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Wojciech Maly
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Publications
- 2010
- [c72]Wing Chiu Tam, R. D. (Shawn) Blanton, Wojciech Maly:
Evaluating yield and testing impact of sub-wavelength lithography. VTS 2010: 200-205 - 2006
- [j22]Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs. IEEE Des. Test Comput. 23(5): 390-400 (2006) - [c65]Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton:
Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918 - 2004
- [c63]Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, Vyacheslav Rovner, S. Tiwary:
Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. ITC 2004: 508-517 - 2003
- [c61]Thomas J. Vogels, Wojciech Maly, R. D. (Shawn) Blanton:
Progressive Bridge Identification. ITC 2003: 309-318 - [c60]Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey:
Deformations of IC Structure in Test and Yield Learning. ITC 2003: 856-865 - 2002
- [j20]Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly:
Modeling the Economics of Testing: A DFT Perspective. IEEE Des. Test Comput. 19(1): 29-41 (2002) - [c59]Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels:
Fault Tuples in Diagnosis of Deep-Submicron Circuits. ITC 2002: 233-241 - 1997
- [c41]Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly:
To DFT or Not to DFT? ITC 1997: 557-566
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