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Jaeheon Lee
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2020 – today
- 2024
- [j9]Joo Weon Lee, Hwi Ju Hong, Jaeheon Lee:
EWMA control charts using generalized centrality measures for social network monitoring. Commun. Stat. Simul. Comput. 53(9): 4479-4502 (2024) - 2023
- [c2]Yoona Kim, Inhyuk Choi, Juhyung Park, Jaeheon Lee, Sungjin Lee, Jihong Kim:
Integrated Host-SSD Mapping Table Management for Improving User Experience of Smartphones. FAST 2023: 441-456 - 2022
- [j8]Changsoon Park, Jaeheon Lee:
Monitoring profiles in multistage processes using the multivariate multiple regression model. Qual. Reliab. Eng. Int. 38(7): 3437-3450 (2022) - [j7]Hyunki Jung, Kyung-Sik Choi, Keun-Mok Kim, Daehoon Jo, Jaeheon Lee, Jusung Kim, Jinho Ko, Sang-Gug Lee:
CMOS Fractional-N Frequency Synthesizer for UHF RFID Reader Applications With Transformer-Based ISF Manipulation VCO. IEEE Trans. Circuits Syst. II Express Briefs 69(10): 4083-4087 (2022)
2010 – 2019
- 2018
- [j6]Jaeheon Lee, William H. Woodall:
A note on GLR charts for monitoring count processes. Qual. Reliab. Eng. Int. 34(6): 1041-1044 (2018) - 2017
- [j5]Jaeheon Lee, Yiming Peng, Ning Wang, Marion R. Reynolds Jr.:
A GLR control chart for monitoring a multinomial process. Qual. Reliab. Eng. Int. 33(8): 1773-1782 (2017) - 2013
- [j4]Jaeheon Lee, Ning Wang, Liaosa Xu, Anna Schuh, William H. Woodall:
The Effect of Parameter Estimation on Upper-sided Bernoulli Cumulative Sum Charts. Qual. Reliab. Eng. Int. 29(5): 639-651 (2013) - [c1]Sang-Sung Lee, Jaeheon Lee, In-Young Lee, Sang-Gug Lee, Jinho Ko:
A new TX leakage-suppression technique for an RFID receiver using a dead-zone amplifier. ISSCC 2013: 92-93
2000 – 2009
- 2008
- [j3]Jaeheon Lee, Yeong-Hwa Kim, Ji-Ho Nam:
Adaptive noise reduction algorithms based on statistical hypotheses tests. IEEE Trans. Consumer Electron. 54(3): 1406-1414 (2008) - 2007
- [j2]Jaeheon Lee, Changsoon Park:
Estimation of the Change Point in Monitoring the Process Mean and Variance. Commun. Stat. Simul. Comput. 36(6): 1333-1345 (2007) - 2005
- [j1]Yeong-Hwa Kim, Jaeheon Lee:
Image feature and noise detection based on statistical hypothesis tests and their applications in noise reduction. IEEE Trans. Consumer Electron. 51(4): 1367-1378 (2005)
Coauthor Index
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