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Ming-Fu Tsai
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2010 – 2019
- 2012
- [c5]Chia-Hao Pao, Ming-Long Fan, Ming-Fu Tsai, Yin-Nien Chen, Vita Pi-Ho Hu
, Pin Su, Ching-Te Chuang:
A comprehensive comparative analysis of FinFET and Trigate device, SRAM and logic circuits. APCCAS 2012: 463-466 - [c4]Ming-Fu Tsai, Jen-Huan Tsai, Ming-Long Fan, Pin Su, Ching-Te Chuang:
Variation tolerant CLSAs for nanoscale Bulk-CMOS and FinFET SRAM. APCCAS 2012: 471-474 - [c3]Yin-Nien Chen, Ming-Long Fan, Vita Pi-Ho Hu
, Ming-Fu Tsai, Chia-Hao Pao, Pin Su, Ching-Te Chuang:
A comparative analysis of tunneling FET circuit switching characteristics and SRAM stability and performance. ESSDERC 2012: 157-160 - [c2]Chia-Hao Pao, Ming-Long Fan, Ming-Fu Tsai, Yin-Nien Chen, Vita Pi-Ho Hu
, Pin Su, Ching-Te Chuang:
Impacts of random telegraph noise on the analog properties of FinFET and trigate devices and Widlar current source. ICICDT 2012: 1-4
2000 – 2009
- 2003
- [j2]Hong-Chou Kao, Ming-Fu Tsai, Shi-Yu Huang, Cheng-Wen Wu, Wen-Feng Chang, Shyue-Kung Lu:
Efficient Double Fault Diagnosis for CMOS Logic Circuits With a Specific Application to Generic Bridging Faults. J. Inf. Sci. Eng. 19(4): 571-587 (2003) - 2002
- [j1]Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu
:
Neighborhood pattern-sensitive fault testing and diagnostics for random-access memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(11): 1328-1336 (2002) - 2001
- [c1]Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu:
Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories. VTS 2001: 225-230
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