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2020 – today
- 2025
[c6]S. Rachidi, S. Ramesh, Devin Verreck, J. Loyo, Y. Jeong, H. Puliyalil, Jie Li
, F. Seidel, Geert Van Den Bosch, Maarten Rosmeulen:
Hole-Side Airgap Integration as Enabler for 3D NAND Flash Z-Pitch Scaling. IMW 2025: 1-4- [c5]Yusuke Higashi, Anirudh Varanasi, Philippe J. Roussel, Pablo Saraza-Canflanca, J. P. Bastos, Alexander Grill, E. Catapano, Ruben Asanovski, Jacopo Franco, Ben Kaczer, Adrian Chasin, Devin Verreck, S. Ramesh, Laurent Breuil, Antonio Arreghini, S. Rachidi, Y. Jeong, Geert Van den Bosch, Maarten Rosmeulen, Robin Degraeve:
Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework. IRPS 2025: 1-6 - 2024
- [c4]S. Rachidi, S. Ramesh, Davide Tierno, G. L. Donadio, A. Pacco, J. W. Maes, Y. Jeong, Antonio Arreghini, Geert Van den Bosch, Maarten Rosmeulen:
Pure-Metal Replacement Gate for Reliable 30 nm Pitch Scaled 3D NAND Flash. IMW 2024: 1-4 - [c3]Yusuke Higashi, J. P. Bastos, Adrian Vaisman Chasin, Laurent Breuil, Antonio Arreghini, S. Ramesh, S. Rachidi, Y. Jeong, Geert Van den Bosch, Maarten Rosmeulen:
Investigation of the Impact of Ferroelectricity Boosted Gate Stacks for 3D NAND on Short Time Data Retention and Endurance. IRPS 2024: 1-6 - [c2]Davide Tierno, Antonio Arreghini, Alicja Lesniewska, Y. Jeong, Marleen H. van der Veen, J. Stiers, N. Bazzazian, Ivan Ciofi, Geert Van den Bosch, Maarten Rosmeulen:
Exploring the Reliability Limits for the Z-Pitch Scaling of Molybdenum Inter-Word Line Oxides in 3D NAND. IRPS 2024: 1-5 - [c1]J.-H. Yoo, Y.-S. Jeon, S.-W. Son, I.-G. Lee, H.-B. Jo, S.-M. Choi, M.-S. Yu, W.-S. Park, H.-J. Kim, H.-J. Lee, S.-P. Son, S. K. Kim, J. Yun, J.-P. Shim, H. Jang, K. Lee, Y. Jeong, T. Kim, C.-S. Shin, T.-W. Kim, J.-H. Lee, K.-S. Seo, K. Yang, D.-H. Kim:
Single-Power-Supply Compatible Cryogenic In0.8Ga0.2As Quantum-well HEMTs with Record Combination of high-frequency and low-noise performance for quantum-computins applications. VLSI Technology and Circuits 2024: 1-2
2010 – 2019
- 2014
- [j2]T. V. Nguyen, Y. Jeong, J. S. Kwak, H. Shin:
Secure multiple-input single-output communication - Part I: secrecy rates and switched power allocation. IET Commun. 8(8): 1217-1226 (2014) - [j1]T. V. Nguyen, Y. Jeong, J. S. Kwak, H. Shin:
Secure multiple-input single-output communication - Part II: δ-secrecy symbol error probability and secrecy diversity. IET Commun. 8(8): 1227-1238 (2014)
Coauthor Index
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