José Pineda de Gyvez

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Guido Gronthoud

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Publications

2006
[j18]
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Amir Zjajo, José Pineda de Gyvez, Guido Gronthoud:
Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits. J. Electron. Test. 22(4-6): 399-409 (2006)
2005
[j15]
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José Pineda de Gyvez, Guido Gronthoud, Rashid Amine:
Multi-VDD Testing for Analog Circuits. J. Electron. Test. 21(3): 311-322 (2005)
[c30]
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Estella Silva, José Pineda de Gyvez, Guido Gronthoud:
Functional vs. multi-VDD testing of RF circuits. ITC 2005: 9
2004
[c23]
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José Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller:
Power Supply Ramping for Quasi-static Testing of PLLs. ITC 2004: 980-987
2003
[c19]
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  - conf/ets/Arumi-DelgadoRG03
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Daniel Arumí-Delgado, Rosa Rodríguez-Montañés, José Pineda de Gyvez, Guido Gronthoud:
Process-variability aware delay fault testing of ΔV_T and weak-open defects. ETW 2003: 85-90
[c17]
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José Pineda de Gyvez, Guido Gronthoud, Rashid Amine:
VDD Ramp Testing for RF Circuits. ITC 2003: 651-658

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