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Doowon Lee
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2020 – today
- 2024
- [j7]Taegi Kim, Doowon Lee, Myoungsu Chae, Kyeong-Heon Kim, Hee-Dong Kim:
Enhancing the Resistive Switching Properties of Transparent HfO2-Based Memristor Devices for Reliable Gasistor Applications. Sensors 24(19): 6382 (2024) - 2022
- [j6]Dongjoo Bae, Doowon Lee, Sungho Kim, Hee-Dong Kim:
Improved Resistive Switching Observed in Ti/Zr3N2/p-Si Capacitor via Hydrogen Passivation. IEEE Access 10: 6622-6628 (2022) - [j5]Doowon Lee, Ahreum Lee, Hee-Dong Kim:
IZO/ITO Double-Layered Transparent Conductive Oxide for Silicon Heterojunction Solar Cells. IEEE Access 10: 77170-77175 (2022) - [j4]Myoungsu Chae, Doowon Lee, Sungho Kim, Hee-Dong Kim:
Improved Electrical and Optical Properties of IGZO Transparent Conductive Oxide Due to Microwave Treatment: Application to Silicon Solar Cells. IEEE Access 10: 90401-90407 (2022) - [j3]Doowon Lee, Valeria Bertacco:
Bypassing Multicore Memory Bugs With Coarse-Grained Reconfigurable Logic. IEEE Trans. Computers 71(9): 2191-2204 (2022) - 2021
- [j2]Jinsu Jung, Doowon Lee, Sungho Kim, Hee-Dong Kim:
Self-Rectifying Characteristics Observed in O-Doped ZrN Resistive Switching Memory Devices Using Schottky Barrier Type Bottom Electrode. IEEE Access 9: 144264-144269 (2021)
2010 – 2019
- 2018
- [b1]Doowon Lee:
Decompose and Conquer: Addressing Evasive Errors in Systems on Chip. University of Michigan, USA, 2018 - [c8]Doowon Lee, Opeoluwa Matthews, Valeria Bertacco:
Low-Overhead Microarchitectural Patching for Multicore Memory Subsystems. ICCD 2018: 17-25 - 2017
- [c7]Biruk Mammo, Doowon Lee, Harrison Davis, Yijun Hou, Valeria Bertacco:
AGARSoC: Automated test and coverage-model generation for verification of accelerator-rich SoCs. ASP-DAC 2017: 45-50 - [c6]Doowon Lee, Valeria Bertacco:
MTraceCheck: Validating Non-Deterministic Behavior of Memory Consistency Models in Post-Silicon Validation. ISCA 2017: 201-213 - 2016
- [c5]Doowon Lee, Tom Kolan, Arkadiy Morgenshtein, Vitali Sokhin, Ronny Morad, Avi Ziv, Valeria Bertacco:
Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification. DAC 2016: 24:1-24:6 - 2015
- [c4]Vaibhav Gogte, Doowon Lee, Ritesh Parikh, Valeria Bertacco:
NoCVision: A Network-on-Chip Dynamic Visualization Solution. NoCArc@MICRO 2015: 21-26 - [c3]Doowon Lee, Ritesh Parikh, Valeria Bertacco:
Highly Fault-tolerant NoC Routing with Application-aware Congestion Management. NOCS 2015: 10:1-10:8 - 2014
- [c2]Doowon Lee, Ritesh Parikh, Valeria Bertacco:
Brisk and limited-impact NoC routing reconfiguration. DATE 2014: 1-6 - 2013
- [c1]Debapriya Chatterjee, Biruk Mammo, Doowon Lee, Raviv Gal, Ronny Morad, Amir Nahir, Avi Ziv, Valeria Bertacco:
Hybrid checking for microarchitectural validation of microprocessor designs on acceleration platforms. ICCAD 2013: 311-317
2000 – 2009
- 2009
- [j1]Jinhyun Cho, Doowon Lee, Sang-yong Yoon, Sanggyu Park, Soo-Ik Chae:
VLSI Implementation of a VC-1 Main Profile Decoder for HD Video Applications. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(1): 279-290 (2009)
Coauthor Index
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last updated on 2024-10-23 20:35 CEST by the dblp team
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