Joanne M. Atlee

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Rafael Olaechea

> Home > Persons > Joanne M. Atlee

Publications

2018
[c49]
- view
  authority control:
- export record
  dblp key:
  - conf/icse/OlaecheaALF18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icse/OlaecheaALF18
Rafael Olaechea, Joanne M. Atlee, Axel Legay, Uli Fahrenberg:
Trace checking for dynamic software product lines. SEAMS@ICSE 2018: 69-75
2016
[c44]
- view
  authority control:
- export record
  dblp key:
  - conf/splc/OlaecheaFAL16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/splc/OlaecheaFAL16
Rafael Olaechea, Uli Fahrenberg, Joanne M. Atlee, Axel Legay:
Long-term average cost in featured transition systems. SPLC 2016: 109-118
[i2]
- view
  - electronic edition @ arxiv.org (open access)
  - references & citations
- export record
  dblp key:
  - journals/corr/OlaecheaFAL16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/corr/OlaecheaFAL16
Rafael Olaechea, Uli Fahrenberg, Joanne M. Atlee, Axel Legay:
Long-Term Average Cost in Featured Transition Systems. CoRR abs/1604.06781 (2016)
2014
[c39]
- view
  authority control:
- export record
  dblp key:
  - conf/kbse/GuoZORCAA14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/kbse/GuoZORCAA14
Jianmei Guo, Edward Zulkoski, Rafael Olaechea, Derek Rayside, Krzysztof Czarnecki, Sven Apel, Joanne M. Atlee:
Scaling exact multi-objective combinatorial optimization by parallelization. ASE 2014: 409-420

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.