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Mu-Der Jeng
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2010 – 2019
- 2016
[c45]Quanquan Liu, Bo Zhang, Yi-Hung Liu, Yu-Tsung Hsiao, Mu-Der Jeng, Masakatsu G. Fujie:
Integration of visual feedback system and motor current based gait rehabilitation robot for motor recovery. SMC 2016: 1856-1860- 2014
- [c44]Yi-Hung Liu, Wei-Teng Cheng, Yu-Tsung Hsiao, Chien-Te Wu
, Mu-Der Jeng:
EEG-based emotion recognition based on kernel Fisher's discriminant analysis and spectral powers. SMC 2014: 2221-2225 - 2013
- [j36]Yen-Liang Pan, Yi-Sheng Huang, Yi-Shun Weng, Weimin Wu, MuDer Jeng:
Computationally Improved Optimal Control Methodology for Linear Programming Problems of Flexible Manufacturing Systems. J. Appl. Math. 2013: 294835:1-294835:11 (2013) - [c43]Yen-Liang Pan, Hesuan Hu, MuDer Jeng:
One computationally improved deadlock prevention policy for flexible manufacturing systems using Petri nets. CASE 2013: 924-929 - [c42]Yi-Sheng Huang, Yi-Shun Weng, MuDer Jeng, Bo-Yang Chen:
Based on Synchronized Timed Petri Nets for Urban Traffic Control Systems. SMC 2013: 384-390 - [c41]Yen-Liang Pan, Mu-Der Jeng, Sheng-Luen Chung, Yu-Xin Guo:
Computationally Improved Optimal Deadlock Prevention Policy for Linear Programming Problems of Flexible Manufacturing Systems. SMC 2013: 2366-2371 - 2012
- [c40]Yen-Liang Pan, Yi-Sheng Huang, MuDer Jeng, Sheng-Luen Chung:
Using theory of regions with selective siphon control for deadlock prevention policy in Petri nets. SMC 2012: 1189-1194 - 2011
- [j35]Chuan-Yu Chang, ChunHsi Li, Yung-Chi Chang, MuDer Jeng:
Wafer defect inspection by neural analysis of region features. J. Intell. Manuf. 22(6): 953-964 (2011) - [j34]Chih-Tang Chang, Jim Z. C. Lai, Mu-Der Jeng:
A Fuzzy K-means Clustering Algorithm Using Cluster Center Displacement. J. Inf. Sci. Eng. 27(3): 995-1009 (2011) - [j33]ChunHsi Li, Chuan-Yu Chang, MuDer Jeng:
Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection. IEEE Trans. Syst. Man Cybern. Part C 41(6): 842-853 (2011) - [c39]Yen-Liang Pan, Yi-Sheng Huang, MuDer Jeng:
An efficient deadlock prevention policy for FMSs using reduction method and theory of regions. SMC 2011: 568-573 - [c38]Po-Lun Chang, Yu-Xin Guo, MuDer Jeng:
Telematics gateway and power saving method for electric vehicles. SMC 2011: 780-785 - [c37]Yi-Sheng Huang, Ho-Shan Chiang, MuDer Jeng:
Fault measure of discrete event systems using probabilistic timed automata. SMC 2011: 1218-1223 - 2010
- [j32]Chih-Tang Chang, Jim Z. C. Lai, Mu-Der Jeng:
Fast agglomerative clustering using information of k-nearest neighbors. Pattern Recognit. 43(12): 3958-3968 (2010) - [c36]Yi-Sheng Huang, Yen-Liang Pan, MuDer Jeng, Po-Lun Chang:
Enhancement of an deadlock prevention policy for FMSs using theory of regions. SMC 2010: 304-309 - [c35]Yi-Sheng Huang, Shuo-Xian Liau, MuDer Jeng:
Modeling and analysis of traffic light controller using Statechart. SMC 2010: 557-562 - [c34]ChunHsi Li, Chuan-Yu Chang, MuDer Jeng, Yang-Ting Jeng:
A case study of applying regional level-set formulation to post-sawing LED wafer inspection. SMC 2010: 2745-2752
2000 – 2009
- 2009
- [j31]Chuan-Yu Chang, ChunHsi Li, Jia-Wei Chang, MuDer Jeng:
An unsupervised neural network approach for automatic semiconductor wafer defect inspection. Expert Syst. Appl. 36(1): 950-958 (2009) - [j30]Chuan-Yu Chang, ChunHsi Li, Si-Yan Lin, MuDer Jeng:
Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection. IEEE Trans. Syst. Man Cybern. Part C 39(3): 352-365 (2009) - [c33]Yi-Sheng Huang, MuDer Jeng:
An Enforcing Supervisor for Flexible Manufacturing Systems Using Theory of Regions. SMC 2009: 187-192 - [c32]Chuan-Yu Chang, Yung-Chi Chang, ChunHsi Li, MuDer Jeng:
Automatic Die Inspection for Post-sawing LED Wafers. SMC 2009: 1615-1620 - [c31]Po-Lun Chang, Ying-Kuei Yang, Wei-Lieh Hsu, Fei-Hu Hsieh, MuDer Jeng, Yu-Xin Guo:
A Novel Consumer Clock Device Based on Grey Relational Analysis. SMC 2009: 4613-4617 - 2008
- [j29]ZhiWu Li, MengChu Zhou, MuDer Jeng:
A Maximally Permissive Deadlock Prevention Policy for FMS Based on Petri Net Siphon Control and the Theory of Regions. IEEE Trans Autom. Sci. Eng. 5(1): 182-188 (2008) - [c30]YuanLin Wen, MuDer Jeng:
Diagnosable discrete event system design: A case study of automatic temperature control system. SMC 2008: 3691-3696 - 2007
- [j28]MuDer Jeng, MengChu Zhou:
Guest Editorial Special Issue on Engineering Applications of Petri Nets. IEEE Trans. Syst. Man Cybern. Part C 37(4): 442-443 (2007) - [j27]Da-Yin Liao, MuDer Jeng, MengChu Zhou:
Application of Petri Nets and Lagrangian Relaxation to Scheduling Automatic Material-Handling Vehicles in 300-mm Semiconductor Manufacturing. IEEE Trans. Syst. Man Cybern. Part C 37(4): 504-516 (2007) - [c29]Chii-Ruey Lin, Pei-Shu Fan, Yea-Jou Shiau, MuDer Jeng:
An Agent-Based Early Manufacturability Assessment for Collaborative Design in Coating Process. KES (2) 2007: 649-655 - [c28]YuanLin Wen, Sheng-Luen Chung, Li-Der Jeng, MuDer Jeng:
Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines. KES (2) 2007: 877-884 - [c27]YuanLin Wen, Pei-Shu Fan, MuDer Jeng:
Diagnosable discrete event systems design. SMC 2007: 1357-1362 - 2006
- [j26]C.-P. Lin, Mu-Der Jeng:
An Expanded SEMATECH CIM Framework for Heterogeneous Applications Integration. IEEE Trans. Syst. Man Cybern. Part A 36(1): 76-90 (2006) - [j25]Yi-Sheng Huang, MuDer Jeng, Xiaolan Xie, Da-Hsiang Chung:
Siphon-Based Deadlock Prevention Policy for Flexible Manufacturing Systems. IEEE Trans. Syst. Man Cybern. Part A 36(6): 1248-1256 (2006) - [c26]YuanLin Wen, MuDer Jeng, Li-Der Jeng, Pei-Shu Fan:
An Intelligent Technique Based on Petri Nets for Diagnosability Enhancement of Discrete Event Systems. KES (2) 2006: 879-887 - [c25]YuanLin Wen, ChunHsi Li, MuDer Jeng:
Diagnosability Enhancement of Discrete Event Systems. SMC 2006: 4096-4101 - 2005
- [j24]MuDer Jeng, Xiaolan Xie:
Discrete event system techniques for CIM: guest editorial. Int. J. Comput. Integr. Manuf. 18(2&3): 97-99 (2005) - [j23]Chang-Pin Lin, Li-Der Jeng, Yi-Ping Lin, MuDer Jeng:
Management and control of information flow in CIM systems using UML and Petri nets. Int. J. Comput. Integr. Manuf. 18(2&3): 107-121 (2005) - [j22]Chung-Hsien Kuo, Han-Pang Huang, MuDer Jeng, Li-Der Jeng:
Separation model design of manufacturing systems using the distributed agent-oriented Petri net. Int. J. Comput. Integr. Manuf. 18(2&3): 146-157 (2005) - [j21]MuDer Jeng:
Comments on "Timed Petri Nets in Modeling and Analysis of Cluster Tools". IEEE Trans Autom. Sci. Eng. 2(1): 92-93 (2005) - [c24]Chuan-Yu Chang, Si-Yan Lin, MuDer Jeng:
Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection. CASE 2005: 301-306 - [c23]Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng:
An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection. ICRA 2005: 3000-3005 - [c22]Chung-Hsien Kuo, Jein-Jong Wing, Eric Lee, MuDer Jeng:
Development of route oriented Petri net for cycle time evaluations in SMT assemblies industries. SMC 2005: 2536-2541 - [c21]YuanLin Wen, ChunHsi Li, MuDer Jeng:
A polynomial algorithm for checking diagnosability of Petri nets. SMC 2005: 2542-2547 - 2004
- [j20]MuDer Jeng, Mengchu Zhou, Thomas Wen-Yao Chen:
Special issue on semiconductor factory automation. 1. System-level automation (From the guest editors). IEEE Robotics Autom. Mag. 11(1): 3 (2004) - [j19]Sheng-Luen Chung, MuDer Jeng:
Fabulous MESs and C/Cs: an overview of semiconductor fab automation systems. IEEE Robotics Autom. Mag. 11(1): 8-18 (2004) - [j18]MuDer Jeng, Mengchu Zhou, Thomas Wen-Yao Chen:
Recent advances in semiconductor factory automation, part 2: equipment-level automation. IEEE Robotics Autom. Mag. 11(3): 4 (2004) - [j17]Sheng-Luen Chung, MuDer Jeng:
Scenario normalization techniques - inline stepper coordinator design. IEEE Robotics Autom. Mag. 11(3): 14-21 (2004) - [j16]MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung:
ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. IEEE Trans. Syst. Man Cybern. Part A 34(1): 102-112 (2004) - [c20]Da-Yin Liao, MuDer Jeng, MengChu Zhou:
Petri Net Modeling and Lagrangian Relaxation Approach to Vehicle Scheduling in 300 mm Semiconductor Manufacturing. ICRA 2004: 5301-5306 - [c19]Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng:
Using a self-organizing neural network for wafer defect inspection. SMC (5) 2004: 4312-4317 - [c18]YuanLin Wen, MuDer Jeng:
Diagnosability of Petri nets. SMC (5) 2004: 4891-4896 - 2003
- [c17]MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung:
ERCN merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. ICRA 2003: 1033-1038 - [c16]Sheng-Luen Chung, MuDer Jeng:
AN overview of semiconductor fab automation systems. ICRA 2003: 1050-1055 - [c15]Yi-Sheng Huang, Sheng-Luen Chung, MuDer Jeng, Jenn-Huei Lin:
Design and implementation of a discrete event system using statecharts. SMC 2003: 1147-1152 - [c14]Sheng-Luen Chung, Chien-Chung Wu, MuDer Jeng:
Failure diagnosis: a case study on modeling and analysis by Petri nets. SMC 2003: 2727-2732 - 2002
- [j15]MuDer Jeng, Xiaolan Xie, Mao Yu Peng:
Process nets with resources for manufacturing modeling and their analysis. IEEE Trans. Robotics Autom. 18(6): 875-889 (2002) - [c13]Yi-Sheng Huang, MuDer Jeng, YuanLin Wen:
Analysis of a Siphon-Based Deadlock Prevention Policy for Flexible Manufacturing Systems. ICRA 2002: 2327-2332 - [c12]Sheng-Luen Chung, MuDer Jeng:
Normalized In-Line Stepper Coordinator Design by the Sequence Diagram and Production Rules: A Case Study. ICRA 2002: 3169-3174 - [c11]MuDer Jeng, Weizhao Lu:
Extension of UML and Its Conversion to Petri Nets for Semiconductor Manufacturing Modeling. ICRA 2002: 3175-3180 - 2001
- [j14]Yi-Sheng Huang, MuDer Jeng, Sheng-Luen Chung:
Design, analysis and implementation of a real-world manufacturing cell controller based on Petri nets. Int. J. Comput. Integr. Manuf. 14(3): 304-318 (2001) - [j13]MuDer Jeng, Xiaolan Xie:
Guest editorial. IEEE Trans. Robotics Autom. 17(5): 545-547 (2001) - [j12]MuDer Jeng, Xiaolan Xie:
Modeling and analysis of semiconductor manufacturing systems with degraded behavior using Petri nets and siphons. IEEE Trans. Robotics Autom. 17(5): 576-588 (2001) - [c10]MuDer Jeng, Xiaolan Xie:
Modeling and Analysis of Semiconductor Manufacturing Systems with Degraded Behaviors Using Petri Nets and Siphons. ICRA 2001: 52-57 - [c9]Yi-Sheng Huang, MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung:
A Deadlock Prevention Policy for Flexible Manufacturing Systems Using Siphons. ICRA 2001: 541-546 - 2000
- [j11]MuDer Jeng, Frank DiCesare, Xiaolan Xie:
Corrections to "synthesis using resource control nets for modeling shared-resource systems". IEEE Trans. Robotics Autom. 16(2): 202-203 (2000) - [j10]MuDer Jeng, Xiaolan Xie, WenYuan Hung:
Markovian timed Petri nets for performance analysis of semiconductor manufacturing systems. IEEE Trans. Syst. Man Cybern. Part B 30(5): 757-771 (2000) - [j9]Fan-Tien Cheng, Haw Ching Yang, Tsung-Liang Luo, Chengche Feng, MuDer Jeng:
Modeling and analysis of equipment managers in manufacturing execution systems for semiconductor packaging. IEEE Trans. Syst. Man Cybern. Part B 30(5): 772-782 (2000) - [c8]MuDer Jeng, Xiaolan Xie, Yi-Sheng Huang:
Manufacturing Modeling using Process Nets with Resources. ICRA 2000: 2185-2190
1990 – 1999
- 1999
- [j8]MuDer Jeng, Chung Shi Lin, Yi-Sheng Huang:
Petri net dynamics-based scheduling of flexible manufacturing systems with assembly. J. Intell. Manuf. 10(6): 541-555 (1999) - [j7]Xiaolan Xie, MuDer Jeng:
ERCN-merged nets and their analysis using siphons. IEEE Trans. Robotics Autom. 15(4): 692-703 (1999) - [j6]MuDer Jeng, Mao Yu Peng:
Augmented reachability trees for 1-place-unbounded generalized Petri nets. IEEE Trans. Syst. Man Cybern. Part A 29(2): 173-183 (1999) - [j5]MuDer Jeng, Xiaolan Xie:
Analysis of modularly composed nets by siphons. IEEE Trans. Syst. Man Cybern. Part A 29(4): 399-406 (1999) - 1998
- [c7]MuDer Jeng, Wan Der Chiou, YuanLin Wen:
Deadlock-free scheduling of flexible manufacturing systems based on heuristic search and Petri net structures. SMC 1998: 26-31 - [c6]MuDer Jeng, Xiaolan Xie:
Qualitative analysis and deadlock prevention of a real-world IC wafer fabrication system. SMC 1998: 475-480 - [c5]MuDer Jeng, Xiaolan Xie:
Modeling and performance analysis of semiconductor manufacturing systems. SMC 1998: 650-655 - [c4]MuDer Jeng, Xiaolan Xie:
Modeling and analysis using Petri nets for semiconductor fabrication. SMC 1998: 692-697 - [c3]MuDer Jeng, Xiaolan Xie:
Synthesis of extended resource control nets using siphons. SMC 1998: 758-763 - [c2]MuDer Jeng, Chi Liang Chuang, WenYuan Hung:
Performance evaluation of the thin film area in an IC wafer fabrication system using Petri nets. SMC 1998: 3094-3099 - 1997
- [j4]MuDer Jeng:
Petri nets for modeling automated manufacturing systems with error recovery. IEEE Trans. Robotics Autom. 13(5): 752-760 (1997) - [j3]MuDer Jeng:
A Petri net synthesis theory for modeling flexible manufacturing systems. IEEE Trans. Syst. Man Cybern. Part B 27(2): 169-183 (1997) - 1995
- [j2]MuDer Jeng, Frank DiCesare:
Synthesis using resource control nets for modeling shared-resource systems. IEEE Trans. Robotics Autom. 11(3): 317-327 (1995) - [c1]Chuan-Yu Chang, MuDer Jeng:
A Neural Network Model for the Job-Shop Sheduling Problem with the Consideration of Lots Sizes. ICRA 1995: 202-207 - 1993
- [j1]MuDer Jeng, Frank DiCesare:
A review of synthesis techniques for Petri nets with applications to automated manufacturing systems. IEEE Trans. Syst. Man Cybern. 23(1): 301-312 (1993)
Coauthor Index
Xiao-Lan Xie
aka: Xiaolan Xie
aka: Xiaolan Xie
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