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Neal R. Mielke

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2010 – 2019

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2017
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Neal R. Mielke, Robert E. Frickey, Ivan Kalastirsky, Minyan Quan, Dmitry Ustinov, Venkatesh J. Vasudevan:
Reliability of Solid-State Drives Based on NAND Flash Memory. Proc. IEEE 105(9): 1725-1750 (2017)

2000 – 2009

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2005
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Yung-Huei Lee, Steve Jacobs, Stefan Stadler, Neal R. Mielke, Ramez Nachman:
The impact of PMOST bias-temperature degradation on logic circuit reliability performance. Microelectron. Reliab. 45(1): 107-114 (2005)
2001
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Yung-Huei Lee, Tom Linton, Ken Wu, Neal R. Mielke:
Effect of trench edge on pMOSFET reliability. Microelectron. Reliab. 41(5): 689-696 (2001)

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