Wojciech Maly

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Rao Desineni

> Home > Persons > Wojciech Maly

Publications

2006
[c65]
- view
  authority control:
- export record
  dblp key:
  - conf/date/NelsonZDBPMB06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/date/NelsonZDBPMB06
Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton:
Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918
2004
[c63]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/VogelsZDBMBNFHGMRT04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/VogelsZDBMBNFHGMRT04
Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary:
Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. ITC 2004: 508-517
2002
[c59]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/BlantonCDDMV02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/BlantonCDDMV02
Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels:
Fault Tuples in Diagnosis of Deep-Submicron Circuits. ITC 2002: 233-241

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.