BibTeX records: Sujit T. Zachariah

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@inproceedings{DBLP:conf/vlsid/MitraBSBZK06,
  author    = {Debasis Mitra and
               Subhasis Bhattacharjee and
               Susmita Sur{-}Kolay and
               Bhargab B. Bhattacharya and
               Sujit T. Zachariah and
               Sandip Kundu},
  title     = {Test Pattern Generation for Power Supply Droop Faults},
  booktitle = {19th International Conference on {VLSI} Design {(VLSI} Design 2006),
               3-7 January 2006, Hyderabad, India},
  pages     = {343--348},
  year      = {2006},
  crossref  = {DBLP:conf/vlsid/2006},
  url       = {https://doi.org/10.1109/VLSID.2006.158},
  doi       = {10.1109/VLSID.2006.158},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/MitraBSBZK06},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KunduZCT05,
  author    = {Sandip Kundu and
               Sujit T. Zachariah and
               Yi{-}Shing Chang and
               Chandra Tirumurti},
  title     = {On modeling crosstalk faults},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {24},
  number    = {12},
  pages     = {1909--1915},
  year      = {2005},
  url       = {https://doi.org/10.1109/TCAD.2005.852670},
  doi       = {10.1109/TCAD.2005.852670},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/KunduZCT05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TranKZC05,
  author    = {Eric N. Tran and
               Vamsee Krishna and
               Sujit T. Zachariah and
               Sreejit Chakravarty},
  title     = {Logic proximity bridges},
  booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
               Austin, TX, USA, November 8-10, 2005},
  pages     = {10},
  year      = {2005},
  crossref  = {DBLP:conf/itc/2005},
  url       = {https://doi.org/10.1109/TEST.2005.1584038},
  doi       = {10.1109/TEST.2005.1584038},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/TranKZC05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ZachariahC04,
  author    = {Sujit T. Zachariah and
               Sreejit Chakravarty},
  title     = {Extraction of two-node bridges from large industrial circuits},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {23},
  number    = {3},
  pages     = {433--439},
  year      = {2004},
  url       = {https://doi.org/10.1109/TCAD.2004.823351},
  doi       = {10.1109/TCAD.2004.823351},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/ZachariahC04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/Sur-KolayDBZ04,
  author    = {Susmita Sur{-}Kolay and
               Parthasarathi Dasgupta and
               Bhargab B. Bhattacharya and
               Sujit T. Zachariah},
  title     = {Physical Design Trends and Layout-Based Fault Modeling},
  booktitle = {17th International Conference on {VLSI} Design {(VLSI} Design 2004),
               with the 3rd International Conference on Embedded Systems Design,
               5-9 January 2004, Mumbai, India},
  pages     = {6--8},
  year      = {2004},
  crossref  = {DBLP:conf/vlsid/2004},
  url       = {https://doi.org/10.1109/ICVD.2004.1260891},
  doi       = {10.1109/ICVD.2004.1260891},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/Sur-KolayDBZ04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/ZachariahC03,
  author    = {Sujit T. Zachariah and
               Sreejit Chakravarty},
  title     = {Algorithm to extract two-node bridges},
  journal   = {{IEEE} Trans. {VLSI} Syst.},
  volume    = {11},
  number    = {4},
  pages     = {741--744},
  year      = {2003},
  url       = {https://doi.org/10.1109/TVLSI.2003.816141},
  doi       = {10.1109/TVLSI.2003.816141},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tvlsi/ZachariahC03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ZachariahCKT03,
  author    = {Sujit T. Zachariah and
               Yi{-}Shing Chang and
               Sandip Kundu and
               Chandra Tirumurti},
  title     = {On Modeling Cross-Talk Faults},
  booktitle = {2003 Design, Automation and Test in Europe Conference and Exposition
               {(DATE} 2003), 3-7 March 2003, Munich, Germany},
  pages     = {10490--10495},
  year      = {2003},
  crossref  = {DBLP:conf/date/2003},
  url       = {http://doi.ieeecomputersociety.org/10.1109/DATE.2003.10009},
  doi       = {10.1109/DATE.2003.10009},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/ZachariahCKT03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChakravartyJRSZ02,
  author    = {Sreejit Chakravarty and
               Ankur Jain and
               Nandakumar Radhakrishnan and
               Eric W. Savage and
               Sujit T. Zachariah},
  title     = {Experimental Evaluation of Scan Tests for Bridges},
  booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  pages     = {509--518},
  year      = {2002},
  crossref  = {DBLP:conf/itc/2002},
  url       = {https://doi.org/10.1109/TEST.2002.1041801},
  doi       = {10.1109/TEST.2002.1041801},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/ChakravartyJRSZ02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChakravartyKSCSZ02,
  author    = {Sreejit Chakravarty and
               Kambiz Komeyli and
               Eric W. Savage and
               Michael J. Carruthers and
               Bret T. Stastny and
               Sujit T. Zachariah},
  title     = {Layout Analysis to Extract Open Nets Caused by Systematic Failure
               Mechanisms},
  booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
               a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
  pages     = {367--372},
  year      = {2002},
  crossref  = {DBLP:conf/vts/2002},
  url       = {https://doi.org/10.1109/VTS.2002.1011166},
  doi       = {10.1109/VTS.2002.1011166},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/ChakravartyKSCSZ02},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KunduZSG01,
  author    = {Sandip Kundu and
               Sujit T. Zachariah and
               Sanjay Sengupta and
               Rajesh Galivanche},
  title     = {Test Challenges in Nanometer Technologies},
  journal   = {J. Electronic Testing},
  volume    = {17},
  number    = {3-4},
  pages     = {209--218},
  year      = {2001},
  url       = {https://doi.org/10.1023/A:1012203009875},
  doi       = {10.1023/A:1012203009875},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/et/KunduZSG01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/ZachariahC01,
  author    = {Sujit T. Zachariah and
               Sreejit Chakravarty},
  title     = {A Novel Algorithm for Multi-Node Bridge Analysis of Large {VLSI} Circuits},
  booktitle = {14th International Conference on {VLSI} Design {(VLSI} Design 2001),
               3-7 January 2001, Bangalore, India},
  pages     = {333--338},
  year      = {2001},
  crossref  = {DBLP:conf/vlsid/2001},
  url       = {https://doi.org/10.1109/ICVD.2001.902681},
  doi       = {10.1109/ICVD.2001.902681},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/ZachariahC01},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ChakravartyZ00,
  author    = {Sreejit Chakravarty and
               Sujit T. Zachariah},
  title     = {{STBM:} a fast algorithm to simulate I\({}_{\mbox{DDQ}}\) tests forleakage
               faults},
  journal   = {{IEEE} Trans. on {CAD} of Integrated Circuits and Systems},
  volume    = {19},
  number    = {5},
  pages     = {568--576},
  year      = {2000},
  url       = {https://doi.org/10.1109/43.845081},
  doi       = {10.1109/43.845081},
  timestamp = {Sat, 20 May 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tcad/ChakravartyZ00},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ZachariahCR00,
  author    = {Sujit T. Zachariah and
               Sreejit Chakravarty and
               Carl D. Roth},
  title     = {A novel algorithm to extract two-node bridges},
  booktitle = {Proceedings of the 37th Conference on Design Automation, Los Angeles,
               CA, USA, June 5-9, 2000},
  pages     = {790--793},
  year      = {2000},
  crossref  = {DBLP:conf/dac/2000},
  url       = {https://doi.org/10.1145/337292.337780},
  doi       = {10.1145/337292.337780},
  timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/ZachariahCR00},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZachariahC00,
  author    = {Sujit T. Zachariah and
               Sreejit Chakravarty},
  title     = {A scalable and efficient methodology to extract two node bridges from
               large industrial circuits},
  booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
               NJ, USA, October 2000},
  pages     = {750--759},
  year      = {2000},
  crossref  = {DBLP:conf/itc/2000},
  url       = {https://doi.org/10.1109/TEST.2000.894271},
  doi       = {10.1109/TEST.2000.894271},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/ZachariahC00},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/ZachariahC99,
  author    = {Sujit T. Zachariah and
               Sreejit Chakravarty},
  title     = {A Comparative Study of Pseudo Stuck-At and Leakage Fault Model},
  booktitle = {12th International Conference on {VLSI} Design {(VLSI} Design 1999),
               10-13 January 1999, Goa, India},
  pages     = {91--94},
  year      = {1999},
  crossref  = {DBLP:conf/vlsid/1999},
  url       = {https://doi.org/10.1109/ICVD.1999.745130},
  doi       = {10.1109/ICVD.1999.745130},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/ZachariahC99},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vlsid/2006,
  title     = {19th International Conference on {VLSI} Design {(VLSI} Design 2006),
               3-7 January 2006, Hyderabad, India},
  publisher = {{IEEE} Computer Society},
  year      = {2006},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/10557/proceeding},
  isbn      = {0-7695-2502-4},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/2006},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2005,
  title     = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
               Austin, TX, USA, November 8-10, 2005},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/10560/proceeding},
  isbn      = {0-7803-9038-5},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2005},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vlsid/2004,
  title     = {17th International Conference on {VLSI} Design {(VLSI} Design 2004),
               with the 3rd International Conference on Embedded Systems Design,
               5-9 January 2004, Mumbai, India},
  publisher = {{IEEE} Computer Society},
  year      = {2004},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8911/proceeding},
  isbn      = {0-7695-2072-3},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/2004},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/date/2003,
  title     = {2003 Design, Automation and Test in Europe Conference and Exposition
               {(DATE} 2003), 3-7 March 2003, Munich, Germany},
  publisher = {{IEEE} Computer Society},
  year      = {2003},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8443/proceeding},
  isbn      = {0-7695-1870-2},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/date/2003},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2002,
  title     = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8073/proceeding},
  isbn      = {0-7803-7543-2},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2002},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2002,
  title     = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
               a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2002},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7901/proceeding},
  isbn      = {0-7695-1570-3},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2002},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vlsid/2001,
  title     = {14th International Conference on {VLSI} Design {(VLSI} Design 2001),
               3-7 January 2001, Bangalore, India},
  publisher = {{IEEE} Computer Society},
  year      = {2001},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7234/proceeding},
  isbn      = {0-7695-0831-6},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/2001},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dac/2000,
  editor    = {Giovanni De Micheli},
  title     = {Proceedings of the 37th Conference on Design Automation, Los Angeles,
               CA, USA, June 5-9, 2000},
  publisher = {{ACM}},
  year      = {2000},
  url       = {http://dl.acm.org/citation.cfm?id=337292},
  timestamp = {Wed, 30 Nov 2011 16:28:52 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/dac/2000},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2000,
  title     = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
               NJ, USA, October 2000},
  publisher = {{IEEE} Computer Society},
  year      = {2000},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7183/proceeding},
  isbn      = {0-7803-6546-1},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2000},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vlsid/1999,
  title     = {12th International Conference on {VLSI} Design {(VLSI} Design 1999),
               10-13 January 1999, Goa, India},
  publisher = {{IEEE} Computer Society},
  year      = {1999},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6007/proceeding},
  isbn      = {0-7695-0013-7},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/1999},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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