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Stefan H. Steiner
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2020 – today
- 2024
- [j13]Adel Ahmadi Nadi, Stefan H. Steiner, Nathaniel T. Stevens:
Assessing Measurement System Agreement in the Presence of Reproducibility and Repeatability. Technometrics 66(3): 319-330 (2024) - 2022
- [j12]Michael S. Hamada
, Emily M. Casleton, Dave Osthus, Brian P. Weaver, Stefan H. Steiner:
Analyzing count data with measurement error. Qual. Reliab. Eng. Int. 38(5): 2345-2355 (2022)
2010 – 2019
- 2019
- [j11]Hyukjun Gweon, Matthias Schonlau, Stefan H. Steiner:
The k conditional nearest neighbor algorithm for classification and class probability estimation. PeerJ Comput. Sci. 5: e194 (2019) - [j10]Hyukjun Gweon, Matthias Schonlau, Stefan H. Steiner:
Nearest labelset using double distances for multi-label classification. PeerJ Comput. Sci. 5: e242 (2019) - 2017
- [j9]Michael S. Hamada, Stefan H. Steiner, R. Jock MacKay, C. Shane Reese:
Planning and Analyzing Experiments with Models that Distinguish Between Replicates and Repeats. Qual. Reliab. Eng. Int. 33(3): 657-668 (2017) - [i1]Hyukjun Gweon, Matthias Schonlau, Stefan H. Steiner:
Nearest Labelset Using Double Distances for Multi-label Classification. CoRR abs/1702.04684 (2017) - 2013
- [j8]Oana Danila, Stefan H. Steiner, R. Jock MacKay:
Assessing a Binary Measurement System With Varying Misclassification Rates When a Gold Standard Is Available. Technometrics 55(3): 335-345 (2013) - 2010
- [j7]Stefan H. Steiner, Kristina Grant, Michael Coory, Heath A. Kelly:
Detecting the start of an influenza outbreak using exponentially weighted moving average charts. BMC Medical Informatics Decis. Mak. 10: 37 (2010) - [j6]Hugh A. Chipman, R. Jock MacKay, Stefan H. Steiner:
Comment. Technometrics 52(3): 280-283 (2010) - [j5]Ryan P. Browne
, R. Jock MacKay, Stefan H. Steiner:
Leveraged Gauge R&R Studies. Technometrics 52(3): 294-302 (2010)
2000 – 2009
- 2009
- [j4]Ryan P. Browne
, R. Jock MacKay, Stefan H. Steiner:
Two-Stage Leveraged Measurement System Assessment. Technometrics 51(3): 239-249 (2009) - 2004
- [j3]Stefan H. Steiner, R. Jock MacKay:
Scale Counting. Technometrics 46(3): 348-354 (2004) - 2002
- [j2]Zvi Drezner, Stefan H. Steiner, George O. Wesolowsky:
On the circle closest to a set of points. Comput. Oper. Res. 29(6): 637-650 (2002) - 2000
- [j1]Stefan H. Steiner:
Statistical Process Control Using Two Measurement Systems. Technometrics 42(2): 178-187 (2000)
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