Chunping Hou

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Shuwei Huo

> Home > Persons > Chunping Hou

Publications

2020
[j83]
- view
  authority control:
- export record
  dblp key:
  - journals/tcsv/ZhouZHHK20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcsv/ZhouZHHK20
Yuan Zhou, Tianhao Zhang, Shuwei Huo, Chunping Hou, Sun-Yuan Kung:
Adaptive Irregular Graph Construction-Based Salient Object Detection. IEEE Trans. Circuits Syst. Video Technol. 30(6): 1569-1582 (2020)
2019
[j69]
- view
  authority control:
- export record
  dblp key:
  - journals/tcyb/ZhouHXHK19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcyb/ZhouHXHK19
Yuan Zhou, Shuwei Huo, Wei Xiang, Chunping Hou, Sun-Yuan Kung:
Semi-Supervised Salient Object Detection Using a Linear Feedback Control System Model. IEEE Trans. Cybern. 49(4): 1173-1185 (2019)
2018
[j49]
- view
  authority control:
- export record
  dblp key:
  - journals/tmm/HuoZLLH18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tmm/HuoZLLH18
Shuwei Huo, Yuan Zhou, Jianjun Lei, Nam Ling, Chunping Hou:
Iterative Feedback Control-Based Salient Object Segmentation. IEEE Trans. Multim. 20(6): 1350-1364 (2018)
2017
[c31]
- view
  authority control:
- export record
  dblp key:
  - conf/icip/Zhang0HH17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icip/Zhang0HH17
Tianhao Zhang, Yuan Zhou, Shuwei Huo, Chunping Hou:
Label propagation based saliency detection via graph design. ICIP 2017: 460-464

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.