Guido Groeseneken

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Kris Croes

> Home > Persons > Guido Groeseneken

Publications

2002
[j5]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/AndriesDCCSGLDD02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/AndriesDCCSGLDD02
E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen:
Statistical aspects of the degradation of LDD nMOSFETs. Microelectron. Reliab. 42(9-11): 1409-1413 (2002)
2001
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/DreesenCMCSPG01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/DreesenCMCSPG01
R. Dreesen, Kris Croes, Jean Manca, Ward De Ceuninck, Luc De Schepper, A. Pergoot, Guido Groeseneken:
A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation. Microelectron. Reliab. 41(3): 437-443 (2001)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.