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Zale T. Schoenborn

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Conference and Workshop Papers

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2014
[c2]
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  - conf/itc/QuerbachKBZAESD14
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Bruce Querbach, Rahul Khanna, David Blankenbeckler, Yulan Zhang, Ronald T. Anderson, David G. Ellis, Zale T. Schoenborn, Sabyasachi Deyati, Patrick Chiang:
A reusable BIST with software assisted repair technology for improved memory and IO debug, validation and test time. ITC 2014: 1-10
2013
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Bruce Querbach, Sudeep Puligundla, Daniel Becerra, Zale T. Schoenborn, Patrick Chiang:
Comparison of hardware based and software based stress testing of memory IO interface. MWSCAS 2013: 637-640

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