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ORCIDM. Amine Salhi
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2000 – 2009
- 2009
[j6]Stéphane Grauby
, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire:
Joule expansion imaging techniques on microlectronic devices. Microelectron. J. 40(9): 1367-1372 (2009)- 2008
- [j5]Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire:
Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectron. Reliab. 48(2): 204-211 (2008) - [c2]Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire:
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. ETS 2008: 47-52 - 2006
- [j4]Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire:
Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectron. Reliab. 46(9-11): 1520-1524 (2006) - 2005
- [j3]Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire:
ElectroStatic Discharge Fault Localization by Laser Probing. Microelectron. Reliab. 45(9-11): 1482-1486 (2005) - 2004
- [j2]Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz:
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectron. J. 35(10): 797-803 (2004) - [c1]Josep Altet, Antonio Rubio, M. Amine Salhi, Jose Luis Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov:
Sensing temperature in CMOS circuits for Thermal Testing. VTS 2004: 179-184 - 2003
- [j1]Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys:
Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectron. Reliab. 43(9-11): 1609-1613 (2003)
Coauthor Index
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