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Seiji Inumiya

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2010 – 2019

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2013
[j2]
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  - journals/mr/HiranoNFGNISMY13
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  - https://dblp.org/rec/journals/mr/HiranoNFGNISMY13
Izumi Hirano, Yasushi Nakasaki, Shigeto Fukatsu, Masakazu Goto, Koji Nagatomo, Seiji Inumiya, Katsuyuki Sekine, Yuichiro Mitani, Kikuo Yamabe:
Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing. Microelectron. Reliab. 53(12): 1868-1874 (2013)

2000 – 2009

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2007
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  - journals/ieicet/PeiMHMIN07
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Yanli Pei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki, Seiji Inumiya, Yasuo Nara:
Evaluation of Dielectric Reliability of Ultrathin HfSiO_xN_y in Metal-Gate Capacitors. IEICE Trans. Electron. 90-C(5): 962-967 (2007)

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