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Shunji Maeda
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2010 – 2019
- 2019
- [c5]Takuya Anjiki, Kanta Matsubayashi, Shunji Maeda:
Utilization of the Infrared Image Capturing Combustion State for Estimating the Steam Flow Aming to Stabilize Garbage Power Generation. ICMLC 2019: 1-5 - [c4]Kanta Matsubayashi, Takuya Anjiki, Shunji Maeda:
Analyzing Causal Relationships of Sensor Data and Infrared Images to Stabilize Garbage Power Generation. ICMLC 2019: 1-6 - [c3]Masami Nakamura, Yuta Aoto, Shunji Maeda:
A Basic Study on Railway Facility Extraction Using a Single-Shot Multi-Box Detector. ICMLC 2019: 1-7 - 2018
- [j5]Yuichi Kato
, Takuya Sano, Yusuke Moriyama
, Shunji Maeda, Takeshi Yamazaki, Atsushi Nose, Kimiyasu Shiina, Yohtaro Yasu, Ward van der Tempel, Alper Ercan, Yoshiki Ebiko, Daniel Van Nieuwenhove
, Shunichi Sukegawa:
320 × 240 Back-Illuminated 10-µm CAPD Pixels for High-Speed Modulation Time-of-Flight CMOS Image Sensor. IEEE J. Solid State Circuits 53(4): 1071-1078 (2018) - 2013
- [c2]Toshio Asano, Takahiro Kondoh, Shunji Maeda:
Unified evaluation method of white uniformity for electronic displays. IECON 2013: 8341-8345
1990 – 1999
- 1999
- [j4]Shunji Maeda, Makoto Ono, Hitoshi Kubota, Mitsuo Nakatani:
Precise detection of short-circuit defects on TFT substrate by infrared image matching. Syst. Comput. Jpn. 30(12): 72-84 (1999) - 1998
- [j3]Shunji Maeda, Fumiaki Endo, Hiroshi Makihira, Hitoshi Kubota:
Threshold setting assisted by numerical analysis methods in automatic visual inspection using gray-scale image comparison. Syst. Comput. Jpn. 29(14): 81-91 (1998) - 1996
- [j2]Shunji Maeda, Hitoshi Kubota, Hiroshi Makihira:
Optimum threshold generation for automated visual inspection of large-scale integration wafer patterns. Syst. Comput. Jpn. 27(11): 74-86 (1996) - 1994
- [c1]Takashi Hiroi, Shunji Maeda, Hitoshi Kubota, Kenji Watanabe, Yasuo Nakagawa:
Precise visual inspection for LSI wafer patterns using subpixel image alignment. WACV 1994: 26-34 - 1990
- [j1]Shunji Maeda, Hitoshi Kubota, Hiroshi Makihira, Takanori Ninomiya, Yasuo Nakagawa, Yuzo Taniguchi:
Automated visual inspection for lsi water multilayer patterns by cascade pattern matching algorithm. Syst. Comput. Jpn. 21(12): 65-77 (1990)
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