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Jun-Weir Lin

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Journal Articles

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2001
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Jun-Weir Lin, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
Fault Diagnosis for Linear Analog Circuits. J. Electron. Test. 17(6): 483-494 (2001)

Conference and Workshop Papers

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2002
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Jun-Weir Lin, Chung-Len Lee, Jwu E. Chen:
An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits. DATE 2002: 1119
2000
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Jun-Weir Lin, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
Fault diagnosis for linear analog circuits. Asian Test Symposium 2000: 25-30
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Yin-Chao Huang, Chung-Len Lee, Jun-Weir Lin, Jwu E. Chen, Chauchin Su:
A methodology for fault model development for hierarchical linear systems. Asian Test Symposium 2000: 90-95

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