![](https://dblp.dagstuhl.de/img/logo.ua.320x120.png)
![](https://dblp.dagstuhl.de/img/dropdown.dark.16x16.png)
![](https://dblp.dagstuhl.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.dagstuhl.de/img/search.dark.16x16.png)
![search dblp](https://dblp.dagstuhl.de/img/search.dark.16x16.png)
default search action
Subhadip Kundu
Person information
Refine list
![note](https://dblp.dagstuhl.de/img/note-mark.dark.12x12.png)
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2020 – today
- 2024
- [c18]Subhadip Kundu, Jais Abraham:
Revisiting Test Compression Configuration in Context of Multi-Core Testing Using Packetized Scan Network. VLSID 2024: 724-729 - 2022
- [c17]Subhadip Kundu, Gaurav Bhargava, Lesly Endrinal, Lavakumar Ranganathan:
Using Custom Fault Models to Improve Understanding of Silicon Failures. ITC 2022: 348-354
2010 – 2019
- 2017
- [c16]Subhadip Kundu, Kuldip Kumar, Rishi Kumar, Rohit Kapur:
Diagnosing multiple faulty chains with low pin convolution compressor using compressed production test set. ITC 2017: 1-7 - 2016
- [c15]Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur:
Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors. ITC 2016: 1-7 - [c14]Kanad Basu, Subhadip Kundu:
Post-Silicon Validation and Diagnosis. VLSID 2016: 9-10 - 2015
- [j5]Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur:
Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment. IEEE Trans. Very Large Scale Integr. Syst. 23(7): 1185-1195 (2015) - [c13]Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur:
Fault diagnosis in designs with extreme low pin test data compressors. DATE 2015: 1285-1288 - [c12]Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay, Bijit Kumar Das:
A hardware based low temperature solution for VLSI testing using decompressor side masking. ISCAS 2015: 637-640 - 2014
- [j4]Subhadip Kundu, Aniket Jha, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur:
Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization. IEEE Trans. Very Large Scale Integr. Syst. 22(3): 696-700 (2014) - 2013
- [j3]Subhadip Kundu, Sankhadeep Pal, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur:
A Metric for Test Set Characterization and Customization Toward Fault Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(11): 1824-1828 (2013) - [c11]Arpita Dutta, Subhadip Kundu, Santanu Chattopadhyay:
Thermal Aware Don't Care Filling to Reduce Peak Temperature and Thermal Variance during Testing. Asian Test Symposium 2013: 25-30 - [c10]Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur:
An ATE assisted DFD technique for volume diagnosis of scan chains. DAC 2013: 31:1-31:6 - [c9]Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur:
Aggresive scan chain masking for improved diagnosis of multiple scan chain failures. ETS 2013: 1 - 2012
- [j2]Subhadip Kundu, Santanu Chattopadhyay:
Efficient don't care filling and scan chain masking for low-power testing. Int. J. Comput. Aided Eng. Technol. 4(2): 101-125 (2012) - [j1]S. Krishna Kumar, Subhadip Kundu, Santanu Chattopadhyay:
Customizing completely specified pattern set targeting dynamic and leakage power reduction during testing. Integr. 45(2): 211-221 (2012) - [c8]Tapas Kumar Maiti, Subhadip Kundu, Arpita Dutta, Santanu Chattopadhyay:
Confidence Based Power Aware Testing. ISED 2012: 62-66 - [c7]Bibhas Ghoshal, Subhadip Kundu, Indranil Sengupta, Santanu Chattopadhyay:
Particle Swarm Optimization Based BIST Design for Memory Cores in Mesh Based Network-on-Chip. VDAT 2012: 343-349 - [c6]Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur:
A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection. VLSI Design 2012: 436-441 - 2011
- [c5]Subhadip Kundu, Santanu Chattopadhyay, Indranil Sengupta, Rohit Kapur:
Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization. VLSI Design 2011: 364-369 - 2010
- [c4]S. Krishna Kumar, S. Kaundinya, Subhadip Kundu, Santanu Chattopadhyay:
Customizing pattern set for test power reduction via improved X-identification and reordering. ISLPED 2010: 177-182
2000 – 2009
- 2009
- [c3]Subhadip Kundu, Santanu Chattopadhyay:
Efficient Don't Care Filling for Power Reduction during Testing. ARTCom 2009: 319-323 - [c2]Subhadip Kundu, S. Krishna Kumar, Santanu Chattopadhyay:
Test Pattern Selection and Customization Targeting Reduced Dynamic and Leakage Power Consumption. Asian Test Symposium 2009: 307-312 - 2008
- [c1]Subhadip Kundu, Santanu Chattopadhyay, Kanchan Manna:
A Novel Technique to Reduce both Leakage and Peak Power during Scan Testing. ICIIS 2008: 1-6
Coauthor Index
![](https://dblp.dagstuhl.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from ,
, and
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and
to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:51 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint