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ORCIDWilfried Daehn
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2000 – 2009
- 2001
[c13]Wilfried Daehn:
Demodulation based testing of off-chip driver performance. ETW 2001: 42-47
1990 – 1999
- 1998
- [c12]Werner van Almsick, Thorsten Drabe, Wilfried Daehn, Christian Müller-Schloer:
A Central Control Engine for an Open and Hybrid Simulation Environment. DIS-RT 1998: 15-22 - [c11]Werner van Almsick, Thorsten Drabe, Wilfried Daehn, Christian Müller-Schloer:
An Open Simulation and Modeling Environment for Embedded Real-Time Systems. International Workshop on Rapid System Prototyping 1998: 95-100 - 1995
- [j8]Wilfried Daehn:
Electrosmog & electromagnetic CAD. Future Gener. Comput. Syst. 11(4-5): 439-444 (1995) - [c10]Udo Jorczyk, Wilfried Daehn, Oliver Neumann:
Fault modeling of differential ECL. EURO-DAC 1995: 190-195 - 1994
- [c9]David B. Bernstein, Werner van Almsick, Wilfried Daehn:
Distributed simulation for structural VHDL netlists. EURO-DAC 1994: 598-603 - [c8]Wilfried Daehn:
Electrosmog and Electromagnetic CAD (Invited Paper). HPCN 1994: 94-98 - 1991
- [j7]Wilfried Daehn:
Fault simulation using small fault samples. J. Electron. Test. 2(2): 191-203 (1991) - [j6]Wilfried Daehn:
Load Balancing in a Hybrid ATPG Environment. IEEE Trans. Computers 40(7): 878-882 (1991) - [j5]André Ivanov, Corot W. Starke, Vinod K. Agarwal, Wilfried Daehn, Matthias Gruetzner, Tom W. Williams:
Iterative algorithms for computing aliasing probabilities. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(2): 260-265 (1991) - 1990
- [c7]Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan:
Accelerated test pattern generation by cone-oriented circuit partitioning. EURO-DAC 1990: 418-421 - [c6]Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn:
Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. ICCAD 1990: 222-225
1980 – 1989
- 1988
- [j4]Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke:
Bounds and analysis of aliasing errors in linear feedback shift registers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 7(1): 75-83 (1988) - 1987
- [j3]Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke:
Aliasing Errors in Signature Analysis Registers. IEEE Des. Test 4(2): 39-45 (1987) - 1986
- [j2]Joachim Mucha, Wilfried Daehn, Josef Gross:
Self-Test in a Standard Cell Environment. IEEE Des. Test 3(6): 35-41 (1986) - [c5]Wilfried Daehn:
A unified treatment of PLA faults by Boolean differences. DAC 1986: 334-338 - [c4]Wilfried Daehn, Josef Gross:
A Test Generator IC for Testing Large CMOS-RAMs. ITC 1986: 18-24 - [c3]Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke:
Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials. ITC 1986: 282-289 - 1982
- [c2]G. Grassl, Wilfried Daehn, U. Ludemann, Ulrich Theus:
Ein 32-Bit-Rechenwerk mit eingebautem Hardware-Selbsttest. Fehlertolerierende Rechensysteme 1982: 45-58 - 1981
- [j1]Wilfried Daehn, Joachim Mucha:
A Hardware Approach to Self-Testing of Large Programmable Logic Arrays. IEEE Trans. Computers 30(11): 829-833 (1981) - [c1]Wilfried Daehn, Joachim Mucha:
Hardware Test Pattern Generation for Built-In Testing. ITC 1981: 110-120
Coauthor Index
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