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Craig T. Pynn

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1990 – 1999

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1997
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Craig T. Pynn:
Analyzing Manufacturing Test Costs. IEEE Des. Test Comput. 14(3): 36-40 (1997)
1995
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Douglas W. Raymond, D. Eugene Wedge, Philip J. Stringer, Harold W. Ng, Suzanne T. Jennings, Craig T. Pynn, Winsor Soule Jr.:
Algorithmic Extraction of BSDL from 1149.1-compliant Sample ICs. ITC 1995: 561-568

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