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Nicolas Borrel
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2010 – 2019
- 2015
- [j1]Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Jean-Max Dutertre, Alexandre Sarafianos:
Electrical model of an inverter body-biased structure in triple-well technology under pulsed photoelectric laser stimulation. Microelectron. Reliab. 55(9-10): 1592-1599 (2015) - [c6]Nicolas Borrel, Clement Champeix, Edith Kussener, Wenceslas Rahajandraibe, Mathieu Lisart, Alexandre Sarafianos, Jean-Max Dutertre:
Influence of triple-well technology on laser fault injection and laser sensor efficiency. DFTS 2015: 85-90 - [c5]Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos:
SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology. DFTS 2015: 177-182 - [c4]Marc Lacruche, Nicolas Borrel, Clement Champeix, Cyril Roscian, Alexandre Sarafianos, Jean-Baptiste Rigaud, Jean-Max Dutertre, Edith Kussener:
Laser fault injection into SRAM cells: Picosecond versus nanosecond pulses. IOLTS 2015: 13-18 - [c3]Clement Champeix, Nicolas Borrel, Jean-Max Dutertre, Bruno Robisson, Mathieu Lisart, Alexandre Sarafianos:
Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents. IOLTS 2015: 150-155 - [c2]Nicolas Borrel, Clement Champeix, Mathieu Lisart, Alexandre Sarafianos, Edith Kussener, Wenceslas Rahajandraibe, Jean-Max Dutertre:
Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation. IRPS 2015: 1 - [c1]Jordan Innocenti, Loïc Welter, Nicolas Borrel, Franck Julien, Jean-Michel Portal, Jacques Sonzogni, Laurent Lopez, Pascal Masson, Stephan Niel, Philippe Dreux, Julia Castellan:
Dynamic current reduction of CMOS digital circuits through design and process optimization. PATMOS 2015: 77-81
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