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F.-J. Vermersch

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2006
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Mathieu Boutillier, Olivier Gauthier-Lafaye, S. Bonnefont, F. Lozes-Dupuy, F.-J. Vermersch, M. Krakowski, Olivier Gilard:
Strong electron irradiation hardness of 852 nm Al-free laser diodes. Microelectron. Reliab. 46(9-11): 1715-1719 (2006)

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