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Erik Larsson

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Urban Ingelsson

> Home > Persons > Erik Larsson

Publications

2017
[j22]
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  - journals/et/SenGuptaNIL17
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  - https://dblp.org/rec/journals/et/SenGuptaNIL17
Breeta SenGupta, Dimitar Nikolov, Urban Ingelsson, Erik Larsson:
Test Planning for Core-based Integrated Circuits under Power Constraints. J. Electron. Test. 33(1): 7-23 (2017)
2015
[j18]
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  - journals/tc/IngelssonGLM15
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Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen:
Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption. IEEE Trans. Computers 64(12): 3335-3347 (2015)
2014
[j17]
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  - journals/mr/NikolovISL14
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Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson:
Evaluation of Level of Confidence and Optimization of Roll-back Recovery with Checkpointing for Real-Time Systems. Microelectron. Reliab. 54(5): 1022-1049 (2014)
[c61]
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  - conf/iolts/PetersenNICZL14
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Kim Petersén, Dimitar Nikolov, Urban Ingelsson, Gunnar Carlsson, Farrokh Ghani Zadegan, Erik Larsson:
Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687. IOLTS 2014: 170-175
2012
[j15]
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  - journals/dt/ZadeganILC12
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Farrokh Ghani Zadegan, Urban Ingelsson, Erik Larsson, Gunnar Carlsson:
Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687. IEEE Des. Test Comput. 29(2): 79-88 (2012)
[j14]
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Breeta SenGupta, Urban Ingelsson, Erik Larsson:
Scheduling Tests for 3D Stacked Chips under Power Constraints. J. Electron. Test. 28(1): 121-135 (2012)
[j13]
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  - journals/tc/ZadeganICL12
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Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Access Time Analysis for IEEE P1687. IEEE Trans. Computers 61(10): 1459-1472 (2012)
[c53]
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  - conf/vlsid/SenGuptaIL12
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Breeta SenGupta, Urban Ingelsson, Erik Larsson:
Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias. VLSI Design 2012: 442-447
2011
[c52]
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  - conf/ats/ZadeganIACL11
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Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson:
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints. Asian Test Symposium 2011: 525-531
[c51]
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  - conf/date/ZadeganICL11
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Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Design automation for IEEE P1687. DATE 2011: 1412-1417
[c50]
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  - conf/ddecs/IngelssonCL11
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Urban Ingelsson, Shih-Yen Chang, Erik Larsson:
Measurement point selection for in-operation wear-out monitoring. DDECS 2011: 381-386
[c49]
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  - conf/delta/SenGuptaIL11
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Breeta SenGupta, Urban Ingelsson, Erik Larsson:
Scheduling Tests for 3D Stacked Chips under Power Constraints. DELTA 2011: 72-77
[c48]
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  - conf/dsn/NikolovISL11
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Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson:
Level of confidence evaluation and its usage for Roll-back Recovery with Checkpointing optimization. DSN Workshops 2011: 59-64
2010
[c46]
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  - conf/ats/MajeedAICL10
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Mudassar Majeed, Daniel Ahlstrom, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Efficient Embedding of Deterministic Test Data. Asian Test Symposium 2010: 159-162
[c45]
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  - conf/ats/ZadeganICL10
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Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson:
Test Time Analysis for IEEE P1687. Asian Test Symposium 2010: 455-460
[c43]
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  - conf/delta/NikolovISL10
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Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson:
Estimating Error-probability and its Application for Optimizing Roll-back Recovery with Checkpointing. DELTA 2010: 281-285
2005
[c21]
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  - conf/ets/IngelssonGLM05
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Urban Ingelsson, Sandeep Kumar Goel, Erik Larsson, Erik Jan Marinissen:
Test scheduling for modular SOCs in an abort-on-fail environment. ETS 2005: 8-13

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