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Riccardo Miglierina

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2010 – 2019

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2016
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Stephen Sunter, Alessandro Valerio, Riccardo Miglierina:
Measuring defect tolerance within mixed-signal ICs. ETS 2016: 1-2
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Stephen Sunter, Alessandro Valerio, Riccardo Miglierina:
Automated measurement of defect tolerance in mixed-signal ICs. ITC 2016: 1-8

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