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ORCIDChristian Boit
Person information
- affiliation: TU Berlin, Department of High-Frequency and Semiconductor System Technologies, Germany
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2020 – today
- 2021
[c17]Ilia Polian, Frank Altmann, Tolga Arul, Christian Boit, Ralf Brederlow
, Lucas Davi, Rolf Drechsler, Nan Du, Thomas Eisenbarth, Tim Güneysu, Sascha Hermann, Matthias Hiller, Rainer Leupers, Farhad Merchant, Thomas Mussenbrock, Stefan Katzenbeisser, Akash Kumar, Wolfgang Kunz, Thomas Mikolajick, Vivek Pachauri, Jean-Pierre Seifert, Frank Sill Torres, Jens Trommer:
Nano Security: From Nano-Electronics to Secure Systems. DATE 2021: 1334-1339- [c16]Elham Amini, Kai Bartels, Christian Boit, Marius Eggert, Norbert Herfurth, Tuba Kiyan, Thilo Krachenfels, Jean-Pierre Seifert, Shahin Tajik:
Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities. VTS 2021: 1-12
2010 – 2019
- 2019
- [c15]Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes:
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis. IRPS 2019: 1-9 - 2018
- [j35]Elham Amini, Anne Beyreuther, Norbert Herfurth, Alexander Steigert, Bernd Szyszka, Christian Boit:
Assessment of a Chip Backside Protection. J. Hardw. Syst. Secur. 2(4): 345-352 (2018) - [j34]Ivo Vogt, Tomonori Nakamura, B. Motamedi, Christian Boit:
Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra. Microelectron. Reliab. 88-90: 11-15 (2018) - [j33]Elham Amini, Anne Beyreuther, Norbert Herfurth, Alexander Steigert, R. Muydinov, Bernd Szyszka, Christian Boit:
IC security and quality improvement by protection of chip backside against hardware attacks. Microelectron. Reliab. 88-90: 22-25 (2018) - [j32]Anne Beyreuther, Norbert Herfurth, Elham Amini, Tomonori Nakamura, Ingrid De Wolf, Christian Boit:
Photon emission as a characterization tool for bipolar parasitics in FinFET technology. Microelectron. Reliab. 88-90: 273-276 (2018) - [j31]Ivo Vogt, Tomonori Nakamura, Ingrid De Wolf, Christian Boit:
Detection of failure mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera. Microelectron. Reliab. 88-90: 334-338 (2018) - [j30]Heiko Lohrke, Shahin Tajik, Thilo Krachenfels, Christian Boit, Jean-Pierre Seifert:
Key Extraction Using Thermal Laser Stimulation A Case Study on Xilinx Ultrascale FPGAs. IACR Trans. Cryptogr. Hardw. Embed. Syst. 2018(3): 573-595 (2018) - [i5]Heiko Lohrke, Shahin Tajik, Thilo Krachenfels, Christian Boit, Jean-Pierre Seifert:
Key Extraction using Thermal Laser Stimulation: A Case Study on Xilinx Ultrascale FPGAs. IACR Cryptol. ePrint Arch. 2018: 717 (2018) - 2017
- [j29]Shahin Tajik, Enrico Dietz, Sven Frohmann, Helmar Dittrich, Dmitry Nedospasov, Clemens Helfmeier, Jean-Pierre Seifert, Christian Boit, Heinz-Wilhelm Hübers:
Photonic Side-Channel Analysis of Arbiter PUFs. J. Cryptol. 30(2): 550-571 (2017) - [j28]Christian Boit:
Technologies for Heterogeneous Integration - Challenges and chances for fault isolation. Microelectron. Reliab. 76-77: 184-187 (2017) - [j27]Ivo Vogt, Tomonori Nakamura, Christian Boit:
Optical interaction in active analog circuit elements. Microelectron. Reliab. 76-77: 233-237 (2017) - [c14]Shahin Tajik, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit:
On the Power of Optical Contactless Probing: Attacking Bitstream Encryption of FPGAs. CCS 2017: 1661-1674 - [c13]Shahin Tajik, Julian Fietkau, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit:
PUFMon: Security monitoring of FPGAs using physically unclonable functions. IOLTS 2017: 186-191 - [i4]Shahin Tajik, Heiko Lohrke, Jean-Pierre Seifert, Christian Boit:
On the Power of Optical Contactless Probing: Attacking Bitstream Encryption of FPGAs. IACR Cryptol. ePrint Arch. 2017: 822 (2017) - 2016
- [c12]Heiko Lohrke, Shahin Tajik, Christian Boit, Jean-Pierre Seifert:
No Place to Hide: Contactless Probing of Secret Data on FPGAs. CHES 2016: 147-167 - [i3]Heiko Lohrke, Shahin Tajik, Christian Boit, Jean-Pierre Seifert:
No Place to Hide: Contactless Probing of Secret Data on FPGAs. IACR Cryptol. ePrint Arch. 2016: 593 (2016) - 2015
- [j26]Clemens Helfmeier, Anne Beyreuther, Alexander Fox, Christian Boit:
Ultra sensitive measurement of dielectric current under pulsed stress conditions. Microelectron. Reliab. 55(11): 2254-2257 (2015) - [c11]Shahin Tajik, Heiko Lohrke, Fatemeh Ganji, Jean-Pierre Seifert, Christian Boit:
Laser Fault Attack on Physically Unclonable Functions. FDTC 2015: 85-96 - [i2]Shahin Tajik, Enrico Dietz, Sven Frohmann, Helmar Dittrich, Dmitry Nedospasov, Clemens Helfmeier, Jean-Pierre Seifert, Christian Boit, Heinz-Wilhelm Hübers:
A Complete and Linear Physical Characterization Methodology for the Arbiter PUF Family. IACR Cryptol. ePrint Arch. 2015: 871 (2015) - 2014
- [j25]Ponky Ivo, Eunjung Melanie Cho, Przemyslaw Kotara, Lars Schellhase, Richard Lossy, Ute Zeimer, Anna Mogilatenko, Joachim Würfl, Günther Tränkle, Arkadiusz Glowacki, Christian Boit:
New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery. Microelectron. Reliab. 54(6-7): 1288-1292 (2014) - [j24]Christian Boit:
Editorial. Microelectron. Reliab. 54(9-10): 1637 (2014) - [j23]Philipp Scholz, Norbert Herfurth, Michael Sadowski, Ted R. Lundquist, Uwe Kerst, Christian Boit:
Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm. Microelectron. Reliab. 54(9-10): 1794-1797 (2014) - [j22]Clemens Helfmeier, Rudolf Schlangen, Christian Boit:
Focused ion beam contact to non-volatile memory cells. Microelectron. Reliab. 54(9-10): 1798-1801 (2014) - [j21]Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki:
Backside spectroscopic photon emission microscopy using intensified silicon CCD. Microelectron. Reliab. 54(9-10): 2105-2108 (2014) - [c10]Shahin Tajik, Enrico Dietz, Sven Frohmann, Jean-Pierre Seifert, Dmitry Nedospasov, Clemens Helfmeier, Christian Boit, Helmar Dittrich:
Physical Characterization of Arbiter PUFs. CHES 2014: 493-509 - [c9]Clemens Helfmeier, Christian Boit, Dmitry Nedospasov, Shahin Tajik, Jean-Pierre Seifert:
Physical vulnerabilities of Physically Unclonable Functions. DATE 2014: 1-4 - [c8]Shahin Tajik, Dmitry Nedospasov, Clemens Helfmeier, Jean-Pierre Seifert, Christian Boit:
Emission Analysis of Hardware Implementations. DSD 2014: 528-534 - [i1]Shahin Tajik, Enrico Dietz, Sven Frohmann, Jean-Pierre Seifert, Dmitry Nedospasov, Clemens Helfmeier, Christian Boit, Helmar Dittrich:
Physical Characterization of Arbiter PUFs. IACR Cryptol. ePrint Arch. 2014: 802 (2014) - 2013
- [c7]Christian Boit, Clemens Helfmeier, Dmitry Nedospasov:
Feasibly clonable functions. TrustED@CCS 2013: 73-74 - [c6]Clemens Helfmeier, Dmitry Nedospasov, Christopher Tarnovsky, Jan Starbug Krissler, Christian Boit, Jean-Pierre Seifert:
Breaking and entering through the silicon. CCS 2013: 733-744 - [c5]Christian Boit, Clemens Helfmeier, Uwe Kerst:
Security Risks Posed by Modern IC Debug and Diagnosis Tools. FDTC 2013: 3-11 - [c4]Dmitry Nedospasov, Jean-Pierre Seifert, Clemens Helfmeier, Christian Boit:
Invasive PUF Analysis. FDTC 2013: 30-38 - [c3]Clemens Helfmeier, Christian Boit, Dmitry Nedospasov, Jean-Pierre Seifert:
Cloning Physically Unclonable Functions. HOST 2013: 1-6 - 2012
- [j20]Carlo Pagano, Christian Boit, Arkadiusz Glowacki, Reiner Leihkauf, Yoshiyuki Yokoyama:
Comparison of FET electro-optical modulation for 1300 nm and 1064 nm laser sources. Microelectron. Reliab. 52(9-10): 2024-2030 (2012) - [j19]Arkadiusz Glowacki, Christian Boit, Philippe Perdu:
Optimum Si thickness for backside detection of photon emission using Si-CCD. Microelectron. Reliab. 52(9-10): 2031-2034 (2012) - [c2]Clemens Helfmeier, Christian Boit, Uwe Kerst:
On charge sensors for FIB attack detection. HOST 2012: 128-133 - 2011
- [j18]Ponky Ivo, Arkadiusz Glowacki, Eldad Bahat-Treidel, Richard Lossy, Joachim Würfl, Christian Boit, Günther Tränkle:
Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements. Microelectron. Reliab. 51(2): 217-223 (2011) - [j17]Arkadiusz Glowacki, Christian Boit, Philippe Perdu:
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. Microelectron. Reliab. 51(9-11): 1632-1636 (2011) - [j16]Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian Boit:
Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation. Microelectron. Reliab. 51(9-11): 1652-1657 (2011) - 2010
- [j15]Philipp Scholz, Christian Gallrapp, Uwe Kerst, Ted R. Lundquist, Christian Boit:
Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments. Microelectron. Reliab. 50(9-11): 1441-1445 (2010) - [j14]Mahyar Boostandoost, Uwe Kerst, Christian Boit:
Extraction of local thin-film solar cell parameters by bias-dependent IR-LBIC. Microelectron. Reliab. 50(9-11): 1899-1902 (2010)
2000 – 2009
- 2009
- [j13]Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Ted R. Lundquist, Peter Egger, Christian Boit:
Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing. Microelectron. Reliab. 49(9-11): 1158-1164 (2009) - [j12]Arkadiusz Glowacki, Piotr Laskowski, Christian Boit, Ponky Ivo, Eldad Bahat-Treidel, Reza Pazirandeh, Richard Lossy, Joachim Würfl, Günther Tränkle:
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures. Microelectron. Reliab. 49(9-11): 1211-1215 (2009) - 2008
- [j11]Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted R. Lundquist:
Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. IEEE Des. Test Comput. 25(3): 250-257 (2008) - [j10]Piotr Laskowski, Arkadiusz Glowacki, Christian Boit:
Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits. Microelectron. Reliab. 48(8-9): 1295-1299 (2008) - [j9]Ulrike Kindereit, Christian Boit, Uwe Kerst, Steven Kasapi, Radu Ispasoiu, Roy Ng, William K. Lo:
Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. Microelectron. Reliab. 48(8-9): 1322-1326 (2008) - [j8]Tuba Kiyan, Christof Brillert, Christian Boit:
Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition. Microelectron. Reliab. 48(8-9): 1327-1332 (2008) - 2007
- [j7]Rudolf Schlangen, Uwe Kerst, Christian Boit, Tahir Malik, Rajesh Jain, Ted R. Lundquist:
Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy. Microelectron. Reliab. 47(9-11): 1523-1528 (2007) - [c1]Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted R. Lundquist, Bernd Krüger:
Backside E-Beam Probing on Nano scale devices. ITC 2007: 1-9 - 2006
- [j6]Rudolf Schlangen, Peter Sadewater, Uwe Kerst, Christian Boit:
Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node. Microelectron. Reliab. 46(9-11): 1498-1503 (2006) - 2005
- [j5]Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki:
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout. Microelectron. Reliab. 45(9-11): 1487-1492 (2005) - [j4]Rudolf Schlangen, Uwe Kerst, A. Kabakow, Christian Boit:
Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations. Microelectron. Reliab. 45(9-11): 1544-1549 (2005) - 2004
- [j3]Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki, Hiroyoshi Suzuki:
Localization of FET Device Performance with Thermal Laser Stimulation. Microelectron. Reliab. 44(9-11): 1699-1702 (2004) - 2001
- [j2]Bernd Ebersberger, Alexander Olbrich, Christian Boit:
Scanning probe microscopy in semiconductor failure analysis. Microelectron. Reliab. 41(8): 1231-1236 (2001) - [j1]Bernd Ebersberger, Alexander Olbrich, Christian Boit:
Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis. Microelectron. Reliab. 41(9-10): 1449-1458 (2001)
Coauthor Index
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