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Jaap M. J. den Toonder
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2020 – today
- 2023
- [c5]Livio D'Alvia, Eduard Pelssers, Emma J. M. Moonen, Zaccaria Del Prete, Ludovica Apa, Jaap M. J. den Toonder:
Skin safety test in electrowetting application: a preliminary study. MeMeA 2023: 1-6 - [c4]Sevda Malek Kani, Ruben J. H. Marteijn, Eduard Pelssers, Jaap M. J. den Toonder:
Wearable sweat sensing device determining sweat rate per gland. MeMeA 2023: 1-6 - [c3]Xiaoyu Yin, Elisabetta Peri, Eduard Pelssers, Jaap M. J. den Toonder, Massimo Mischi:
Estimation of blood glucose levels by sweat sensing based on biophysical modeling of glucose transport. MeMeA 2023: 1-5 - 2022
- [j6]James M. Muganda, Bas Jansen, Erik Homburg, Yoeri van de Burgt, Jaap M. J. den Toonder:
Influence Function Measurement Technique Using the Direct and Indirect Piezoelectric Effect for Surface Shape Control in Adaptive Systems. IEEE Trans Autom. Sci. Eng. 19(2): 994-1002 (2022) - 2021
- [c2]Meiyi Zhou, Peiran Chen, Andreas M. A. O. Pollet, Sotir Ouzounov, Simona Turco, Jaap M. J. den Toonder, Massimo Mischi, Eugenio Cantatore, Pieter Harpe:
The Impact of the AFE BPF in Ultrasound Harmonic Imaging: An In-Vitro Phantom Study. BioCAS 2021: 1-4
2010 – 2019
- 2015
- [j5]Gari Arutinov, Massimo Mastrangeli, Gert van Heck, Pierre Lambert, Jaap M. J. den Toonder, Andreas Dietzel, Edsger C. P. Smits:
Capillary Gripping and Self-Alignment: A Route Toward Autonomous Heterogeneous Assembly. IEEE Trans. Robotics 31(4): 1033-1043 (2015) - 2014
- [c1]Gari Arutinov, Massimo Mastrangeli, Edsger C. P. Smits, Gert van Heck, Herman F. M. Schoo, Jaap M. J. den Toonder, Andreas Dietzel:
Shift Dynamics of Capillary Self-Alignment. IPAS 2014: 61-68
2000 – 2009
- 2008
- [j4]Tae Gon Kang, Martien A. Hulsen, Jaap M. J. den Toonder, Patrick D. Anderson, Han E. H. Meijer:
A direct simulation method for flows with suspended paramagnetic particles. J. Comput. Phys. 227(9): 4441-4458 (2008) - 2007
- [j3]Viktor Gonda, Kaspar M. B. Jansen, Leo J. Ernst, Jaap M. J. den Toonder, G. Q. Zhang:
Micro-mechanical testing of SiLK by nanoindentation and substrate curvature techniques. Microelectron. Reliab. 47(2-3): 248-251 (2007) - 2004
- [j2]Robert Modlinski, Ann Witvrouw, Petar Ratchev, Anne Jourdain, Veerle Simons, H. A. C. Tilmans, Jaap M. J. den Toonder, Robert Puers, Ingrid De Wolf:
Creep as a reliability problem in MEMS. Microelectron. Reliab. 44(9-11): 1733-1738 (2004) - [j1]Viktor Gonda, Jaap M. J. den Toonder, Johan Beijer, G. Q. Zhang, Willem D. van Driel, Romano J. O. M. Hoofman, Leo J. Ernst:
Prediction of thermo-mechanical integrity of wafer backend processes. Microelectron. Reliab. 44(12): 2011-2017 (2004)
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