Hans G. Kerkhoff

◀ ▶ joint publications with Muhammad Aamir Khan 0002

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Publications

2014
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Muhammad Aamir Khan, Hans G. Kerkhoff:
Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs. DDECS 2014: 15-20
2013
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Muhammad Aamir Khan, Hans G. Kerkhoff:
An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. DDECS 2013: 159-164
[c61]
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Muhammad Aamir Khan, Hans G. Kerkhoff:
Analysing degradation effects in charge-redistribution SAR ADCs. DFTS 2013: 65-70
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Muhammad Aamir Khan, Hans G. Kerkhoff:
The Essence of Reliability Estimation during Operational Life for Achieving High System Dependability. DSD 2013: 575-581
[c58]
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Muhammad Aamir Khan, Hans G. Kerkhoff:
Monitoring operating temperature and supply voltage in achieving high system dependability. DTIS 2013: 108-112
2011
[c50]
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Muhammad Aamir Khan, Hans G. Kerkhoff:
A system-level platform for dependability enhancement and its analysis for mixed-signal SoCs. DDECS 2011: 17-22
[c49]
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Muhammad Aamir Khan, Hans G. Kerkhoff:
SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. DFT 2011: 374-381

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