BibTeX records: Paolo Emilio Bagnoli

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@article{DBLP:journals/mj/ZhangB14,
  author    = {Yabin Zhang and
               Paolo Emilio Bagnoli},
  title     = {A modeling methodology for thermal analysis of the {PCB} structure},
  journal   = {Microelectron. J.},
  volume    = {45},
  number    = {8},
  pages     = {1033--1052},
  year      = {2014},
  url       = {https://doi.org/10.1016/j.mejo.2014.04.042},
  doi       = {10.1016/j.mejo.2014.04.042},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mj/ZhangB14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BagnoliZ10,
  author    = {Paolo Emilio Bagnoli and
               Y. Zhang},
  title     = {Electro-thermal simulation of metal interconnections under high current
               flow},
  journal   = {Microelectron. Reliab.},
  volume    = {50},
  number    = {9-11},
  pages     = {1672--1677},
  year      = {2010},
  url       = {https://doi.org/10.1016/j.microrel.2010.07.029},
  doi       = {10.1016/j.microrel.2010.07.029},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/BagnoliZ10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/BagnoliBS07,
  author    = {Paolo Emilio Bagnoli and
               Carlo Bartoli and
               Fabio Stefani},
  title     = {Validation of the {DJOSER} analytical thermal simulator for electronic
               power devices and assembling structures},
  journal   = {Microelectron. J.},
  volume    = {38},
  number    = {2},
  pages     = {185--196},
  year      = {2007},
  url       = {https://doi.org/10.1016/j.mejo.2006.10.001},
  doi       = {10.1016/j.mejo.2006.10.001},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mj/BagnoliBS07.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ett/NanniniB90,
  author    = {Andrea Nannini and
               Paolo Emilio Bagnoli},
  title     = {Analysis of the influence of spatially localized oxide traps on the
               capacitance of {MIS} tunnel diodes},
  journal   = {Eur. Trans. Telecommun.},
  volume    = {1},
  number    = {5},
  pages     = {569--577},
  year      = {1990},
  url       = {https://doi.org/10.1002/ett.4460010506},
  doi       = {10.1002/ett.4460010506},
  timestamp = {Mon, 18 May 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/journals/ett/NanniniB90.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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