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Yoonah Paik
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Journal Articles
- 2024
- [j10]Byeongho Kim, Sanghoon Cha, Sangsoo Park, Jieun Lee, Sukhan Lee, Shinhaeng Kang, Jinin So, Kyungsoo Kim, Jin Jung, Jong-Geon Lee, Sunjung Lee, Yoonah Paik, Hyeonsu Kim, Jin-Seong Kim, Won-Jo Lee, Yuhwan Ro, Yeongon Cho, Jin Hyun Kim, Joon-Ho Song, Jaehoon Yu, Seungwon Lee, Jeonghyeon Cho, Kyomin Sohn:
The Breakthrough Memory Solutions for Improved Performance on LLM Inference. IEEE Micro 44(3): 40-48 (2024) - [j9]Seok Young Kim, Jaewook Lee, Yoonah Paik, Chang Hyun Kim, Won Jun Lee, Seon Wook Kim:
Optimal Model Partitioning with Low-Overhead Profiling on the PIM-based Platform for Deep Learning Inference. ACM Trans. Design Autom. Electr. Syst. 29(2): 28:1-28:22 (2024) - 2023
- [j8]Won Jun Lee, Chang Hyun Kim, Yoonah Paik, Seon Wook Kim:
PISA-DMA: Processing-in-Memory Instruction Set Architecture Using DMA. IEEE Access 11: 8622-8632 (2023) - [j7]Chang Hyun Kim, Won Jun Lee, Yoonah Paik, Seok Young Kim, Seon Wook Kim:
BL-PIM: Varying the Burst Length to Realize the All-Bank Performance and Minimize the Multi-Workload Interference for in-DRAM PIM. IEEE Access 11: 81143-81156 (2023) - 2022
- [j6]Yoonah Paik, Chang Hyun Kim, Won Jun Lee, Seon Wook Kim:
Achieving the Performance of All-Bank In-DRAM PIM With Standard Memory Interface: Memory-Computation Decoupling. IEEE Access 10: 93256-93272 (2022) - [j5]Chang Hyun Kim, Won Jun Lee, Yoonah Paik, Kiyong Kwon, Seok Young Kim, Il Park, Seon Wook Kim:
Silent-PIM: Realizing the Processing-in-Memory Computing With Standard Memory Requests. IEEE Trans. Parallel Distributed Syst. 33(2): 251-262 (2022) - 2020
- [j4]Yoonah Paik, Seon Wook Kim, Dongha Jung, Minseong Kim:
Generating Representative Test Sequences from Real Workload for Minimizing DRAM Verification Overhead. ACM Trans. Design Autom. Electr. Syst. 25(4): 30:1-30:23 (2020) - 2019
- [j3]Won Jun Lee, Chang Hyun Kim, Yoonah Paik, Jongsun Park, Il Park, Seon Wook Kim:
Design of Processing-"Inside"-Memory Optimized for DRAM Behaviors. IEEE Access 7: 82633-82648 (2019) - [j2]Jaeyung Jun, Yoonah Paik, Gyeong Il Min, Seon Wook Kim, Youngsun Han:
Fault Tolerance Technique Offlining Faulty Blocks by Heap Memory Management. ACM Trans. Design Autom. Electr. Syst. 24(4): 47:1-47:25 (2019) - 2016
- [j1]Hokyoon Lee, Yoonah Paik, Jaeyung Jun, Youngsun Han, Seon Wook Kim:
High-throughput low-area design of AES using constant binary matrix-vector multiplication. Microprocess. Microsystems 47: 360-368 (2016)
Conference and Workshop Papers
- 2021
- [c1]Jaewook Lee, Yoonah Paik, Seon Wook Kim:
Tile-based Code Generation for Efficiently Accessing to Scratchpad Memory. ICEIC 2021: 1-3
Coauthor Index
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