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Nobuto Ono
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2020 – today
- 2022
- [j5]Dan Yao, Xuanyan Bai, Shogo Katayama, Anna Kuwana, Kazuyuki Kawauchi, Haruo Kobayashi, Kouji Hirai, Akira Suzuki, Satoshi Yamada, Tomoyuki Kato, Ritsuko Kitakoga, Takeshi Shimamura, Gopal Adhikari, Nobuto Ono, Kazuhiro Miura, Shigeya Yamaguchi:
Unit cell mismatch scrambling method for high-resolution unary DAC based on virtual 3D layout. IEICE Electron. Express 19(24): 20220430 (2022) - 2020
- [c6]Souma Yamamoto, Kuswan Isam Ebisawa, Yudai Abe, Takashi Ida, Yukiko Shibasaki, Nobukazu Tsukiji, Anna Kuwana, Haruo Kobayashi, Akira Suzuki, Yukichi Todoroki, Toshihiko Kakinoki, Nobuto Ono, Kazuhiro Miura:
Operation and Stability Analysis of Temperature-Insensitive MOS Reference Current Source with Self-Bias Circuit. ISOCC 2020: 137-138
2010 – 2019
- 2019
- [c5]Koichiro Ishibashi, Ryohei Takitoge, Duangchak Manyvone, Nobuto Ono, Shigeya Yamaguchi:
Long Battery Life IoT Sensing by Beat Sensors. ICPS 2019: 430-435
2000 – 2009
- 2009
- [j4]Takaaki Okumura, Atsushi Kurokawa, Hiroo Masuda, Toshiki Kanamoto
, Masanori Hashimoto
, Hiroshi Takafuji, Hidenari Nakashima, Nobuto Ono, Tsuyoshi Sakata, Takashi Sato
:
Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(4): 990-997 (2009) - 2007
- [j3]Hiroyuki Kobayashi, Nobuto Ono, Takashi Sato
, Jiro Iwai, Hidenari Nakashima, Takaaki Okumura, Masanori Hashimoto
:
Proposal of Metrics for SSTA Accuracy Evaluation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 90-A(4): 808-814 (2007) - 2006
- [j2]Takashi Sato
, Junji Ichimiya, Nobuto Ono, Masanori Hashimoto
:
On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 89-A(12): 3491-3499 (2006) - [c4]Takashi Nojima, Nobuto Ono, Shigetoshi Nakatake, Toru Fujimura, Koji Okazaki, Yoji Kajitani:
Adaptive Porting of Analog IPs with Reusable Conservative Properties. ISVLSI 2006: 18-23 - 2005
- [j1]Takashi Sato
, Junji Ichimiya, Nobuto Ono, Koutaro Hachiya
, Masanori Hashimoto
:
On-Chip Thermal Gradient Analysis and Temperature Flattening for SoC Design. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 88-A(12): 3382-3389 (2005) - [c3]Takashi Sato
, Junji Ichimiya, Nobuto Ono, Koutaro Hachiya, Masanori Hashimoto
:
On-chip thermal gradient analysis and temperature flattening for SoC design. ASP-DAC 2005: 1074-1077 - [c2]Atsushi Kurokawa, Masaharu Yamamoto, Nobuto Ono, Tetsuro Kage, Yasuaki Inoue, Hiroo Masuda:
Capacitance and Yield Evaluations Using a 90-nm Process Technology Based on the Dense Power-Ground Interconnect Architecture. ISQED 2005: 153-158 - 2004
- [c1]Atsushi Kurokawa, Nobuto Ono, Tetsuro Kage, Hiroo Masuda:
DEPOGIT: dense power-ground interconnect architecture for physical design integrity. ASP-DAC 2004: 517-522
Coauthor Index
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