{\'{u}}s Rodr{\'{\i}}guez{-}Irago and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple
Clock Schemes and Multi-VDD Test},
booktitle = {11th {IEEE} International On-Line Testing Symposium {(IOLTS} 2005),
6-8 July 2005, Saint Raphael, France},
pages = {281--286},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/IOLTS.2005.25},
doi = {10.1109/IOLTS.2005.25},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/Rodriguez-IragoAVSTT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SantosTTMBF04,
author = {Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira and
Salvador Manich and
Luz Balado and
Joan Figueras},
title = {On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level},
journal = {J. Electron. Test.},
volume = {20},
number = {4},
pages = {345--355},
year = {2004},
url = {https://doi.org/10.1023/B:JETT.0000039603.89172.2e},
doi = {10.1023/B:JETT.0000039603.89172.2E},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SantosTTMBF04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BarrosVSTT04,
author = {Daniel Barros Jr. and
Fabian Vargas and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Modeling and Simulation of Time Domain Faults in Digital Systems},
booktitle = {10th {IEEE} International On-Line Testing Symposium {(IOLTS} 2004),
12-14 July 2004, Funchal, Madeira Island, Portugal},
pages = {5--10},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2004.29},
doi = {10.1109/IOLTS.2004.29},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/BarrosVSTT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SantosFTT03,
author = {Marcelino B. Santos and
Jos{\'{e}} M. Fernandes and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {{RTL} Test Pattern Generation for High Quality Loosely Deterministic
{BIST}},
booktitle = {2003 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2003), 3-7 March 2003, Munich, Germany},
pages = {10994--10999},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.ieeecomputersociety.org/10.1109/DATE.2003.10010},
doi = {10.1109/DATE.2003.10010},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/SantosFTT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/etfa/RibeiroDTT03,
author = {Rui Ribeiro and
Oct{\'{a}}vio P{\'{a}}scoa Dias and
Jo{\~{a}}o Paulo Teixeira and
Isabel C. Teixeira},
title = {Hardware/software solution for the automation and real-time control
of a wine bottling production line},
booktitle = {Proceedings of 9th {IEEE} International Conference on Emerging Technologies
and Factory Automation, {ETFA} 2003, September 16-19, 2003, Lisbon,
Portugal - Volume 1},
pages = {110--115},
publisher = {{IEEE}},
year = {2003},
url = {https://doi.org/10.1109/ETFA.2003.1247695},
doi = {10.1109/ETFA.2003.1247695},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/etfa/RibeiroDTT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/GoncalvesSTT03,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Property Coverage for Quality Assessment of Fault Tolerant or Fail
Safe Systems},
booktitle = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003),
7-9 July 2003, Kos Island, Greece},
pages = {164--165},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/OLT.2003.1214390},
doi = {10.1109/OLT.2003.1214390},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/GoncalvesSTT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SantosGTT02,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {{RTL} Design Validation, {DFT} and Test Pattern Generation for High
Defects Coverage},
journal = {J. Electron. Test.},
volume = {18},
number = {2},
pages = {179--187},
year = {2002},
url = {https://doi.org/10.1023/A:1014997610714},
doi = {10.1023/A:1014997610714},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SantosGTT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GoncalvesSTT02,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Design and Test of a Certifiable {ASIC} for a Safety-Critical Gas
Burner Control System},
journal = {J. Electron. Test.},
volume = {18},
number = {3},
pages = {285--294},
year = {2002},
url = {https://doi.org/10.1023/A:1015083105421},
doi = {10.1023/A:1015083105421},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GoncalvesSTT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GoncalvesSTT02,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling},
booktitle = {17th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2002), 6-8 November 2002, Vancouver, BC,
Canada, Proceedings},
pages = {216--224},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DFTVS.2002.1173518},
doi = {10.1109/DFTVS.2002.1173518},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GoncalvesSTT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SantosTTMRF02,
author = {Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira and
Salvador Manich and
Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and
Joan Figueras},
title = {{RTL} Level Preparation of High-Quality/Low-Energy/Low-Power {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {814--823},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041835},
doi = {10.1109/TEST.2002.1041835},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SantosTTMRF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/SantosT0MBF02,
author = {Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira and
Salvador Manich and
Luz Balado and
Joan Figueras},
title = {On High-Quality, Low Energy {BIST} Preparation at RT-Level},
booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay,
February 10-13, 2002},
pages = {52--57},
publisher = {{IEEE}},
year = {2002},
timestamp = {Wed, 26 Jul 2023 15:57:25 +0200},
biburl = {https://dblp.org/rec/conf/latw/SantosT0MBF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SantosGTT01,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {RTL-Based Functional Test Generation for High Defects Coverage in
Digital Systems},
journal = {J. Electron. Test.},
volume = {17},
number = {3-4},
pages = {311--319},
year = {2001},
url = {https://doi.org/10.1023/A:1012223614418},
doi = {10.1023/A:1012223614418},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SantosGTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ZorianPTTPDSMR01,
author = {Yervant Zorian and
Paolo Prinetto and
Jo{\~{a}}o Paulo Teixeira and
Isabel C. Teixeira and
Carlos Eduardo Pereira and
Oct{\'{a}}vio P{\'{a}}scoa Dias and
Jorge Semi{\~{a}}o and
Peter Muhmenthaler and
W. Radermacher},
editor = {Wolfgang Nebel and
Ahmed Jerraya},
title = {Embedded tutorial: {TRP:} integrating embedded test and {ATE}},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2001, Munich, Germany, March 12-16, 2001},
pages = {34--37},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://dl.acm.org/citation.cfm?id=367081},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/ZorianPTTPDSMR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SantosGTT01,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {{RTL} design validation, {DFT} and test pattern generation for high
defects coverage},
booktitle = {6th European Test Workshop, {ETW} 2001, Stockholm, Sweden, May 29
- June 1, 2001},
pages = {99--105},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ETW.2001.946672},
doi = {10.1109/ETW.2001.946672},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/SantosGTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iceis/LeriasLMMTT01,
author = {Hugo L{\'{e}}rias and
Jo{\~{a}}o Luz and
Pedro Moura and
Ana Mendes and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Towards E-Management as Enabler for Accelerated Change},
booktitle = {{ICEIS} 2001, Proceedings of the 3rd International Conference on Enterprise
Information Systems, Setubal, Portugal, July 7-10, 2001},
pages = {807--814},
year = {2001},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iceis/LeriasLMMTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/GoncalvesSTT01,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Design and Test of Certifiable ASICs for Safety-Critical Gas Burners
Contro},
booktitle = {7th {IEEE} International On-Line Testing Workshop {(IOLTW} 2001),
9-11 July 2001, Taormina, Italy},
pages = {197--201},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/OLT.2001.937842},
doi = {10.1109/OLT.2001.937842},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/GoncalvesSTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoncalvesSTT01,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Implicit functionality and multiple branch coverage {(IFMB):} a testability
metric for RT-level},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {377--385},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966654},
doi = {10.1109/TEST.2001.966654},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoncalvesSTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SantosGTT00,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {RTL-based functional test generation for high defects coverage in
digital SOCs},
booktitle = {5th European Test Workshop, {ETW} 2000, Cascais, Portugal, May 23-26,
2000},
pages = {99--104},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ETW.2000.873785},
doi = {10.1109/ETW.2000.873785},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/SantosGTT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ifip10-3/DiasTTBP00,
author = {Oct{\'{a}}vio P{\'{a}}scoa Dias and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira and
Leandro Buss Becker and
Carlos Eduardo Pereira},
editor = {Bernd Kleinjohann},
title = {Optimizing Functional distribution in Complex System Design},
booktitle = {Architecture and Design of Distributed Embedded Systems, {IFIP} {WG10.3/WG10.4/WG10.5}
International Workshop on Distributed and Parallel Embedded Systems
{(DIPES} 2000), October 18-19, 2000, Schlo{\ss} Eringerfeld, Germany},
series = {{IFIP} Conference Proceedings},
volume = {189},
pages = {75--86},
publisher = {Kluwer},
year = {2000},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ifip10-3/DiasTTBP00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isorc/BeckerPDTT00,
author = {Leandro Buss Becker and
Carlos Eduardo Pereira and
Oct{\'{a}}vio P{\'{a}}scoa Dias and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {{MOSYS} {A} Methodology for Automatic Object Identification from System
Specification},
booktitle = {3rd International Symposium on Object-Oriented Real-Time Distributed
Computing {(ISORC} 2000), 15-17 March 2000, Newport Beach, CA, {USA}},
pages = {198--201},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ISORC.2000.839529},
doi = {10.1109/ISORC.2000.839529},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isorc/BeckerPDTT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/DiasSSTT00,
author = {Oct{\'{a}}vio P{\'{a}}scoa Dias and
Jorge Semi{\~{a}}o and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Quality of Electronic Design: From Architectural Level to Test Coverage},
booktitle = {1st International Symposium on Quality of Electronic Design {(ISQED}
2000), 20-22 March 2000, San Jose, CA, {USA}},
pages = {197},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ISQED.2000.838874},
doi = {10.1109/ISQED.2000.838874},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isqed/DiasSSTT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DiasTT99,
author = {Oct{\'{a}}vio P{\'{a}}scoa Dias and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems
Architectures},
journal = {J. Electron. Test.},
volume = {14},
number = {1-2},
pages = {149--158},
year = {1999},
url = {https://doi.org/10.1023/A:1008374027849},
doi = {10.1023/A:1008374027849},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DiasTT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/DiasSSTT99,
author = {Oct{\'{a}}vio P{\'{a}}scoa Dias and
Jorge Semi{\~{a}}o and
Marcelino B. Santos and
Isabel Maria Cacho Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {From system level to defect-oriented test: a case study},
booktitle = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28,
1999},
pages = {136--141},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ETW.1999.804509},
doi = {10.1109/ETW.1999.804509},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/DiasSSTT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SantosGTT99,
author = {Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified
Fault Sampling Technique},
booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
Diego, CA, {USA}},
pages = {326--332},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/VTEST.1999.766683},
doi = {10.1109/VTEST.1999.766683},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SantosGTT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ifip10-3/DiasTTEP98,
author = {Oct{\'{a}}vio P{\'{a}}scoa Dias and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira and
Carlos Eduardo Pereira},
editor = {Franz J. Rammig},
title = {An {OO} Based Methodology for Real-Time {HW/SW} Systems Modeling},
booktitle = {Distributed and Parallel Embedded Systems, {IFIP} {WG10.3/WG10.5}
International Workshop on Distributed and Parallel Embedded Systems
{(DIPES} '98), October 5-6. 1998, Schlo{\ss} Eringerfeld, Germany},
series = {{IFIP} Conference Proceedings},
volume = {155},
pages = {213--222},
publisher = {Kluwer},
year = {1998},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ifip10-3/DiasTTEP98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoncalvesSTT98,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Defect-oriented test quality assessment using fault sampling and simulation},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {35--42},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743134},
doi = {10.1109/TEST.1998.743134},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoncalvesSTT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GoncalvesTT97,
author = {Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Realistic Fault Extraction for High-Quality Design and Test of {VLSI}
Systems},
booktitle = {1997 Workshop on Defect and Fault-Tolerance in {VLSI} Systems {(DFT}
'97), 20-22 October 1997, Paris, France},
pages = {29--37},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/DFTVS.1997.628306},
doi = {10.1109/DFTVS.1997.628306},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GoncalvesTT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GoncalvesTT96,
author = {Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Integrated Approach for Circuit and Fault Extraction of {VLSI} Circuits},
booktitle = {1996 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 1996, Boston, MA, USA,
November 6-8, 1996},
pages = {96--104},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/DFTVS.1996.572002},
doi = {10.1109/DFTVS.1996.572002},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GoncalvesTT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/rsp/CalhaTT96,
author = {Mario Calha and
Jo{\~{a}}o Paulo Teixeira and
Isabel C. Teixeira},
title = {{HW/SW} specification using {OOM} techniques},
booktitle = {Seventh {IEEE} International Workshop on Rapid System Prototyping
{(RSP} '96), Thessaloniki, Greece, June 19-21, 1996},
pages = {96--101},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/IWRSP.1996.506734},
doi = {10.1109/IWRSP.1996.506734},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/rsp/CalhaTT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SantosSTT95,
author = {Marcelino B. Santos and
M. Sim{\~{o}}es and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Test preparation methodology for high coverage of physical defects
in {CMOS} digital ICs},
booktitle = {1995 European Design and Test Conference, ED{\&}TC 1995, Paris,
France, March 6-9, 1995},
pages = {604},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/EDTC.1995.470325},
doi = {10.1109/EDTC.1995.470325},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/SantosSTT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SantosSTT95,
author = {Marcelino B. Santos and
M. Sim{\~{o}}es and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Test preparation for high coverage of physical defects in {CMOS} digital
ICs},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {330--337},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512657},
doi = {10.1109/VTEST.1995.512657},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SantosSTT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CalhaSGTT94,
author = {Mario Calha and
Marcelino B. Santos and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Back Annotation of Physical Defects into Gate-Level, Realistic Faults
in Digital ICs},
booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
Next 25 Years, Washington, DC, USA, October 2-6, 1994},
pages = {720--728},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/TEST.1994.528018},
doi = {10.1109/TEST.1994.528018},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CalhaSGTT94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/CasimiroSSTT93,
author = {A. P. Casimiro and
M. Sim{\~{o}}es and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Fabrizio Lombardi and
Mariagiovanna Sami and
Yvon Savaria and
Renato Stefanelli},
title = {Experiments on Bridging Fault Analysis and Layout-Level {DFT} for
{CMOS} Designs},
booktitle = {The {IEEE} International Workshop on Defect and Fault Tolerance in
{VLSI} Systems, October 27-29, 1993, Venice, Italy, Proceedings},
pages = {109--116},
publisher = {{IEEE} Computer Society},
year = {1993},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/CasimiroSSTT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/NicolauBSSTT93,
author = {P. Nicolau and
J. Barbosa and
M. Saraiva and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
editor = {Fabrizio Lombardi and
Mariagiovanna Sami and
Yvon Savaria and
Renato Stefanelli},
title = {Realistic Fault Analysis of {CMOS} Analog Building Blocks},
booktitle = {The {IEEE} International Workshop on Defect and Fault Tolerance in
{VLSI} Systems, October 27-29, 1993, Venice, Italy, Proceedings},
pages = {311--318},
publisher = {{IEEE} Computer Society},
year = {1993},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/NicolauBSSTT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/SaraivaSCTT92,
author = {M. Saraiva and
Marcelino B. Santos and
A. P. Casimiro and
Isabel Maria Cacho Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {On the design of a highly testable cell library},
journal = {Microprocess. Microprogramming},
volume = {35},
number = {1-5},
pages = {383--389},
year = {1992},
url = {https://doi.org/10.1016/0165-6074(92)90343-6},
doi = {10.1016/0165-6074(92)90343-6},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/SaraivaSCTT92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaraivaCSSGTT92,
author = {M. Saraiva and
P. Casimiro and
Marcelino B. Santos and
Jos{\'{e}} T. de Sousa and
Fernando M. Gon{\c{c}}alves and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Physical {DFT} for High Coverage of Realistic Faults},
booktitle = {Proceedings {IEEE} International Test Conference 1992, Discover the
New World of Test and Design, Baltimore, Maryland, USA, September
20-24, 1992},
pages = {642--651},
publisher = {{IEEE} Computer Society},
year = {1992},
url = {https://doi.org/10.1109/TEST.1992.527885},
doi = {10.1109/TEST.1992.527885},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SaraivaCSSGTT92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TeixeiraTAGG91,
author = {Jo{\~{a}}o Paulo Teixeira and
Isabel C. Teixeira and
Carlos F. Beltr{\'{a}}n Almeida and
Fernando M. Gon{\c{c}}alves and
J{\'{u}}lio Gon{\c{c}}alves},
title = {A methodology for testability enhancement at layout level},
journal = {J. Electron. Test.},
volume = {1},
number = {4},
pages = {287--299},
year = {1991},
url = {https://doi.org/10.1007/BF00136317},
doi = {10.1007/BF00136317},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TeixeiraTAGG91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/TeixeiraTAGGC90,
author = {Jo{\~{a}}o Paulo Teixeira and
Isabel C. Teixeira and
Carlos F. Beltr{\'{a}}n Almeida and
Fernando M. Gon{\c{c}}alves and
J{\'{u}}lio Gon{\c{c}}alves and
R. Crespo},
editor = {Gordon Adshead and
Jochen A. G. Jess},
title = {A strategy for testability enhancement at layout level},
booktitle = {European Design Automation Conference, {EURO-DAC} 1990, Glasgow, Scotland,
UK, March 12-15, 1990},
pages = {413--417},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/EDAC.1990.136683},
doi = {10.1109/EDAC.1990.136683},
timestamp = {Wed, 05 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/eurodac/TeixeiraTAGGC90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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