Laurent Béchou

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Yves Ousten

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Publications

2018
[j21]
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  - journals/mr/BalmontBPBO18
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M. Balmont, Isabelle Bord-Majek, B. Poupard, Laurent Béchou, Yves Ousten:
Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability. Microelectron. Reliab. 88-90: 1108-1112 (2018)
2015
[j17]
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  - journals/mr/BaillotDOB15
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Raphael Baillot, Yannick Deshayes, Yves Ousten, Laurent Béchou:
Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage. Microelectron. Reliab. 55(9-10): 1759-1764 (2015)
2011
[j14]
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  - journals/mr/SpezziguBQGOV11
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Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi:
An original DoE-based tool for silicon photodetectors EoL estimation in space environments. Microelectron. Reliab. 51(9-11): 1999-2003 (2011)
2010
[j12]
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  - journals/mr/BaillotDBBPAVSO10
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Raphael Baillot, Yannick Deshayes, Laurent Béchou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Yves Ousten:
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses. Microelectron. Reliab. 50(9-11): 1568-1573 (2010)
2008
[j11]
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  - journals/mr/BourquiBGDVHROT08
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M. L. Bourqui, Laurent Béchou, Olivier Gilard, Yannick Deshayes, Pamela Del Vecchio, L. S. How, F. Rosala, Yves Ousten, André Touboul:
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications. Microelectron. Reliab. 48(8-9): 1202-1207 (2008)
[j10]
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Yannick Deshayes, Isabelle Bord-Majek, G. Barreau, M. Aiche, Philippe Moretto, Laurent Béchou, A. C. Roehrig, Yves Ousten:
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation. Microelectron. Reliab. 48(8-9): 1354-1360 (2008)
2006
[j9]
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  - journals/mr/AugereauOLB06
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Jean Augereau, Yves Ousten, Bruno Levrier, Laurent Béchou:
Use of signal processing imaging for the study of a 3D package in harsh environment. Microelectron. Reliab. 46(9-11): 1922-1925 (2006)
2003
[j3]
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  - journals/tim/BechouDDDOR03
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Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano:
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE Trans. Instrum. Meas. 52(1): 135-142 (2003)
2002
[j2]
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  - journals/mr/TregonODBP02
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B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, Bernard Parmentier:
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectron. Reliab. 42(7): 1113-1120 (2002)
[j1]
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  - journals/mr/AugereauOBD02
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Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto:
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets). Microelectron. Reliab. 42(9-11): 1517-1522 (2002)

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