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Frederick L. Taber

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Conference and Workshop Papers

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2004
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William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz:
The Leading Edge of Production Wafer Probe Test Technology. ITC 2004: 1168-1195
1998
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Frederick L. Taber:
An introduction to area array probing. ITC 1998: 277-281

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