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2020 – today
- 2022
[j11]Abhishek Jain
, Andrea Mario Veggetti, Dennis Crippa, Antonio Benfante, Simone Gerardin, Marta Bagatin:
Radiation Tolerant Multi-Bit Flip-Flop System With Embedded Timing Pre-Error Sensing. IEEE J. Solid State Circuits 57(9): 2878-2890 (2022)- 2021
- [j10]Carlo Cazzaniga, Marta Bagatin, Simone Gerardin, Alessandra Costantino, Christopher D. Frost:
First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics. IEEE Trans. Emerg. Top. Comput. 9(1): 104-108 (2021) - 2020
- [c9]Abhishek Jain, Andrea Veggetti, Dennis Crippa, Antonio Benfante, Simone Gerardin, Marta Bagatin:
Single Phase Clock Based Radiation Tolerant D Flip-flop Circuit. IOLTS 2020: 1-6
2010 – 2019
- 2018
- [j9]Federica Resta, Simone Gerardin, S. Mattiazzo, Alessandro Paccagnella, Marcello De Matteis, Christian C. Enz, Andrea Baschirotto:
1GigaRad TID impact on 28 nm HEP analog circuits. Integr. 63: 306-314 (2018) - 2015
- [j8]Marta Bagatin, Simone Gerardin:
Soft errors in floating gate memory cells: A review. Microelectron. Reliab. 55(1): 24-30 (2015) - [c8]N. Demaria, G. Dellacasa, G. Mazza, Angelo Rivetti, Manuel D. Da Rocha Rolo, E. Monteil, L. Pacher, Fabio Ciciriello, Francesco Corsi, Cristoforo Marzocca, G. De Roberts, F. Loddo, C. Tamma, Marta Bagatin, D. Bisello, Simone Gerardin, S. Mattiazzo, L. Ding, Piero Giubilato, Alessandro Paccagnella, Francesco De Canio, Luigi Gaioni, Massimo Manghisoni, Valerio Re, Gianluca Traversi, Elisa Riceputi, Lodovico Ratti, Carla Vacchi, Roberto Beccherle, Guido Magazzù, M. Minuti, Fabio Morsani, Fabrizio Palla, Valentino Liberali, Seyedruhollah Shojaii, Alberto Stabile, Gian Mario Bilei, Mauro Menichelli, Elia Conti, Sara Marconi, D. Passen, Pisana Placidi:
CHIPIX65: Developments on a new generation pixel readout ASIC in CMOS 65 nm for HEP experiments. IWASI 2015: 49-54 - 2014
- [j7]Antonio Stocco, Simone Gerardin, Davide Bisi, Stefano Dalcanale, Fabiana Rampazzo, Matteo Meneghini, Gaudenzio Meneghesso, Jan Grünenpütt, Benoit Lambert, Hervé Blanck, Enrico Zanoni:
Proton induced trapping effect on space compatible GaN HEMTs. Microelectron. Reliab. 54(9-10): 2213-2216 (2014) - [c7]Isabella Rossetto, Fabiana Rampazzo, Simone Gerardin, Matteo Meneghini, Marta Bagatin, Alberto Zanandrea, Alessandro Paccagnella, Gaudenzio Meneghesso, Enrico Zanoni, Christian Dua, Marie-Antoinette di Forte-Poisson, Raphael Aubry, Mourad Oualli, Sylvain L. Delage:
Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences. ESSDERC 2014: 381-384 - 2012
- [j6]Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Carla Andreani, Giuseppe Gorini, C. D. Frost:
Temperature dependence of neutron-induced soft errors in SRAMs. Microelectron. Reliab. 52(1): 289-293 (2012) - [c6]Cristiana Bolchini, Antonio Miele, Chiara Sandionigi, Marco Ottavi, Salvatore Pontarelli, Adelio Salsano, Cecilia Metra, Martin Omaña, Daniele Rossi, Matteo Sonza Reorda, Luca Sterpone, Massimo Violante, Simone Gerardin, Marta Bagatin, Alessandro Paccagnella:
High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies. DFT 2012: 121-125 - 2010
- [j5]Marta Bagatin, Simone Gerardin, Alessandro Paccagnella, Giorgio Cellere, F. Irom, D. N. Nguyen:
Destructive events in NAND Flash memories irradiated with heavy ions. Microelectron. Reliab. 50(9-11): 1832-1836 (2010) - [j4]Simone Gerardin, Marta Bagatin, Alessandro Paccagnella, G. Cellere, Angelo Visconti, Mauro Bonanomi:
Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectron. Reliab. 50(9-11): 1837-1841 (2010)
2000 – 2009
- 2009
- [c5]Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello:
Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS 2009: 69-74 - [c4]Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda:
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS 2009: 276-281 - 2008
- [c3]Niccolò Battezzati, Simone Gerardin, Andrea Manuzzato, Alessandro Paccagnella, Sana Rezgui, Luca Sterpone, Massimo Violante:
On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. IOLTS 2008: 135-140 - 2007
- [j3]Javier Martín-Martínez, Simone Gerardin, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. Microelectron. Reliab. 47(9-11): 1349-1352 (2007) - [c2]Andrea Manuzzato, Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Luca Sterpone, Massimo Violante:
Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. DFT 2007: 79-86 - [c1]Marta Bagatin, Giorgio Cellere, Simone Gerardin, Alessandro Paccagnella, Angelo Visconti, Silvia Beltrami, M. Maccarrone:
Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS 2007: 146-151 - 2006
- [j2]Simone Gerardin, Alessio Griffoni, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectron. Reliab. 46(9-11): 1669-1672 (2006) - [j1]Francesca Danesin, Franco Zanon, Simone Gerardin, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella:
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. 46(9-11): 1750-1753 (2006)
Coauthor Index
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