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Jhih-Han Du

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2010 – 2019

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2014
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Ming-Hung Weng, Chao-Hung Chen, Che-Kai Lin, Shih-Hui Huang, Jhih-Han Du, Sheng-Wen Peng, Walter Wohlmuth, Frank Yung-Shi Chou, Chang-Hwang Hua:
Investigation of high performance Edge Lifted Capacitors reliability for GaAs and GaN MMIC technology. Microelectron. Reliab. 54(12): 2697-2703 (2014)

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